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crystallographers.
Published in:
2000
By:
- Cockayne, David J.;
- Gjonnes, Jon;
- Humphreys, Colin J.;
- Lehmpfuhl, Gunter;
- Murphy, John;
- Shmueli, Uri;
- Spence, John C.H.;
- Tanaka, Michiyoshi;
- Witte, Nicholas S.
Publication type:
Obituary
The number of good reflections in a powder pattern.
Published in:
Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1295, doi. 10.1107/S0021889800009250
By:
- Sivia, D.S.
Publication type:
Article
Microcrystallography with an X-ray waveguide.
Published in:
Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1231
By:
- Muller, M.;
- Burghammer, M.;
- Flot, D.;
- Riekel, C.;
- Morawe, C.;
- Murphy, B.;
- Cedola, A.
Publication type:
Article
X-ray determination of dislocation density and arrangement in plastically deformed copper.
Published in:
Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1284, doi. 10.1107/S0021889800008256
By:
- Breuer, D.;
- Klimanek, P.;
- Pantleon, W.
Publication type:
Article
Identification of an Al-Ni-O precipitate combustion-synthesized NiAl.
Published in:
Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1217, doi. 10.1107/S0021889800008505
By:
- Biswas, A.;
- Madangopal, K.;
- Singh, J.B.;
- Roy, S.K.;
- Banerjee, S.
Publication type:
Article
Powder diffraction beyond the Bragg law: study of palladium nanocrystals.
Published in:
Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1262, doi. 10.1107/S0021889800009869
By:
- Kaszkur, Zbigniew
Publication type:
Article
An imaging-plate detector for small-angle neutron scattering.
Published in:
Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1253, doi. 10.1107/S0021889800009067
By:
- Cheng, Y.T.;
- Mildner, D.F.R.;
- Chen-Mayer, H.H.;
- Sharov, V.A.;
- Glinka, C.J.
Publication type:
Article
Synchrotron radiation X-ray powder diffractometer with a cylindrical imaging plate.
Published in:
Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1241, doi. 10.1107/S0021889800009286
By:
- Fujiwara, A.;
- Ishii, K.;
- Watanuki, T.;
- Suematsu, H.;
- Nakao, H.;
- Ohwada, K.;
- Fujii, Y.;
- Murakami, Y.;
- Kawada, H.;
- Kikegawa, T.;
- Shimomura, O.;
- Matsubara, T.;
- Hanabusa, H.;
- Daicho, S.;
- Kitamura, S.;
- Katayama, C.
Publication type:
Article
X-ray diffraction line broadening from thermally deposited gold films.
Published in:
Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1271, doi. 10.1107/S0021889800009936
By:
- Cheary, R.W.;
- Dooryhee, E.;
- Lynch, P.;
- Armstrong, N.;
- Dligatch, S.
Publication type:
Article
A novel free-mounting system for protein crystals: transformation and improvement of diffraction power by accurately controlled humidity changes.
Published in:
Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1223, doi. 10.1107/S0021889800008049
By:
- Kiefersauer, Reiner;
- Than, Manuel E.;
- Dobbek, Holger;
- Gremer, Lothar;
- Melero, Marcos;
- Strobol, Stefan;
- Dias, Joao M.;
- Soulimane, Tewfik;
- Huber, Robert
Publication type:
Article
Solving the generalized indirect Fourier transformation (GIFT) by Boltzmann simplex simulated annealing (BSSA).
Published in:
Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1212, doi. 10.1107/S0021889800008372
By:
- Bergmann, A.;
- Fritz, G.;
- Glatter, O.
Publication type:
Article
Determination of hydrogen ordering with the β-RH2+x phase (R = Ho, Y) using electron diffraction techniques.
Published in:
Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1242, doi. 10.1107/S0021889800009523
By:
- Grier, Elizabeth J.;
- Petford-Long, Amanda K.;
- Ward, Roger C.C.
Publication type:
Article
A tangent formula derived from Patterson-function arguments. VII. Solution of inorganic structures from powder data with accidental overlap.
Published in:
Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1208, doi. 10.1107/S0021889800007834
By:
- Rius, J.;
- Torrelles, X.;
- Miravitlles, C.;
- Ochando, L.E.;
- Reventos, M.M.;
- Amigo, J.M.
Publication type:
Article
The disordered structure of tetraferrocenyl-[3]-cumulene, (Fc)2C=C=C+C(Fc)2, by simulated annealing using synchrotron powder diffraction data.
Published in:
Journal of Applied Crystallography, 2000, v. 33, n. 5, p. 1199, doi. 10.1107/S0021889800007470
By:
- Dinnebier, Robert E.;
- Schweiger, Manual;
- Bildstein, Benno;
- Shankland, Kenneth;
- David, William I.F.;
- Jobst, Andreas;
- van Smaalen, Sander
Publication type:
Article

Found: 14

crystallographers.

The number of good reflections in a powder pattern.

Microcrystallography with an X-ray waveguide.

X-ray determination of dislocation density and arrangement in plastically deformed copper.

Identification of an Al-Ni-O precipitate combustion-synthesized NiAl.

Powder diffraction beyond the Bragg law: study of palladium nanocrystals.

An imaging-plate detector for small-angle neutron scattering.

Synchrotron radiation X-ray powder diffractometer with a cylindrical imaging plate.

X-ray diffraction line broadening from thermally deposited gold films.

A novel free-mounting system for protein crystals: transformation and improvement of diffraction power by accurately controlled humidity changes.

Solving the generalized indirect Fourier transformation (GIFT) by Boltzmann simplex simulated annealing (BSSA).

Determination of hydrogen ordering with the β-RH<sub>2+x</sub> phase (R = Ho, Y) using electron diffraction techniques.

A tangent formula derived from Patterson-function arguments. VII. Solution of inorganic structures from powder data with accidental overlap.

The disordered structure of tetraferrocenyl-[3]-cumulene, (Fc)<sub>2</sub>C=C=C+C(Fc)<sub>2</sub>, by simulated annealing using synchrotron powder diffraction data.