Works matching IS 00135194 AND DT 2019 AND VI 55 AND IP 12
1
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 12, p. 715, doi. 10.1049/el.2018.6878
- Wei Wang;
- Xiaoxiang Wang;
- Dongyu Wang
- Article
2
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 12, p. 713, doi. 10.1049/el.2018.7375
- Article
3
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 12, p. 711, doi. 10.1049/el.2019.0601
- Long Hu;
- Yaogong Wang;
- Ming Xu
- Article
4
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 12, p. 709, doi. 10.1049/el.2019.0942
- Brousseau, C.;
- Mahdjoubi, K.;
- Emile, O.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 12, p. 707, doi. 10.1049/el.2019.0739
- Jianxin Zhu;
- Yan Xing;
- Shun Ding;
- Haibing Hu
- Article
6
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 12, p. 705, doi. 10.1049/el.2019.0574
- Herper, M.;
- van der Lee, A.;
- Kolb, J.;
- Gronenborn, S.;
- Moench, H.;
- Loosen, P.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 12, p. 703, doi. 10.1049/el.2019.0523
- Thuy, H. T.;
- Won, Y. Y.;
- Seo, D. S.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 12, p. 701, doi. 10.1049/el.2019.0840
- Article
9
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 12, p. 699, doi. 10.1049/el.2019.0208
- Jelodar, A.;
- Yeganeh, A. Nooraei;
- Sedighy, S. H.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 12, p. 697, doi. 10.1049/el.2019.1270
- Zhidan Shen;
- Kai Xu;
- Jin Shi
- Article
11
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 12, p. 694, doi. 10.1049/el.2019.0541
- Joung, J.;
- Jung, B. C.;
- Choi, J.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 12, p. 692, doi. 10.1049/el.2019.1213
- Yoo, C.-H.;
- Shin, Y.-G.;
- Kim, S.-W.;
- Ko, S.-J.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 12, p. 679, doi. 10.1049/el.2018.1002
- Saeidi-Manesh, H.;
- Zhang, G.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 12, p. 688, doi. 10.1049/el.2018.8160
- Cho, H. H.;
- Eun, C. M.;
- Jeong, O. H.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 12, p. 685, doi. 10.1049/el.2019.0784
- Crovetti, P. S.;
- Rubino, R.;
- Musolino, F.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 12, p. 683, doi. 10.1049/el.2019.0679
- Article
17
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 12, p. 681, doi. 10.1049/el.2019.0803
- Punitha, N.;
- Ramakrishnan, S.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 12, p. 690, doi. 10.1049/el.2019.0553
- Changwu Zhang;
- Yuchen Tang;
- Hengzhu Liu
- Article
19
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 12, p. 677, doi. 10.1049/el.2019.0920
- Fartookzadeh, M.;
- Armaki, S. H. Mohseni
- Article
21
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 12, p. 672, doi. 10.1049/el.2019.1622
- Crovetti, P. S.;
- Musolino, F.;
- Aiello, O.;
- Toledo, P.;
- Rubino, R.
- Article