Works matching IS 00135194 AND DT 2023 AND VI 59 AND IP 19
1
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 19, p. 1, doi. 10.1049/ell2.12978
- Tian, Mingxing;
- Ren, Zhiqiang;
- Xing, Dongfeng;
- Jiang, Yu
- Article
2
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 19, p. 1, doi. 10.1049/ell2.12977
- Yu, Eun Seong;
- Kim, Seung Gyun;
- Moon, Seung Jae;
- Bae, Byung Seong
- Article
3
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 19, p. 1, doi. 10.1049/ell2.12976
- Milner, Peter;
- Zubialevich, Vitaly Z.;
- O'Connor, Thomas;
- Singh, Sandeep M.;
- Singh, Davinder;
- Corbett, Brian;
- Parbrook, Peter J.
- Article
4
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 19, p. 1, doi. 10.1049/ell2.12970
- Wu, Hanjie;
- Cheng, Yongqiang;
- Zou, Runming
- Article
5
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 19, p. 1, doi. 10.1049/ell2.12969
- Xu, Longting;
- He, Mingrui;
- Guo, Xing
- Article
6
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 19, p. 1, doi. 10.1049/ell2.12968
- Nauschütz, Josephine;
- Scheuermann, Julian;
- Weih, Robert;
- Koeth, Johannes;
- Schwarz, Benedikt;
- Höfling, Sven
- Article
7
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 19, p. 1, doi. 10.1049/ell2.12967
- Korunur Engiz, B.;
- Lodro, M.;
- Greedy, S.;
- Thomas, D.W.P.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 19, p. 1, doi. 10.1049/ell2.12966
- Du, Yanan;
- Gao, Hongyuan;
- Liu, Yapeng;
- Sun, Rongchen
- Article
9
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 19, p. 1, doi. 10.1049/ell2.12964
- Ye, Jiabao;
- Cui, Xuecheng;
- Bi, Haoxiong;
- Cao, Jifang;
- Wang, Wannian;
- Xu, Xiaoxin;
- Liu, Dong;
- Chen, Bing
- Article
10
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 19, p. 1, doi. 10.1049/ell2.12963
- Jia, Guohui;
- Lu, Yang;
- Song, Weidong;
- He, Huan;
- Ma, Rongchen
- Article
11
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 19, p. 1, doi. 10.1049/ell2.12962
- Article
12
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 19, p. 1, doi. 10.1049/ell2.12961
- Lee, Minhun;
- Oh, Seoung‐Jun;
- Sim, Donggyu
- Article
13
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 19, p. 1, doi. 10.1049/ell2.12960
- Zhu, Shengling;
- Chen, Lei;
- Su, Jie
- Article
14
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 19, p. 1, doi. 10.1049/ell2.12959
- Article
15
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 19, p. 1, doi. 10.1049/ell2.12948
- Marco, Mauro Di;
- Forti, Mauro;
- Pancioni, Luca;
- Tesi, Alberto
- Article
16
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 19, p. 1, doi. 10.1049/ell2.12938
- Preitnacher, Jonathan;
- Ageev, Sergei;
- Hansch, Walter
- Article
17
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 19, p. 1, doi. 10.1049/ell2.12927
- Ni, Xueqing;
- Yang, Dongsheng;
- Qin, Jia;
- Wang, Xin
- Article
18
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 19, p. 1, doi. 10.1049/ell2.12843
- Cui, Yue;
- Liu, Hongfu;
- Xu, Fangmin;
- Li, Bin;
- Zhao, Chenglin
- Article