Works matching IS 00135194 AND DT 2020 AND VI 56 AND IP 3
1
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 162, doi. 10.1049/el.2019.3336
- Zeyu Liu;
- Yiyang Ni;
- Xiao Li;
- Shi Jin
- Article
2
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 160, doi. 10.1049/el.2019.3219
- Ushikoshi, D.;
- Tanikawa, M.;
- Asano, K.;
- Sanji, K.;
- Ikeda, M.;
- Anzai, D.;
- Wakatsuchi, H.
- Article
3
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 157, doi. 10.1049/el.2019.2503
- Article
4
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 155, doi. 10.1049/el.2019.2574
- Moazzen, H.;
- Mohammadi, A.;
- Majidi, M.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 153, doi. 10.1049/el.2019.2951
- Mingmin Huang;
- Jie Li;
- Changjiang Xie;
- Li Lai;
- Min Gong
- Article
6
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 150, doi. 10.1049/el.2019.2637
- Article
7
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 147, doi. 10.1049/el.2019.2504
- Article
8
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 144, doi. 10.1049/el.2019.3085
- Takeda, N.;
- Tsuneyasu, S.;
- Satoh, T.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 141, doi. 10.1049/el.2019.3372
- Article
10
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 139, doi. 10.1049/el.2019.2020
- Article
11
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 137, doi. 10.1049/el.2019.3066
- Jiaqiyu Zhan;
- Zhiqiang Bai;
- Yuesheng Zhu
- Article
12
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 134, doi. 10.1049/el.2019.3293
- Turhan, C. Guzel;
- Bilge, H. S.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 132, doi. 10.1049/el.2019.3011
- Ye Yuan;
- Yiqing Ma;
- Shuaipo Guo;
- Fan Yang;
- Bo Xu
- Article
14
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 129, doi. 10.1049/el.2019.2830
- Article
15
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 127, doi. 10.1049/el.2019.3012
- Bae, I.;
- Kim, J. H.;
- Kim, S.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 125, doi. 10.1049/el.2019.2963
- Article
17
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 123, doi. 10.1049/el.2019.2905
- Article
18
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 121, doi. 10.1049/el.2019.3428
- Yao Li;
- Xiao-Wei Zhu;
- Ling Tian;
- Rui-Jia Liu
- Article
19
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 119, doi. 10.1049/el.2019.3141
- Park, J.-S.;
- Kim, D.-H.;
- An, T.-J.;
- Kim, M.-K.;
- Ahn, G.-C.;
- Lee, S.-H.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 117, doi. 10.1049/el.2019.2871
- Saurabh, A. Kumar;
- Rathore, P. Singh;
- Meshram, M. Kumar
- Article
21
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 115, doi. 10.1049/el.2019.2887
- Siddiqui, T. A.;
- Khanal, P.;
- Vähä-Savo, L.;
- Lindvall, N.;
- Holopainen, J.;
- Viikari, V.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 113, doi. 10.1049/el.2020.0123
- Article
23
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 112, doi. 10.1049/el.2020.0125
- Article
25
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 211, doi. 10.1049/el.2019.3322
- Isah, A.;
- Nguetcho, A.S. Tchakoutio;
- Binczak, S.;
- Bilbault, J.M.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 209, doi. 10.1049/el.2019.3421
- Article
27
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 207, doi. 10.1049/el.2019.3587
- Armstrong, A.M.;
- Pickrell, G.P.;
- Allerman, A.A.;
- Crawford, M.H.;
- Glaser, C.E.;
- Smith, T.;
- Abate, V.M.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 205, doi. 10.1049/el.2019.3458
- Zhang, Jinping;
- Zhao, Qian;
- Wang, Kang;
- Li, Zehong;
- Zhang, Bo
- Article
29
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 203, doi. 10.1049/el.2019.3588
- Article
30
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 201, doi. 10.1049/el.2019.2903
- Yi, Zhenxiang;
- Zhao, Tian;
- Qin, Ming;
- Huang, Qing‐An
- Article
31
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 199, doi. 10.1049/el.2019.3229
- Fan, Lin‐Jie;
- Bi, Jin‐Shun;
- Xu, Yan‐Nan;
- Xi, Kai;
- Ma, Yao;
- Liu, Ming;
- Majumdar, Sandip
- Article
32
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 197, doi. 10.1049/el.2019.3316
- Jin, Benzhou;
- Zhang, Shubai;
- Que, Zhongyuan
- Article
33
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 195, doi. 10.1049/el.2019.3380
- Qiao, Xingshuai;
- Shan, Tao;
- Tao, Ran
- Article
34
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 192, doi. 10.1049/el.2019.3221
- Hosseini, S.;
- Taheri, S.;
- Pouresmaeil, E.;
- Taheri, H.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 189, doi. 10.1049/el.2019.3157
- Mirza, J.;
- Kanwal, B.;
- Ghafoor, S.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 187, doi. 10.1049/el.2019.3331
- Hassona, A.;
- Vassilev, V.;
- He, Z.S.;
- Zaman, A.;
- Mariotti, C.;
- Dielacher, F.;
- Zirath, H.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 184, doi. 10.1049/el.2019.3669
- Article
38
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 182, doi. 10.1049/el.2019.3047
- Haider, Muhammad Furqan;
- You, Fei;
- Shi, Weimin;
- Ahmad, Shakeel;
- Qi, Tian
- Article
39
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 180, doi. 10.1049/el.2019.3488
- Park, Kwanseo;
- Jeong, Deog‐Kyoon
- Article
40
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 178, doi. 10.1049/el.2019.3165
- Dong, Haoyi;
- Chen, Jixin;
- Hou, Debin
- Article
41
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 174, doi. 10.1049/el.2019.3138
- Belazzoug, M.;
- Messaoudene, I.;
- Aidel, S.;
- Denidni, T.A.;
- Kishk, A.A.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 176, doi. 10.1049/el.2019.2823
- Shi, Shujie;
- Qian, Zuping;
- Cao, Wenquan
- Article
43
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 172, doi. 10.1049/el.2019.3315
- Ma, Xiao;
- Yang, Feng;
- Yang, Peng;
- Wang, Rui;
- Yan, Yi
- Article
44
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 171, doi. 10.1049/el.2019.3230
- Article
45
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 169, doi. 10.1049/el.2020.0290
- Article
46
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 168, doi. 10.1049/el.2020.0305
- Article
47
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 168, doi. 10.1049/el.2020.0226
- Article
48
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 162, doi. 10.1049/el.2019.3336
- Liu, Zeyu;
- Ni, Yiyang;
- Li, Xiao;
- Jin, Shi
- Article
49
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 160, doi. 10.1049/el.2019.3219
- Ushikoshi, D.;
- Tanikawa, M.;
- Asano, K.;
- Sanji, K.;
- Ikeda, M.;
- Anzai, D.;
- Wakatsuchi, H.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 3, p. 157, doi. 10.1049/el.2019.2503
- Article