Works matching IS 00214876 AND DT 2022 AND VI 86 AND IP 11
Results: 2
断面電子線後方散乱回折分析を用いたパラジウムの表面損傷の 評価.
- Published in:
- Journal of the Japan Institute of Metals & Materials / Nippon Kinzoku Gakkaishi, 2022, v. 86, n. 11, p. 217, doi. 10.2320/jinstmet.J2022021
- By:
- Publication type:
- Article
Cu 微粒子の低温酸化焼結挙動.
- Published in:
- Journal of the Japan Institute of Metals & Materials / Nippon Kinzoku Gakkaishi, 2022, v. 86, n. 11, p. 224, doi. 10.2320/jinstmet.J2022020
- By:
- Publication type:
- Article