Works matching IS 00135194 AND DT 2019 AND VI 55 AND IP 17
1
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 920, doi. 10.1049/el.2019.2615
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2
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 921, doi. 10.1049/el.2019.2611
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3
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 923, doi. 10.1049/el.2019.2610
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4
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 920, doi. 10.1049/el.2019.2561
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5
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 918, doi. 10.1049/el.2019.2375
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6
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 947, doi. 10.1049/el.2019.1919
- Sai Li;
- Xuedao Wang;
- Jianpeng Wang;
- Lei Ge
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7
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 927, doi. 10.1049/el.2019.1902
- Chang, S.-E.;
- Chen, Y.-J. E.
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8
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 966, doi. 10.1049/el.2019.1864
- Liu, Y.;
- Tong, K.-F.;
- Wong, K.-K.
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9
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 949, doi. 10.1049/el.2019.1840
- Webber, J.;
- Nishigami, N.;
- Kim, J.-Y.;
- Fujita, M.;
- Nagatsuma, T.
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10
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 957, doi. 10.1049/el.2019.1795
- Xiaobo Zhang;
- Wenbo Xu;
- Jiaru Lin;
- Yifei Dang
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11
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 961, doi. 10.1049/el.2019.1748
- Juan Shi;
- Qunfei Zhang;
- Wen Tao Shi
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12
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 963, doi. 10.1049/el.2019.1724
- Qiang Sun;
- Yezeng Wu;
- Jue Wang;
- Chen Xu;
- Kai-Kit Wong
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13
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 959, doi. 10.1049/el.2019.1676
- Liyang Lu;
- Wenbo Xu;
- Yupeng Cui;
- Yifei Dang;
- Siye Wang
- Article
14
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 942, doi. 10.1049/el.2019.1658
- Turner, P. J.;
- Garcia, B.;
- Yantchev, V.;
- Dyer, G.;
- Yandrapalli, S.;
- Villanueva, L. G.;
- Hammond, R. B.;
- Plessky, V.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 953, doi. 10.1049/el.2019.1564
- Cheng Hu;
- Yunkai Deng;
- Weiming Tian;
- Zheng Zhao
- Article
16
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 955, doi. 10.1049/el.2019.1556
- Rui Gao;
- Dengyun Lei;
- Zhiyuan He;
- Yunfei En;
- Yun Huang
- Article
17
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 936, doi. 10.1049/el.2019.1506
- Huang-Chang Lee;
- Yu-Cheng Chen
- Article
18
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 951, doi. 10.1049/el.2019.1439
- Ozaki, J.;
- Ogiso, Y.;
- Hashizume, Y.;
- Kanazawa, S.;
- Ueda, Y.;
- Nunoya, N.;
- Tanobe, H.;
- Ishikawa, M.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 944, doi. 10.1049/el.2019.1420
- Morán-López, Ana;
- Ruiz-Cruz, Jorge A.;
- Córcoles, Juan;
- Montejo-Garai, José R.;
- Rebollar, Jesús M.
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20
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 933, doi. 10.1049/el.2019.1380
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21
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 940, doi. 10.1049/el.2019.1340
- Merfeldas, A.;
- Kuzas, P.;
- Gailius, D.;
- Nakutis, Z.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 931, doi. 10.1049/el.2019.1148
- Zhe Yang;
- Yun Pan;
- Ruohong Huan;
- Yaoqi Bao
- Article
23
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 938, doi. 10.1049/el.2019.1084
- Joung, J.;
- Jung, S.;
- Chung, S.;
- Jeong, E.-R.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 17, p. 928, doi. 10.1049/el.2019.0906
- Setiawan, Feri;
- Yahya, Bernardo Nugroho;
- Seok-Lyong Lee
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