Works matching IS 00218898 AND DT 2000 AND VI 33 AND IP 4

Results: 34

crystallographers.

Published in:: Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1195
Publication type:: Article

Response to de Graaf & de Gelder's comment on CRUNCH: a phase refinement program for high-resolution macromolecular structures.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1194, doi. 10.1107/S0021889800008335

By:

Langs, David A.;
Blessing, Robert H.;
Smith, G. David

Publication type:

Article

Letters to the editor.Comment on CRUNCH: a phase refinement program for high-resolution macromolecular structures by Langs, Blessing & Smith.

Published in:

2000

By:

de Graaff, R.A.G.;
de Gelder, R.

Publication type:

Letter

TOPOS3.2: a new version of the program package for multipurpose crystal-chemical analysis.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1193, doi. 10.1107/S0021889800007202

By:

Blatov, V.A.;
Shevchenko, A.P.;
Serezhkin, V.N.

Publication type:

Article

PDFgetN: a user-friendly program to extract the total scattering structure factor and the pair distribution function from neutron powder diffraction data.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1192, doi. 10.1107/S0021889800007123

By:

Peterson, P.F.;
Gutmann, M.;
Proffen, Th.;
Billinge, S.J.L.

Publication type:

Article

SUBGROUPGRAPH: a computer program for analysis of group -- subgroup relations between space groups.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1190, doi. 10.1107/S0021889800007135

By:

Ivantchev, S.;
Kroumova, E.;
Madariaga, G.;
Perez-Mato, J.M.;
Aroyo, M.I.

Publication type:

Article

Development of a graphical interface for the Rietveld refinement program DBWS.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1189, doi. 10.1107/S0021889800005410

By:

Bleicher, Lucas;
Sasaki, Jose Marcos;
Oliveira, Carlos;
Santos, Paiva

Publication type:

Article

BEAM-ish: a graphical user interface for the physical characterization of macro-molecular crystals.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1187, doi. 10.1107/S0021889800005732

By:

Lovelace, Jeff;
Snell, Edward H.;
Pokross, Matthew;
Arvai, Andrew S.;
Nielsen, Chris;
Nguyen-Huu Xuong;
Bellamy, Henry D.;
Borgstahl, Gloria E.O.

Publication type:

Article

New techniques for indexing: N-TREOR in EXPO.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1180, doi. 10.1107/S0021889800006427

By:

Altomare, Angela;
Giacovazzo, Carmelo;
Guagliardi, Antonietta;
Moliterni, Anna Grazia Giuseppina;
Rizzi, Rosanna;
Werner, Per-Erik

Publication type:

Article

LAPODS: a computer program for refinement of lattice parameters using optimal regression.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1177, doi. 10.1107/S0021889800006622

By:

Cheng Dong;
Langford, J.I.

Publication type:

Article

High-pressure studies of the cubic to rhombohedral transformation in NbO2F.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1175, doi. 10.1107/S0021889800007275

By:

Carlson, Stefan

Publication type:

Article

Experimental determination of the instrumental transparency function of texture goniometers.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1162, doi. 10.1107/S0021889800007251

By:

Moras, K.;
Fischer, A.H.;
Klein, H.;
Bunge, H.J.

Publication type:

Article

Computing in macromolecular crystallography using a parallel architecture.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1154, doi. 10.1107/S002188980000697X

By:

Diederichs, Kay

Publication type:

Article

Periodically poled KTA crystal investigated using coherent X-ray beams.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1149, doi. 10.1107/S0021889800007743

By:

Pernot-Rejmankova, P.;
Thomas, P.A.;
Cloetens, P.;
Lorut, F.;
Baruchel, J.;
Hu, Z.W.;
Urenski, P.;
Rosenman, G.

Publication type:

Article

Reporting and evaluating absolute-structure and absolute-configuration determinations.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1143, doi. 10.1107/S0021889800007184

By:

Flack, H.D.;
Bernardinelli, G.

