Works matching IS 00218898 AND DT 2000 AND VI 33 AND IP 2
Results: 34
computer program abstracts.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 417, doi. 10.1107/S0021889800001801
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A beam-stop mount designed for use with area detectors.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 415, doi. 10.1107/S0021889899015587
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ShakePSD: automatic phase solver covering heavy-atom methods and direct methods for Windows PCs.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 406, doi. 10.1107/S0021889899015058
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ROD: a program for surface X-ray crystallography.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 401, doi. 10.1107/S0021889899013655
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In situ X-ray crystallography.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 397, doi. 10.1107/S0021889800001254
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The Huber G670 imaging-plate Guinier camera tested on beamline I711 at the MAX II synchrotron.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 394, doi. 10.1107/S0021889800000893
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How the R factor changes as molecules become larger.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 392, doi. 10.1107/S0021889800000777
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Parallel-beam X-ray diffractometry using X-ray guide tubes.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 389, doi. 10.1107/S0021889899015344
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Crystallization bench.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 387, doi. 10.1107/S0021889899015691
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Polar potassium rare earth nitrates K<sub>2</sub>[RE(NO<sub>3</sub>)<sub>5</sub>(H<sub>2</sub>O)<sub>2</sub>] (RE = La, Ce, Pr, and Nd). II. Linear and nonlinear optical properties.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 380, doi. 10.1107/S002188980000087X
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Polar potassium rare earth nitrates K<sub>2</sub>[RE(NO<sub>3</sub>)<sub>5</sub>(H<sub>2</sub>O)<sub>2</sub>] (RE = La, CE, Pr and Nd). I. Crystal growth and crystal structures.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 372, doi. 10.1107/S0021889800000868
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Application for high-energy synchroton radiation for texture studies.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 364, doi. 10.1107/S0021889899016684
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Reconstruction of low-resolution three-dimensional density maps from one-dimensional small-angle X-ray solution scattering data for biomolecules.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 350, doi. 10.1107/S0021889899015976
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Use of a crystallization robot to set up sitting-drop-vapor-diffusion crystallization and in situ crystallization screens.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 344, doi. 10.1107/S0021889800001151
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A correction for anisotropic line broadening due to structural defects in powder diffraction structure analysis.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 338, doi. 10.1107/S002188980000114X
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Modeling radial collimators for use in stress and texture measurements with neutron diffraction.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 334, doi. 10.1107/S0021889800000856
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Extinction-corrected mean thickness and integral width used in the program UMWEG<sup>98</sup>.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 330, doi. 10.1107/S0021889800000698
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Kinematical intensity profiles obtained for single and multiple diffraction in perfect spherical crystals.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 323, doi. 10.1107/S0021889800000686
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Assessment of different X-ray stress measuring techniques for thin titanium nitride coatings.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 312, doi. 10.1107/S0021889800000145
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Solving crystal structures in P1: an automated procedure for finding an allowed origin in the correct space group.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 307, doi. 10.1107/S0021889800000157
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X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: a revision and allowance for texture and non-uniform fault probabilities.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 296, doi. 10.1107/S0021889800000133
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Performance of a multi-wavelength monochromator system for neutron single-crystal and powder diffraction.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 291, doi. 10.1107/S0021889899016829
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Small-angle X-ray scattering analysis of the periodic tricontinuous network structure of symmetric ABC triblock copolymers.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 285, doi. 10.1107/S0021889899016830
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Phase transitions in ReO<sub>3</sub> studied by high-pressure X-ray diffraction.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 279
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Accuracy of XRPD QPA using the combined Rietveld-RIR method.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 267, doi. 10.1107/S002188989901643X
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Deconvolution of X-ray diffraction profiles by using series expansion.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 259, doi. 10.1107/S0021889899015575
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Refinement of free structure parameters of a thin film when only one reflection is available.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 252, doi. 10.1107/S0021889899016039
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Multiple CCD detector for macromolecular X-ray crystallography.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 243, doi. 10.1107/S0021889899015666
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Nest-near-neighbour interactions with AI in Li<sup>+</sup>- and Rb<sup>+</sup>-exchanged Na&sup+; β-aluminas, detected by synchroton X-ray absorption spectroscopy.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 234, doi. 10.1107/S0021889899015654
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Elimination of extrinsic components overlapping lattice distortion variations of a silicon single crystal obtained by double-crystal X-ray topography.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 226, doi. 10.1107/S0021889899015484
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SAXS experiments on absolute scale with Kratky systems using water as a secondary standard.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 218, doi. 10.1107/S0021889899015216
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X-ray investigation and discussion of the magnetostriction of Gd<sub>3</sub>T (T=Ni, Rh, Ir<sub>x</sub>) single crystals.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 213, doi. 10.1107/S0021889899014922
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A non-linear positive method to reconstruct the parent textures from the inherited textures in phase transformation.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 206, doi. 10.1107/S0021889899014879
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X-ray study of the light-induced metastable state of a spin-crossover compound.
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- Journal of Applied Crystallography, 2000, v. 33, n. 2, p. 201, doi. 10.1107/S0021889899014739
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