Works matching IS 00135194 AND DT 2019 AND VI 55 AND IP 6
1
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 296, doi. 10.1049/el.2019.0714
- Article
2
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 295, doi. 10.1049/el.2019.0708
- Article
3
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 294, doi. 10.1049/el.2019.0690
- Article
5
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 333, doi. 10.1049/el.2018.8225
- Article
7
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 339, doi. 10.1049/el.2018.8170
- Nguyen, H.-N.;
- Nguyen, T. D.;
- Lee, H.-H.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 327, doi. 10.1049/el.2018.8089
- Zhi-Ying Zhu;
- Yong-Jiang Jiang;
- Jin Zhu;
- Xuan Guo
- Article
9
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 312, doi. 10.1049/el.2018.8082
- Article
10
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 348, doi. 10.1049/el.2018.8075
- Wen, W.;
- Bai, X.;
- Zhan, W.;
- Tomizuka, M.;
- Hsu, L.-T.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 352, doi. 10.1049/el.2018.8047
- Article
12
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 334, doi. 10.1049/el.2018.8037
- Chavez-Burbano, P.;
- Vitek, S.;
- Teli, S. R.;
- Guerra, V.;
- Rabadan, J.;
- Perez-Jimenez, R.;
- Zvanovec, S.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 329, doi. 10.1049/el.2018.8016
- da Fonseca, A. L. T. B.;
- Cabrera, F. L.;
- de Sousa, F. R.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 342, doi. 10.1049/el.2018.8013
- Guisso, R. A.;
- Andrade, A. M. S. S.;
- Hey, H. L.;
- da S. Martins, M. L.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 319, doi. 10.1049/el.2018.7980
- Article
16
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 306, doi. 10.1049/el.2018.7970
- Quanzhen Duan;
- Xuan Wang;
- Shengming Huang;
- Yuemin Ding;
- Zhen Meng;
- Kai Shi
- Article
17
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 304, doi. 10.1049/el.2018.7936
- Scheiner, B.;
- Schellenberger, S.;
- Shi, K.;
- Heusinger, E.;
- Michler, F.;
- Lurz, F.;
- Weigel, R.;
- Koelpin, A.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 310, doi. 10.1049/el.2018.7914
- Article
19
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 314, doi. 10.1049/el.2018.7883
- Ling Zhai;
- Jihua Zhu;
- Qinghai Zheng;
- Shanmin Pang;
- Zhongyu Li;
- Jun Wang
- Article
20
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 331, doi. 10.1049/el.2018.7850
- Jin Li;
- Sheng Li;
- Guan-Long Huang;
- Tao Yuan;
- Attallah, Moataz M.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 350, doi. 10.1049/el.2018.7809
- Fenghao Liu;
- Mingmin Huang;
- Rui Li;
- Li Lai;
- Min Gong
- Article
22
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 355, doi. 10.1049/el.2018.7800
- Shayanfar, H.;
- Saeedi-Sourck, H.;
- Farhang, A.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 300, doi. 10.1049/el.2018.7753
- Article
24
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 325, doi. 10.1049/el.2018.7671
- Amini, S.;
- Ghaemmaghami, S.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 346, doi. 10.1049/el.2018.7632
- Dandan Meng;
- Xianpeng Wang;
- Mengxing Huang;
- Yue Yin;
- Chong Shen;
- Kun Zhang
- Article
26
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 344, doi. 10.1049/el.2018.7511
- Wasserzier, C.;
- Galati, G.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 299, doi. 10.1049/el.2018.7489
- Nawaz, H.;
- Gürbüz, Ö.;
- Tekin, I.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 353, doi. 10.1049/el.2018.7347
- Zhongtao Luo;
- Renming Guo;
- Xinshu Zhang;
- Yaqin Nie
- Article
29
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 336, doi. 10.1049/el.2018.7146
- Xiaoxi Chen;
- Guangyong Li;
- Pengwei Li;
- Mao Ye
- Article
30
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 302, doi. 10.1049/el.2018.6857
- Sen Wan;
- Changqing Jiang;
- Jianqi Ding;
- Luming Li
- Article
31
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 322, doi. 10.1049/el.2018.6855
- Figueiredo, R. B. D.;
- Lima, J. B.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 316, doi. 10.1049/el.2018.6713
- Cong Liu;
- Longhua Ma;
- Zheming Lu;
- Xiance Jin;
- Jingyun Xu
- Article
33
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 320, doi. 10.1049/el.2018.6117
- Article
34
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 308, doi. 10.1049/el.2018.5547
- Article
35
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 337, doi. 10.1049/el.2018.5243
- Min Xue;
- Wei Chen;
- Beibei Zhu;
- Shilong Pan
- Article
36
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 348, doi. 10.1049/el.2018.8075
- Wen, W.;
- Bai, X.;
- Zhan, W.;
- Tomizuka, M.;
- Hsu, L.‐T.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 344, doi. 10.1049/el.2018.7511
- Wasserzier, C.;
- Galati, G.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 346, doi. 10.1049/el.2018.7632
- Meng, Dandan;
- Wang, Xianpeng;
- Huang, Mengxing;
- Yin, Yue;
- Shen, Chong;
- Zhang, Kun
- Article
39
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 334, doi. 10.1049/el.2018.8037
- Chavez‐Burbano, P.;
- Vitek, S.;
- Teli, S.R.;
- Guerra, V.;
- Rabadan, J.;
- Perez‐Jimenez, R.;
- Zvanovec, S.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 333, doi. 10.1049/el.2018.8225
- Article
42
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 355, doi. 10.1049/el.2018.7800
- Shayanfar, H.;
- Saeedi‐Sourck, H.;
- Farhang, A.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 353, doi. 10.1049/el.2018.7347
- Luo, Zhongtao;
- Guo, Renming;
- Zhang, Xinshu;
- Nie, Yaqin
- Article
44
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 352, doi. 10.1049/el.2018.8047
- Article
45
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 350, doi. 10.1049/el.2018.7809
- Liu, Fenghao;
- Huang, Mingmin;
- Li, Rui;
- Lai, Li;
- Gong, Min
- Article
46
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 339, doi. 10.1049/el.2018.8170
- Nguyen, H.‐N.;
- Nguyen, T.D.;
- Lee, H.‐H.
- Article
47
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 336, doi. 10.1049/el.2018.7146
- Chen, Xiaoxi;
- Li, Guangyong;
- Li, Pengwei;
- Ye, Mao
- Article
48
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 342, doi. 10.1049/el.2018.8013
- Guisso, R.A.;
- Andrade, A.M.S.S.;
- Hey, H.L.;
- Martins, M.L. da S.
- Article
49
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 337, doi. 10.1049/el.2018.5243
- Xue, Min;
- Chen, Wei;
- Zhu, Beibei;
- Pan, Shilong
- Article
50
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 6, p. 331, doi. 10.1049/el.2018.7850
- Li, Jin;
- Li, Sheng;
- Huang, Guan‐Long;
- Yuan, Tao;
- Attallah, Moataz M.
- Article