Works matching IS 00135194 AND DT 2019 AND VI 55 AND IP 3
2
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 117, doi. 10.1049/el.2019.0023
- Article
6
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 161, doi. 10.1049/el.2018.7666
- Quintero, V.;
- Perez, A.;
- Estevez, C.;
- Orchard, M.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 140, doi. 10.1049/el.2018.7639
- Matsumoto, H.;
- Suzuki, S.;
- Asada, M.;
- Monnai, Y.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 142, doi. 10.1049/el.2018.7565
- Pelzman, C.;
- Chanover, N.;
- Voelz, D.;
- Cho, S.-Y.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 135, doi. 10.1049/el.2018.7553
- Lim, J.;
- Lee, S.;
- Oh, S.;
- Jeong, J.;
- Lee, J.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 119, doi. 10.1049/el.2018.7541
- Junbo Wang;
- Yuan Yao;
- Junsheng Yu;
- Xiaodong Chen
- Article
11
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 133, doi. 10.1049/el.2018.7501
- Chejarla, S.;
- Thummaluru, S. R.;
- Chaudhary, R. K.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 131, doi. 10.1049/el.2018.6934
- Qiaokang Liang;
- Shao Xiang;
- Jianyong Long;
- Wei Sun;
- Yaonan Wang;
- Dan Zhang
- Article
13
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 157, doi. 10.1049/el.2018.7324
- Kayani, A.;
- Naqvi, I. H.;
- Shakir, M. Z.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 153, doi. 10.1049/el.2018.7284
- Piazzo, L.;
- Raguso, M. C.;
- Seu, R.;
- Mastrogiuseppe, M.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 149, doi. 10.1049/el.2018.7251
- Zhiming Xu;
- Xiaofeng Ai;
- Qihua Wu;
- Feng Zhao;
- Shunping Xiao
- Article
16
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 138, doi. 10.1049/el.2018.7172
- Article
17
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 122, doi. 10.1049/el.2018.7496
- Almutairi, F. T.;
- Karsilayan, A. I.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 120, doi. 10.1049/el.2018.6921
- Sadecki, J.;
- Marszalek, W.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 148, doi. 10.1049/el.2018.6738
- Shuyu Zhang;
- Menglian Zhao;
- Rubo Hu;
- Xiaobo Wu
- Article
20
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 137, doi. 10.1049/el.2018.6579
- Article
21
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 146, doi. 10.1049/el.2018.6572
- Hao Zhang;
- Yong-Xin Guo;
- Wen Wu
- Article
22
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 129, doi. 10.1049/el.2018.6470
- Article
23
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 144, doi. 10.1049/el.2018.6413
- Loghmari, Z.;
- Bahriz, M.;
- Meguekam, A.;
- Teissier, R.;
- Baranov, A. N.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 159, doi. 10.1049/el.2018.6059
- Zequn Fang;
- Zheng Ma;
- Karagiannidis, George K.;
- Ming Xiao;
- Pingzhi Fan
- Article
25
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 151, doi. 10.1049/el.2018.5851
- Lee, J.;
- Kim, D.;
- Jeong, S.;
- Kim, Y.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 155, doi. 10.1049/el.2018.5824
- Tao Chen;
- Sichao Wang;
- Xiangsong Huang
- Article
27
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 127, doi. 10.1049/el.2018.5560
- Delgado, R.;
- You, B.-J.;
- Han, M.;
- Choi, B. W.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 226, doi. 10.1049/el.2018.7760
- Article
29
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 224, doi. 10.1049/el.2018.6325
- Nyarko, James K.N.;
- Xie, Jian;
- Yao, Rugui;
- Wang, Yuexian;
- Wang, Ling
- Article
30
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 212, doi. 10.1049/el.2018.7689
- Xiao, Jian‐Kang;
- Su, Xiao‐Bao;
- Wang, Hui‐Xia;
- Ma, Jian‐Guo
- Article
31
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 220, doi. 10.1049/el.2018.7564
- Mutovkin, A.;
- Yuhimenko, V.;
- Schacham, S.;
- Kuperman, A.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 218, doi. 10.1049/el.2018.6911
- Nefabas, Gebeyehu;
- Zhao, Haiquan
- Article
33
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 216, doi. 10.1049/el.2018.8035
- Hou, Yansong;
- Sun, Cunzhi;
- Wu, Junkang;
- Hong, Rongdun;
- Cai, Jiafa;
- Chen, Xiaping;
- Lin, Dingqu;
- Wu, Zhengyun
- Article
34
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 214, doi. 10.1049/el.2018.6876
- Article
35
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 222, doi. 10.1049/el.2018.6680
- Park, Jeonghong;
- Choi, Jinwoo;
- Choi, Hyun‐Taek
- Article
36
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 210, doi. 10.1049/el.2018.7694
- Ieu, Wangshuxing;
- Zhou, Dongfang;
- Zhang, Dewei;
- Lv, Dalong
- Article
37
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 208, doi. 10.1049/el.2018.7289
- Article
38
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 206, doi. 10.1049/el.2018.8049
- Gómez‐García, Roberto;
- Muñoz‐Ferreras, José‐María;
- Yang, Li;
- Feng, Wenjie
- Article
39
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 204, doi. 10.1049/el.2018.7868
- Gutiérrez‐Martínez, C.;
- Ricardez‐Trejo, R.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 203, doi. 10.1049/el.2018.7287
- Palitó, T.T.C.;
- Assagra, Y.A.O.;
- Altafim, R.A.P.;
- Carmo, J.P.;
- Altafim, R.A.C.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 201, doi. 10.1049/el.2018.7680
- Li, Zhe;
- Chang, Wenhan;
- Gao, Chengchen;
- Hao, Yilong
- Article
42
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 198, doi. 10.1049/el.2018.7164
- Article
43
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 196, doi. 10.1049/el.2018.7527
- Article
44
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 194, doi. 10.1049/el.2018.6435
- Uddin, A.F.M. Shahab;
- Chung, T.C.;
- Bae, Sung‐Ho
- Article
45
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 192, doi. 10.1049/el.2018.7408
- Article
46
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 190, doi. 10.1049/el.2018.6167
- Ruan, Congcong;
- Chen, Dihu;
- Hu, Haifeng
- Article
47
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 188, doi. 10.1049/el.2018.7452
- Yoon, Y.‐U.;
- Park, D.‐H.;
- Kim, J.‐G.;
- Lee, J.;
- Kang, J.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 186, doi. 10.1049/el.2018.7791
- Article
49
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 184, doi. 10.1049/el.2018.7871
- Article
50
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 182, doi. 10.1049/el.2018.6624
- Chen, Rui;
- Yang, Changshui;
- Jia, Huizhu;
- Huang, Tiejun
- Article