Works matching IS 00135194 AND DT 2022 AND VI 58 AND IP 12

Results: 14

Front cover: An efficient built‐in error detection methodology with fast page‐oriented data comparison in 3D NAND flash memories.

Published in:

Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 12, p. i, doi. 10.1049/ell2.12528

By:

Cao, HM.;
Liu, F.;
Wang, Q.;
Du, ZC.;
Jin, L.;
Huo, ZL.

Publication type:

Article

Multi‐label hybrid radar signals recognition and visualization based on interpretable convolutional classification layer and discriminative region suppression.

Published in:

Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 12, p. 480, doi. 10.1049/ell2.12507

By:

Si, Weijian;
Luo, Jiaji;
Deng, Zhian

Publication type:

Article

Low‐leakage track‐and‐hold buffer in 130‐nm CMOS with open‐gate FET bias.

Published in:

Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 12, p. 462, doi. 10.1049/ell2.12504

By:

Morton, Susan L.;
Tsen, Chan‐tang;
Ortiz, Anthony F.;
Cosand, Albert E.

Publication type:

Article

Local earthquake magnitude estimation using ridge regression model.

Published in:

Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 12, p. 465, doi. 10.1049/ell2.12503

By:

Ahn, Hyeongki;
Lee, Kyunghyun;
Kim, Hyunchang;
Hu, Mingyuan;
You, Kwanho

Publication type:

Article

Supporting availability evaluation of a smart building monitoring system aided by fog computing.

Published in:

Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 12, p. 471, doi. 10.1049/ell2.12502

By:

Silva, Francisco Airton;
Fé, Iure;
Brito, Carlos;
Araújo, Gabriel;
Feitosa, Leonel;
Choi, Eunmi;
Min, Dugki;
Nguyen, Tuan Anh

Publication type:

Article

Colours of velvet noise.

Published in:

Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 12, p. 495, doi. 10.1049/ell2.12501

By:

Meyer‐Kahlen, Nils;
Schlecht, Sebastian J.;
Välimäki, Vesa

Publication type:

Article

Dickson basis multiplier with concurrent error detection against fault attacks for lightweight cryptosystems.

Published in:

Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 12, p. 468, doi. 10.1049/ell2.12500

By:

Chiou, Che Wun;
Sun, Yuh‐Sien;
Liang, Che Wei;
Chen, Liang Yu;
Dai, Shih En;
To, Chen En;
Chien, Chen Che

Publication type:

Article

Building 3D reconstruction of TomoSAR using multiple bounce scattering model.

Published in:

Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 12, p. 486, doi. 10.1049/ell2.12462

By:

Zhang, Fubo;
Yang, Yaqian;
Chen, Longyong;
Yang, Ling

Publication type:

Article

Acute coronary syndrome risk prediction by ensemble‐MLPs.

Published in:

Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 12, p. 459, doi. 10.1049/ell2.12499

By:

Li, Wenjian;
Bai, Lin;
Li, Yiming;
Yi, Zhang;
Wang, Jianyong;
Peng, Yong

Publication type:

Article

A new class of self‐normalising LMS algorithms.

Published in:

Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 12, p. 492, doi. 10.1049/ell2.12498

By:

Ploder, Oliver;
Lang, Oliver;
Paireder, Thomas;
Motz, Christian;
Huemer, Mario

Publication type:

Article

A switched‐capacitor‐assisted wireless power transfer system with regulating TX power and fast global loop.

Published in:

Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 12, p. 477, doi. 10.1049/ell2.12496

By:

Huang, Chenyu;
Lu, Yan;
Zhan, Chenchang;
Martins, Rui P.

Publication type:

Article

Unidirectional medium voltage rectifier utilizing sinusoidal input currents.

Published in:: Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 12, p. 474, doi. 10.1049/ell2.12495
Publication type:: Article

Bayesian adaptive direction detector in sample‐starved environment.

Published in:

Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 12, p. 489, doi. 10.1049/ell2.12493

By:

Sha, Minghui;
Mao, Erke;
Meng, Fei

Publication type:

Article

An efficient built‐in error detection methodology with fast page‐oriented data comparison in 3D NAND flash memories.

Published in:

Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 12, p. 483, doi. 10.1049/ell2.12484

By:

Cao, HM.;
Liu, F.;
Wang, Q.;
Du, ZC.;
Jin, L.;
Huo, ZL.

Publication type:

Article