Works matching IS 00135194 AND DT 2023 AND VI 59 AND IP 14
1
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 14, p. 1, doi. 10.1049/ell2.12893
- Shin, Jin;
- Lee, Jong Ho;
- Kim, Hyun
- Article
2
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 14, p. 1, doi. 10.1049/ell2.12892
- Fu, Xuedong;
- Sun, Mingyu;
- Chen, Aixin
- Article
4
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 14, p. 1, doi. 10.1049/ell2.12890
- Kong, Heesung;
- Cho, Kyoungah;
- Kang, Mingu;
- Kim, Jaybum;
- Lee, Sunhee;
- Lim, Junhyung;
- Kim, Sangsig
- Article
5
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 14, p. 1, doi. 10.1049/ell2.12889
- Xie, Haihua;
- Zhang, Yangyang;
- Zhang, Yuanhao;
- Liu, Huijie;
- Guo, Rujiang
- Article
6
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 14, p. 1, doi. 10.1049/ell2.12887
- Article
7
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 14, p. 1, doi. 10.1049/ell2.12886
- Park, Jong Yul;
- Min, Byoung‐Gue;
- Lee, Jong‐Min;
- Chang, Woojin;
- Kang, Dong Min;
- Jang, E‐San;
- Kim, Junhyung;
- Kim, Jeong‐Gil
- Article
8
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 14, p. 1, doi. 10.1049/ell2.12885
- Mai, Yangzhan;
- Wang, Mingyu;
- Zhong, Baiqing;
- Zhang, Chuanghao;
- Zhang, Yicong;
- Yu, Zhiyi
- Article
9
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 14, p. 1, doi. 10.1049/ell2.12884
- Wang, Biao;
- Zhang, Shizhen;
- Zhu, Yunan
- Article
10
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 14, p. 1, doi. 10.1049/ell2.12883
- Cao, Jianan;
- Peng, Jia;
- Meng, Gefei;
- Li, Yunjia
- Article
11
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 14, p. 1, doi. 10.1049/ell2.12882
- Kong, Weibin;
- Du, Yi;
- Zhang, Xiaoyu;
- Jia, Baomin;
- Fang, Zhongqing;
- Liang, Qiong;
- Du, Xue
- Article
12
- 2023
- Zhang, Xuebo;
- Heald, Gary;
- Lyons, Anthony P.;
- Hansen, Roy Edgar;
- Hunter, Alan J.
- Editorial
13
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 14, p. 1, doi. 10.1049/ell2.12880
- Zhu, Hong‐Xu;
- Cheong, Pedro;
- Tam, Kam‐Weng;
- Chio, Chi‐Hou;
- Teng, Cheng;
- Zhang, Wen‐Hai;
- Ngai, Kong
- Article
14
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 14, p. 1, doi. 10.1049/ell2.12879
- Xue, Kun;
- Sun, Haoliang;
- Qin, Yifeng;
- Zhu, Hongyi;
- Dong, Shaohua
- Article
15
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 14, p. 1, doi. 10.1049/ell2.12878
- Li, Fangning;
- Wu, Di;
- Zhu, Daiyin;
- Shen, Mingwei
- Article
16
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 14, p. 1, doi. 10.1049/ell2.12877
- Article
17
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 14, p. 1, doi. 10.1049/ell2.12876
- Liang, Da;
- Li, Haoyang;
- Fu, Yixiang;
- Pang, Xiaoyu
- Article
18
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 14, p. 1, doi. 10.1049/ell2.12874
- Cheng, Qingyun;
- Wu, Xiaochuan;
- Zhang, Xin;
- Yang, Qiang
- Article
19
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 14, p. 1, doi. 10.1049/ell2.12872
- Article
20
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 14, p. 1, doi. 10.1049/ell2.12871
- Ge, Lei;
- Liang, Yanzhen;
- Wu, Di
- Article
21
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 14, p. 1, doi. 10.1049/ell2.12869
- Su, Rina;
- Wang, Jiacheng;
- Xu, Gaoming;
- Liu, Taijun
- Article
22
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 14, p. 1, doi. 10.1049/ell2.12845
- Chen, Chunfeng;
- Hu, Changyu;
- Zhou, Jianjiang
- Article
23
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 14, p. 1, doi. 10.1049/ell2.12779
- Koala, Ratmalgre;
- Iyoda, Kei;
- Fujita, Masayuki;
- Nagatsuma, Tadao
- Article