Works matching IS 00135194 AND DT 2023 AND VI 59 AND IP 15
1
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12937
- Losada‐Gutiérrez, Cristina;
- Rodríguez‐Ascariz, José M.;
- Espinosa, Felipe
- Article
2
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12935
- Yang, Sufan;
- Zhang, Chunxi;
- Wang, Xiaxiao
- Article
3
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12931
- Qin, Yuxi;
- Pan, Su;
- Li, Zibo
- Article
4
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12929
- Lee, Jaehyuk;
- Boo, Junho;
- Park, Junsang;
- An, Taiji;
- Shin, Heewook;
- Cho, Youngjae;
- Choi, Michael;
- Burm, Jinwook;
- Ahn, Gilcho;
- Lee, Seunghoon
- Article
5
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12928
- Yamakawa, Soichiro;
- Ando, Kota;
- Akai‐Kasaya, Megumi;
- Asai, Tetsuya
- Article
6
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12926
- Wu, Jie;
- Fan, Min;
- Wu, Xianliang
- Article
7
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12925
- Shi, Fei;
- Hu, Mengkai;
- Dou, Xiuquan
- Article
8
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12923
- Huang, Yingxin;
- Liu, Zhenbing;
- Lu, Haoxiang;
- Wang, Wenhao;
- Zhang, Zhaoyuan
- Article
9
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12920
- Kwoen, Jinkwan;
- Morais, Natália;
- Zhan, Wenbo;
- Iwamoto, Satoshi;
- Arakawa, Yasuhiko
- Article
10
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12919
- Liang, JiaJun;
- Wu, Zhao;
- Li, Long;
- Zhang, Xiuyin;
- Yang, Hua
- Article
11
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12918
- Zahra, Alaa G.;
- Mehany, Wael;
- Ahmed, Fathy M.;
- Youssef, Ahmed
- Article
12
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12917
- Article
13
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12916
- Shin, Kwangmu;
- Kim, Sunghoon
- Article
14
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12910
- Fu, Hao;
- Tian, Yubo;
- Meng, Fei;
- Li, Qing;
- Ren, Xuefeng
- Article
15
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12904
- Zhang, Baohua;
- Guo, Yiming;
- Liu, Guangyi;
- Mei, Fengtong;
- Shen, Zhixiang
- Article
16
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12915
- Li, Liang;
- Yang, Xinjie;
- Ma, Nan;
- Xiao, Pei
- Article
17
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12914
- Su, Yuanzhi;
- Wang, Yuan‐Gen;
- Wang, Weijia;
- Zhu, Guopu
- Article
18
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12913
- Hagelberg, Alexander;
- Andre, Daniel;
- Finnis, Mark
- Article
19
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12912
- Zhan, Chenghong;
- Hu, Guoping;
- Zhao, Fangzheng;
- Zhou, Hao
- Article
20
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12911
- Jeon, Juhyeon;
- Seo, Sangsoo;
- Han, Sangwook;
- Lee, Dongho
- Article
21
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12909
- Xiang, Yuguo;
- Chen, Min;
- Zhai, Danfeng;
- Zhao, Yutong;
- Ren, Junyan;
- Ye, Fan
- Article
22
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12908
- Jang, Seongjin;
- Lee, Jaeyong;
- Park, Changkun
- Article
23
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12907
- Article
24
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12906
- Wang, Lei;
- Tong, Kaixiang;
- Yang, Jingyu;
- Chen, Xiang
- Article
25
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12905
- Chen, Tao;
- Lei, Yu;
- Guo, Limin;
- Yang, Boyi
- Article
26
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12903
- Chen, Baobao;
- Zhao, Yi;
- Tan, Haoyang;
- Guan, Xiaowei;
- Gao, Shiming
- Article
27
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12902
- Article
28
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12900
- Lang, Yuqi;
- Liu, Kunliang;
- Wang, Jianming;
- Hwang, Wonjun
- Article
29
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12899
- Han, Min;
- Qin, Yifeng;
- Wang, Chengzhi;
- Yang, Tianqi
- Article
30
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12898
- Ho, Min‐Hua;
- Hong, Jing‐Jie;
- Hsu, Chung I. G.;
- Hong, Wanchu
- Article
31
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12897
- Zhao, Yao;
- Chen, Yanxu;
- Tian, He;
- Quan, Xiangyin;
- Ling, Bingo Wing‐Kuen;
- Zhang, Zhe
- Article
32
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 15, p. 1, doi. 10.1049/ell2.12894
- Jiang, Yufeng;
- Kang, Shouxin
- Article