Works matching IS 00135194 AND DT 2018 AND VI 54 AND IP 9
2
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 542, doi. 10.1049/el.2018.1188
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3
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 541, doi. 10.1049/el.2018.1186
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4
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 540, doi. 10.1049/el.2018.1184
- Article
5
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 574, doi. 10.1049/el.2018.0652
- Ahn, H.;
- Baek, S.;
- Nam, I.;
- Lee, O.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 564, doi. 10.1049/el.2018.0621
- Article
7
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 572, doi. 10.1049/el.2018.0602
- Heredia, J.;
- Ribó, M.;
- Pradell, L.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 556, doi. 10.1049/el.2018.0592
- Mahendra, T. V.;
- Hussain, S. W.;
- Mishra, S.;
- Dandapat, A.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 585, doi. 10.1049/el.2018.0572
- Veerabathini, A.;
- Eshappa, N. B.;
- Furth, P. M.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 576, doi. 10.1049/el.2018.0276
- Ming Luo;
- Xiao-Hong Tang;
- Di Lu;
- Yong-Hong Zhang
- Article
11
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 545, doi. 10.1049/el.2018.0133
- Article
12
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 553, doi. 10.1049/el.2018.0128
- Sethi, W. T.;
- Ashraf, M. A.;
- Alshebeili, S. A.;
- Issa, K.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 589, doi. 10.1049/el.2018.0571
- Article
14
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 554, doi. 10.1049/el.2018.0558
- Jianwei Jiang;
- Yiran Xu;
- Jiangchuan Ren;
- Wenyi Zhu;
- Dianpeng Lin;
- Jun Xiao;
- Weiran Kong;
- Shichang Zou
- Article
15
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 568, doi. 10.1049/el.2018.0555
- Zhong Tang;
- Yun Fang;
- Xiaopeng Yu;
- Zheng Shi;
- Nianxiong Tan
- Article
16
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 601, doi. 10.1049/el.2018.0545
- Article
17
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 578, doi. 10.1049/el.2018.0503
- Gómez-García, Roberto;
- Muñoz-Ferreras, José-María;
- Wenjie Feng;
- Psychogiou, Dimitra
- Article
18
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 570, doi. 10.1049/el.2018.0363
- McGhee, J. R.;
- Sinclair, M.;
- Southee, D. J.;
- Wijayantha, K. G. U.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 680, doi. 10.1049/el.2018.0371
- Matsumoto, T.;
- Komatsu, K.;
- Hosoya, G.;
- Yashima, H.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 548, doi. 10.1049/el.2018.0333
- Xinyu Ma;
- Yanhui Liu;
- Kai Da Xu;
- Chunhui Zhu;
- Qing Huo Liu
- Article
21
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 566, doi. 10.1049/el.2018.0336
- Jianlong Zhao;
- Hua Qu;
- Jihong Zhao;
- Dingchao Jiang
- Article
22
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 582, doi. 10.1049/el.2018.0291
- Fricke, J.;
- Brox, O.;
- Wenzel, H.;
- Matalla, M.;
- Ressel, P.;
- Knigge, A.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 551, doi. 10.1049/el.2017.4589
- Sui Zhou;
- Weiping Zhang;
- Yang Zou;
- Bin Ou;
- Yuying Zhang;
- Chenyang Wang
- Article
24
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 562, doi. 10.1049/el.2017.4426
- Article
25
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 593, doi. 10.1049/el.2017.4419
- Bolourchi, P.;
- Demirel, H.;
- Uysal, S.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 599, doi. 10.1049/el.2018.0260
- Choi, Y. J.;
- Kil, Y. S.;
- Kim, S.-H.;
- Chang, S.-H.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 546, doi. 10.1049/el.2018.0190
- Xingxing Li;
- Dang-Wei Wang;
- Xiaoyan Ma;
- Zhiming Xiong
- Article
28
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 597, doi. 10.1049/el.2017.4357
- Xi Li;
- Fucheng Guo;
- Le Yang;
- Min Zhang
- Article
29
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 584, doi. 10.1049/el.2017.2433
- Campione, S.;
- Burckel, D. B.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 728, doi. 10.1049/el.2018.1314
- Article
31
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 587, doi. 10.1049/el.2017.4325
- Haihong Huang;
- Nini Liu;
- Haixin Wang
- Article
32
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 558, doi. 10.1049/el.2017.4074
- Kim, Y. H.;
- Park, J. B.;
- Yoon, T. S.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 595, doi. 10.1049/el.2017.3622
- Article
34
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 726, doi. 10.1049/el.2018.0557
- Article
35
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 724, doi. 10.1049/el.2018.0497
- Moltchanov, D.;
- Ometov, A.;
- Andreev, S.;
- Koucheryavy, Y.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 591, doi. 10.1049/el.2017.3692
- Hailong Xu;
- Xiaowei Cui;
- Mingquan Lu
- Article
37
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 560, doi. 10.1049/el.2017.3227
- Yang, J.;
- Hore, A.;
- Yadid-Pecht, O.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 722, doi. 10.1049/el.2018.0629
- Article
39
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 720, doi. 10.1049/el.2018.0045
- Article
40
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 718, doi. 10.1049/el.2018.0423
- Tan, Jie;
- Wang, Yikai;
- He, Zishu;
- Sun, Guohao
- Article
41
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 716, doi. 10.1049/el.2018.0452
- Article
42
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 714, doi. 10.1049/el.2018.0788
- Song, Yan;
- Li, Yanpeng;
- Pang, Shuang;
- Zhao, Shanshan;
- Wang, Hongqiang
- Article
43
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 712, doi. 10.1049/el.2018.0705
- Gao, Yesheng;
- Huang, Penghui;
- Liu, Xingzhao
- Article
44
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 710, doi. 10.1049/el.2018.1005
- Andrade, A.M.S.S.;
- Guisso, R.A.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 708, doi. 10.1049/el.2018.0873
- Zhang, Fangzheng;
- Shi, Jingzhan;
- Pan, Shilong
- Article
46
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 706, doi. 10.1049/el.2018.0867
- Thorette, A.;
- Romanelli, M.;
- Bouhier, S.;
- Van Dijk, F.;
- Vallet, M.;
- Alouini, M.
- Article
47
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 705, doi. 10.1049/el.2018.0932
- Kurokawa, T.;
- Ishibashi, T.;
- Shimizu, M.;
- Kato, K.;
- Nagatsuma, T.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 691, doi. 10.1049/el.2017.4176
- Pellaton, M.;
- Affolderbach, C.;
- Skrivervik, A.K.;
- Ivanov, A.E.;
- Debogovic, T.;
- Rijk, E.;
- Mileti, G.
- Article
49
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 703, doi. 10.1049/el.2018.0466
- Mellah, H.;
- Mirjalili, S.M.;
- Zhang, X.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 9, p. 699, doi. 10.1049/el.2018.0312
- Downie, J.D.;
- Hurley, J.;
- Nagarajan, R.;
- Maj, T.;
- Dong, H.;
- Makovejs, S.
- Article