Works matching IS 00135194 AND DT 2020 AND VI 56 AND IP 2
1
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 107, doi. 10.1049/el.2019.2940
- Jiachen Sun;
- Hao Liu;
- Xiao Ma
- Article
2
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 105, doi. 10.1049/el.2019.3299
- Chen Chen;
- Songjiang Yang;
- Jiliang Zhang;
- Xiaoli Chu;
- Jie Zhang
- Article
3
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 104, doi. 10.1049/el.2019.2982
- Qi Li;
- Tingting Bao;
- Haiou Li;
- Tangyou Sun;
- Yuan Zuo
- Article
4
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 102, doi. 10.1049/el.2019.2784
- Kim, D.;
- Cho, K.;
- Woo, S.;
- Kim, S.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 99, doi. 10.1049/el.2019.2601
- Tingxiao Zhang;
- Jinli Chen;
- Xuan Chen
- Article
6
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 97, doi. 10.1049/el.2019.3072
- Wei Zhang;
- Ningyu He;
- Zishu He;
- Minghua Han
- Article
7
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 95, doi. 10.1049/el.2019.2958
- Ohiso, Y.;
- Sato, T.;
- Shindo, T.;
- Matsuzaki, H.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 93, doi. 10.1049/el.2019.1974
- Xianglian Feng;
- Hexin Jiang;
- Zhihang Wu;
- Tianshu Wang;
- Huilin Jiang;
- Shiming Gao
- Article
9
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 91, doi. 10.1049/el.2019.2385
- Surkamp, N.;
- Zyla, G.;
- Gurevich, E. L.;
- Klehr, A.;
- Knigge, A.;
- Ostendorf, A.;
- Hofmann, M. R.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 89, doi. 10.1049/el.2019.2853
- Xin Liu;
- Kun Yan;
- Guangyao Yang;
- Shengbo Ye;
- Guangyou Fang
- Article
11
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 87, doi. 10.1049/el.2019.2818
- Al-Hmood, H.;
- Al-Raweshidy, H. S.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 85, doi. 10.1049/el.2019.2877
- Article
13
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 82, doi. 10.1049/el.2019.2719
- Ahn, W.;
- Nam, S.-H.;
- Son, M.;
- Lee, H.-K.;
- Choi, S.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 80, doi. 10.1049/el.2019.2689
- Xinlei Chen;
- Xiuqiang Liu;
- Changqing Gu
- Article
15
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 78, doi. 10.1049/el.2019.2768
- Zihao Wen;
- Zhijun Li;
- Xiang Li
- Article
16
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 76, doi. 10.1049/el.2019.3277
- Article
17
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 73, doi. 10.1049/el.2019.2994
- Angerer, M.;
- Schwanninger, R.;
- März, M.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 71, doi. 10.1049/el.2019.2941
- Chuan Li;
- Fei You;
- Jinchen Wang;
- Jiajun Huang;
- Songbai He
- Article
19
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 69, doi. 10.1049/el.2019.2557
- Uhl, C.;
- Hettrich, H.;
- Möller, M.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 66, doi. 10.1049/el.2019.2307
- Alafghani, T.;
- Mandloi, N. K.;
- Ha, S.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 62, doi. 10.1049/el.2019.3233
- Article
22
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 61, doi. 10.1049/el.2019.2633
- Ming-Chun Tang;
- Chaofang Li;
- Yingjie Chen
- Article
23
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 59, doi. 10.1049/el.2019.4138
- Article
24
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 58, doi. 10.1049/el.2019.4201
- Article
26
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 107, doi. 10.1049/el.2019.2940
- Sun, Jiachen;
- Liu, Hao;
- Ma, Xiao
- Article
27
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 105, doi. 10.1049/el.2019.3299
- Chen, Chen;
- Yang, Songjiang;
- Zhang, Jiliang;
- Chu, Xiaoli;
- Zhang, Jie
- Article
28
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 104, doi. 10.1049/el.2019.2982
- Li, Qi;
- Bao, Tingting;
- Li, Haiou;
- Sun, Tangyou;
- Zuo, Yuan
- Article
29
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 102, doi. 10.1049/el.2019.2784
- Kim, D.;
- Cho, K.;
- Woo, S.;
- Kim, S.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 99, doi. 10.1049/el.2019.2601
- Zhang, Tingxiao;
- Chen, Jinli;
- Chen, Xuan
- Article
31
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 97, doi. 10.1049/el.2019.3072
- Zhang, Wei;
- He, Ningyu;
- He, Zishu;
- Han, Minghua
- Article
32
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 95, doi. 10.1049/el.2019.2958
- Ohiso, Y.;
- Sato, T.;
- Shindo, T.;
- Matsuzaki, H.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 93, doi. 10.1049/el.2019.1974
- Feng, Xianglian;
- Jiang, Hexin;
- Wu, Zhihang;
- Wang, Tianshu;
- Jiang, Huilin;
- Gao, Shiming
- Article
34
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 91, doi. 10.1049/el.2019.2385
- Surkamp, N.;
- Zyla, G.;
- Gurevich, E.L.;
- Klehr, A.;
- Knigge, A.;
- Ostendorf, A.;
- Hofmann, M.R.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 89, doi. 10.1049/el.2019.2853
- Liu, Xin;
- Yan, Kun;
- Yang, Guangyao;
- Ye, Shengbo;
- Fang, Guangyou
- Article
36
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 87, doi. 10.1049/el.2019.2818
- Al‐Hmood, H.;
- Al‐Raweshidy, H.S.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 85, doi. 10.1049/el.2019.2877
- Article
38
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 82, doi. 10.1049/el.2019.2719
- Ahn, W.;
- Nam, S.‐H.;
- Son, M.;
- Lee, H.‐K.;
- Choi, S.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 80, doi. 10.1049/el.2019.2689
- Chen, Xinlei;
- Liu, Xiuqiang;
- Gu, Changqing
- Article
40
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 78, doi. 10.1049/el.2019.2768
- Wen, Zihao;
- Li, Zhijun;
- Li, Xiang
- Article
41
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 76, doi. 10.1049/el.2019.3277
- Article
42
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 73, doi. 10.1049/el.2019.2994
- Angerer, M.;
- Schwanninger, R.;
- März, M.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 71, doi. 10.1049/el.2019.2941
- Li, Chuan;
- You, Fei;
- Wang, Jinchen;
- Huang, Jiajun;
- He, Songbai
- Article
44
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 69, doi. 10.1049/el.2019.2557
- Uhl, C.;
- Hettrich, H.;
- Möller, M.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 66, doi. 10.1049/el.2019.2307
- Alafghani, T.;
- Mandloi, N.K.;
- Ha, S.
- Article
46
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 62, doi. 10.1049/el.2019.3233
- Yang, Xiaofeng;
- Zhao, Feng
- Article
47
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 61, doi. 10.1049/el.2019.2633
- Tang, Ming‐Chun;
- Li, Chaofang;
- Chen, Yingjie
- Article
48
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 59, doi. 10.1049/el.2019.4138
- Article
49
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 58, doi. 10.1049/el.2019.4201
- Article
50
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 2, p. 58, doi. 10.1049/el.2019.4200
- Article