Publication type:

Article

Data smoothing and distortion of X-ray diffraction peaks. II. Application.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1136, doi. 10.1107/S0021889800006944

By:

Hejing Wang;
Jian Zhou

Publication type:

Article

Data smoothing and distortion of X-ray diffraction peaks. I. Theory.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1128, doi. 10.1107/S0021889800006932

By:

Hejing Wang;
Jian Zhou

Publication type:

Article

Calculation of diffraction line profiles from specimens with dislocations. A comparison of analytical models with computer simulations.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1122, doi. 10.1107/S0021889800006750

By:

Kamminga, J.-D.;
Delhez, R.

Publication type:

Article

Measurement of the fine structure factors and extinction distance by convergent-beam electron diffraction in Co3Ti with and without B doping.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1119, doi. 10.1107/S0021889800006567

By:

Wu, M.-Y.;
Jing Zhu;
Li, S.-Y.;
Du, Z.-H.;
Li, S.-L.

Publication type:

Article

Contrast analysis of the composition of ribosomes extracted with different purification procedures.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1113, doi. 10.1107/S0021889800006300

By:

Briganti, Giuseppe;
Giordano, Rita;
Londei, Paola;
Valle, Francesco

Publication type:

Article

Determination of lattice-transform density profiles for multilayered three-dimensional microcrystals in electron crystallography.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1102, doi. 10.1107/S0021889800005963

By:

Dimmeler, Eva;
Vossen, Oliver;
Schroder, Rasmus R.

Publication type:

Article

Global least-squares determination of Eulerian angles from single electron diffraction patterns of tilted crystals.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1088, doi. 10.1107/S0021889800005951

By:

Dimmeler, Eva;
Schroder, Rasmus R.

Publication type:

Article

Using a prism to reject or select harmonic reflections in an X-ray monochromator.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1082, doi. 10.1107/S0021889800005343

By:

Zhong, Z.

Publication type:

Article

Etude structurale d'un hydrate 10Å instable de kaolinite.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1077, doi. 10.1107/S0021889800004878

By:

Jemai, S.;
Ben Haj Amara, A.;
Ben Brahim, J.;
Plancon, A.

Publication type:

Article

The crystal neutron diffractometer resolution function, spatial effects included.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1067, doi. 10.1107/S0021889800004611

By:

Ionita, I.;
Stoica, A.D.

Publication type:

Article

New methods for diffraction stress measurement: a critical evaluation of new and existing methods.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1059, doi. 10.1107/S0021889800004258

By:

Kamminga, J.-D.;
de Keijser, Th. H.;
Mittemeijer, E.J.;
Delhez, R.

Publication type:

Article

Double-crystal diffraction imaging with a small effective divergence source: application to the magneto-acoustic vibrations in FeBO3.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1051, doi. 10.1107/S0021889800004222

By:

Matsouli, Ioanna;
Kvardakov, Vladimir V.;
Baruchel, Jose

Publication type:

Article

High-energy X-ray diffuse scattering using Weissenberg flat-cone geometry.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1046, doi. 10.1107/S0021889800005318

By:

Butler, B.D.;
Haeffner, D.R.;
Lee, P.L.;
Wellberry, T.R.

Publication type:

Article

Study of disorder in a tetragonal tungsten bronze ferroelectric relaxor: a structural approach.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1037, doi. 10.1107/S0021889800005124

By:

Hornebecq, V.;
Elissalde, C.;
Weill, F.;
Villesuzanne, A.;
Menetrier, M.;
Ravez, J.

Publication type:

Article

Novel image analysis of two-dimensional X-ray fiber diffraction patterns: example of a polypropylene.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1031, doi. 10.1107/S0021889800005112

By:

Shaofeng Ran;
Xinhua Zong;
Dufei Fang;
Hsiao, Benjamin S.;
Chu, Benjamin;
Ross, Roger

Publication type:

Article

X-ray topographic determination of the granular structure in a graphite mosaic crystal: a three-dimensional reconstruction.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1023, doi. 10.1107/S0021889800005975

By:

Ohler, M.;
Sanchez del Rio, M.;
Tuffanelli, A.;
Gambaccini, M.;
Taibi, A.;
Fantini, A.;
Pareschi, G.

