Works matching IS 00135194 AND DT 2022 AND VI 58 AND IP 13
1
- Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 13, p. 502, doi. 10.1049/ell2.12526
- Na, Youngju;
- Kim, Hee Hyeon;
- Yoo, Seok Bong
- Article
2
- Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 13, p. 508, doi. 10.1049/ell2.12516
- Zeng, Zhiqiang;
- Tan, Xiaoheng;
- Chen, Zhanye;
- Huang, Yan;
- Tang, Shiyang;
- Wan, Jun
- Article
3
- Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 13, p. 505, doi. 10.1049/ell2.12512
- Ma, Weijie;
- Tu, Guoyong;
- Deng, Zhenmiao;
- Lu, Xiaofei;
- Ye, Yishan;
- Li, Yuhan
- Article
4
- Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 13, p. 524, doi. 10.1049/ell2.12511
- Huang, Shanchuan;
- Huang, Xiujie;
- Zhao, Shancheng;
- Tang, Siyun;
- Lin, Lei
- Article
5
- Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 13, p. 517, doi. 10.1049/ell2.12510
- Li, Siyu;
- Zhao, Kui;
- Yang, Jin;
- Jiang, Xinyun;
- Li, Zhengji;
- Ma, Zicheng
- Article
6
- Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 13, p. 514, doi. 10.1049/ell2.12508
- Pei, Yuhao;
- Wu, Guizhou;
- Guo, Fucheng
- Article
7
- Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 13, p. 511, doi. 10.1049/ell2.12506
- Bingtao, Zhou;
- Yuyang, Cheng;
- Mian, Xiang
- Article
8
- Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 13, p. 520, doi. 10.1049/ell2.12488
- Lee, Ki‐Hun;
- Joung, Jingon;
- Jung, Bang Chul
- Article
9
- Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 13, p. 499, doi. 10.1049/ell2.12429
- Bai, Bo;
- Chen, Riliang;
- Yuan, Kai;
- Tang, Rongxin;
- Zhao, Ziyang;
- Lin, Hai;
- Wang, Yuhao;
- Deng, Xiaohua
- Article