Works matching IS 00135194 AND DT 2019 AND VI 55 AND IP 8
1
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 493, doi. 10.1049/el.2018.7754
- Wenlong Xia;
- Qingdang Meng;
- Qingchuan Tao;
- Chen, Ray T.
- Article
2
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 491, doi. 10.1049/el.2018.7438
- Article
3
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 477, doi. 10.1049/el.2018.8241
- Reddy, P. Krishna;
- Ronanki, Deepak;
- Parthiban, P.
- Article
4
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 489, doi. 10.1049/el.2018.8114
- Azizipour, M. J.;
- Mohamed-Pour, K.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 485, doi. 10.1049/el.2018.8137
- Article
6
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 483, doi. 10.1049/el.2018.8041
- Yu Ji;
- Jintang Shang;
- Jin Zhang
- Article
7
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 481, doi. 10.1049/el.2019.0237
- Bowen Bie;
- Guang-Cai Sun;
- Mengdao Xing
- Article
8
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 479, doi. 10.1049/el.2019.0011
- Alslaimy, M.;
- Smith, G. E.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 487, doi. 10.1049/el.2018.7860
- Jianfeng Li;
- Yunxiang Li;
- Xiaofei Zhang
- Article
10
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 475, doi. 10.1049/el.2018.8106
- Onawa, Y.;
- Okayama, H.;
- Shimura, D.;
- Takahashi, H.;
- Yaegashi, H.;
- Sasaki, H.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 473, doi. 10.1049/el.2018.7982
- Xiang Li;
- De-Wei Wu;
- Qiang Miao;
- Jun-Wen Luo
- Article
12
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 471, doi. 10.1049/el.2018.8151
- Baudzus, L.;
- Krummrich, P. M.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 469, doi. 10.1049/el.2018.8025
- Xianbo Li;
- Yue, C. Patrick
- Article
14
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 467, doi. 10.1049/el.2019.0349
- Xiao-Xiao Yuan;
- Li-Heng Zhou;
- Jian-Xin Chen
- Article
15
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 465, doi. 10.1049/el.2019.0060
- Jeong, C.-H.;
- Ahn, S.-H.;
- Lee, W.-S.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 463, doi. 10.1049/el.2018.8032
- Xian-hu Luo;
- Xu Cheng;
- Jiang-an Han;
- Liang Zhang;
- Feng-jun Chen;
- Ying-jiang Guo;
- Xin-lin Xia;
- Xian-jing Deng
- Article
17
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 461, doi. 10.1049/el.2019.0277
- Haibin Wu;
- Qiongxia Pang;
- Xudong Zheng;
- Zhipeng Ma;
- Yiyu Lin;
- Zhonghe Jin
- Article
18
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 459, doi. 10.1049/el.2018.8251
- Wei Wang;
- Haifeng Hu;
- Yi Huang;
- Chongchong Ruan;
- Dihu Chen
- Article
19
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 457, doi. 10.1049/el.2019.0032
- Article
20
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 455, doi. 10.1049/el.2019.0304
- Runfa Tang;
- Huihui Song;
- Kaihua Zhang;
- Sihao Jiang
- Article
21
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 452, doi. 10.1049/el.2019.0472
- Luntian Mou;
- Shasha Mao;
- Haitao Xie;
- Yanyan Chen
- Article
22
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 450, doi. 10.1049/el.2018.7499
- Wei Ding;
- KwangSoo Yang;
- Kwang Woo Nam
- Article
23
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 448, doi. 10.1049/el.2018.7078
- Article
24
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 446, doi. 10.1049/el.2018.8143
- Article
25
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 444, doi. 10.1049/el.2019.0138
- Sengupta, S.;
- Johnston, M. L.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 442, doi. 10.1049/el.2018.7821
- Choi, J.;
- Kim, J.;
- Lee, Y.;
- Chun, J.-H.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 440, doi. 10.1049/el.2018.7762
- Dadsena, R.;
- Rohini, P.;
- Anandh, K. R.;
- Ramakrishnan, S.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 438, doi. 10.1049/el.2018.6869
- Chen, W.-H.;
- Chang, C.-H.;
- Shih, H.-Y.;
- Chiu, T.-W.;
- Kuo, C.-N.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 436, doi. 10.1049/el.2019.0142
- Yuefeng Hou;
- Yue Li;
- Zhijun Zhang
- Article
30
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 434, doi. 10.1049/el.2019.0180
- Article
31
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 433, doi. 10.1049/el.2018.6653
- Salucci, M.;
- Tenuti, L.;
- Gottardi, G.;
- Hannan, A.;
- Massa, A.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 430, doi. 10.1049/el.2019.1012
- Article
33
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 429, doi. 10.1049/el.2019.0992
- Article