Publication type:

Article

X-ray diffraction from perfect silicon crystals distorted by surface acoustic waves.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1019, doi. 10.1107/S0021889800006828

By:

Tucoulou, R.;
Pascal, R.;
Brunel, M.;
Mathon, O.;
Roshchupkin, D.V.;
Schelokov, I.A.;
Cattan, E.;
Remiens, D.

Publication type:

Article

Corrections for surface X-ray diffraction measurements using the Z-axis geometry: finite size effects in direct and reciprocal space.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 1006, doi. 10.1107/S0021889800004696

By:

Robach, O.;
Garreau, Y.;
Aid, K.;
Veron-Jolliot, M.B.

Publication type:

Article

Anisotropic diffraction peak broadening and dislocation substructure in hydrogen-cycled LaNi5 and substitutional derivatives.

Published in:

Journal of Applied Crystallography, 2000, v. 33, n. 4, p. 997

By:

Cerny, R.;
Joubert, J.-M.;
Latroche, M.;
Percheron-Guegan, A.;
Yvon, K.

Publication type:

Article

Works matching IS 00218898 AND DT 2000 AND VI 33 AND IP 4

crystallographers.

Response to de Graaf & de Gelder's comment on CRUNCH: a phase refinement program for high-resolution macromolecular structures.

Letters to the editor.Comment on CRUNCH: a phase refinement program for high-resolution macromolecular structures by Langs, Blessing & Smith.

TOPOS3.2: a new version of the program package for multipurpose crystal-chemical analysis.

PDFgetN: a user-friendly program to extract the total scattering structure factor and the pair distribution function from neutron powder diffraction data.

SUBGROUPGRAPH: a computer program for analysis of group -- subgroup relations between space groups.

Development of a graphical interface for the Rietveld refinement program DBWS.

BEAM-ish: a graphical user interface for the physical characterization of macro-molecular crystals.

New techniques for indexing: N-TREOR in EXPO.

LAPODS: a computer program for refinement of lattice parameters using optimal regression.

High-pressure studies of the cubic to rhombohedral transformation in NbO<sub>2</sub>F.

Experimental determination of the instrumental transparency function of texture goniometers.

Computing in macromolecular crystallography using a parallel architecture.

Periodically poled KTA crystal investigated using coherent X-ray beams.

Reporting and evaluating absolute-structure and absolute-configuration determinations.

Data smoothing and distortion of X-ray diffraction peaks. II. Application.

Data smoothing and distortion of X-ray diffraction peaks. I. Theory.

Calculation of diffraction line profiles from specimens with dislocations. A comparison of analytical models with computer simulations.

Measurement of the fine structure factors and extinction distance by convergent-beam electron diffraction in Co<sub>3</sub>Ti with and without B doping.

Contrast analysis of the composition of ribosomes extracted with different purification procedures.

Determination of lattice-transform density profiles for multilayered three-dimensional microcrystals in electron crystallography.

Global least-squares determination of Eulerian angles from single electron diffraction patterns of tilted crystals.

Using a prism to reject or select harmonic reflections in an X-ray monochromator.

Etude structurale d'un hydrate 10Å instable de kaolinite.

The crystal neutron diffractometer resolution function, spatial effects included.

New methods for diffraction stress measurement: a critical evaluation of new and existing methods.

Double-crystal diffraction imaging with a small effective divergence source: application to the magneto-acoustic vibrations in FeBO<sub>3</sub>.

High-energy X-ray diffuse scattering using Weissenberg flat-cone geometry.

Study of disorder in a tetragonal tungsten bronze ferroelectric relaxor: a structural approach.

Novel image analysis of two-dimensional X-ray fiber diffraction patterns: example of a polypropylene.

X-ray topographic determination of the granular structure in a graphite mosaic crystal: a three-dimensional reconstruction.

X-ray diffraction from perfect silicon crystals distorted by surface acoustic waves.

Corrections for surface X-ray diffraction measurements using the Z-axis geometry: finite size effects in direct and reciprocal space.

Anisotropic diffraction peak broadening and dislocation substructure in hydrogen-cycled LaNi<sub>5</sub> and substitutional derivatives.