Works matching IS 00135194 AND DT 2022 AND VI 58 AND IP 21
1
- Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 21, p. 783, doi. 10.1049/ell2.12604
- Cui, Yuehui;
- Tu, Zhenxing;
- Li, RongLin
- Article
2
- Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 21, p. 810, doi. 10.1049/ell2.12616
- Syed, Tamseel Mahmood;
- Pappu, Chandra Shekar;
- Beal, Aubrey N.
- Article
3
- Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 21, p. 786, doi. 10.1049/ell2.12613
- Lv, X.;
- Zhang, Y.;
- Fu, Y.;
- Shi, Q.;
- El‐Makadema, A.
- Article
4
- Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 21, p. 813, doi. 10.1049/ell2.12615
- Wang, Hetong;
- Yang, Qi;
- Wang, Hongqiang;
- Deng, Bin
- Article
5
- Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 21, p. 801, doi. 10.1049/ell2.12612
- Article
6
- Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 21, p. 798, doi. 10.1049/ell2.12610
- Wang, Jingchao;
- Zhang, Huanlong;
- Zhang, Jianwei
- Article
7
- Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 21, p. 816, doi. 10.1049/ell2.12607
- Tang, Runzhe;
- Wu, Wei;
- Wang, Yibo;
- Jiang, Huaixuan
- Article
8
- Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 21, p. 795, doi. 10.1049/ell2.12605
- Yi, Yun;
- Wang, Hanli;
- Tang, Pengjie
- Article
9
- Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 21, p. 789, doi. 10.1049/ell2.12603
- Tian, Xinliang;
- Ouyang, Dantong;
- Zhou, Huisi;
- Jiang, Luyu;
- Zhang, Liming
- Article
10
- Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 21, p. 792, doi. 10.1049/ell2.12608
- Becker, Maximilian;
- Morath, Helmuth;
- Schumann, Stefan;
- Ellinger, Frank
- Article
11
- Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 21, p. 807, doi. 10.1049/ell2.12606
- Wang, Zhanze;
- Liu, Feifeng;
- Zhang, Shuyao;
- Xu, Zhixiang
- Article
12
- Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 21, p. 804, doi. 10.1049/ell2.12601
- Yin, Yifei;
- Uchida, Chihiro;
- Tsukamoto, Keito;
- Hayashi, Hitoshi;
- Nakaoka, Toshihiro
- Article