Total reflection X-ray fluorescence analysis: Physical foundations and analytical application (A review).
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- Inorganic Materials, 2011, v. 47, n. 14, p. 1487, doi. 10.1134/S0020168511140020
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Works matching IS 00201685 AND DT 2011 AND VI 47 AND IP 14
Results: 3
1
2
Devices for local electrochemical analysis (Review).
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- Inorganic Materials, 2011, v. 47, n. 14, p. 1551, doi. 10.1134/S0020168511140214
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3
Effects of uncertainty of excitation condition on error of method of fundamental parameters in X-ray fluorescence analysis.
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- Inorganic Materials, 2011, v. 47, n. 14, p. 1518, doi. 10.1134/S0020168511140081
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- Article