Works matching IS 00135194 AND DT 2018 AND VI 54 AND IP 7
1
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 403, doi. 10.1049/el.2018.0837
- Article
2
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 402, doi. 10.1049/el.2018.0836
- Article
4
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 404, doi. 10.1049/el.2018.0834
- Article
6
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 447, doi. 10.1049/el.2018.0119
- Soujeri, E.;
- Kaddoum, G.;
- Herceg, M.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 441, doi. 10.1049/el.2017.4317
- Article
8
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 443, doi. 10.1049/el.2018.0002
- Jinshan Ding;
- Zhong Xu;
- Tianhe Wang;
- Mengdao Xing
- Article
9
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 432, doi. 10.1049/el.2017.4639
- Liu, S.;
- Jung, D.;
- Norman, J. C.;
- Kennedy, M. J.;
- Gossard, A. C.;
- Bowers, J. E.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 445, doi. 10.1049/el.2018.0196
- Article
11
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 418, doi. 10.1049/el.2017.4025
- Acevedo, A.;
- Gomez-Arista, I.;
- Kolokoltsev, O.;
- Sánchez, M. H. Montiel;
- Guzmán, R. Castañeda
- Article
12
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 454, doi. 10.1049/el.2017.4513
- Xiangbin Yu;
- Hao Wang;
- Shu-Hung Leung;
- Tao Teng
- Article
13
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 430, doi. 10.1049/el.2018.0101
- Yang, Z.;
- Follman, D.;
- Albrecht, A. R.;
- Heu, P.;
- Giannini, N.;
- Cole, G. D.;
- Sheik-Bahae, M.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 460, doi. 10.1049/el.2018.0082
- Psychogiou, D.;
- Gómez-García, R.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 458, doi. 10.1049/el.2018.0063
- Article
16
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 416, doi. 10.1049/el.2018.0056
- Musayev, J.;
- Liscidini, A.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 435, doi. 10.1049/el.2018.0043
- Kováč, D.;
- Bereš, M.;
- Kováčová, I.;
- Vince, T.;
- Molnár, J.;
- Dziak, J.;
- Jacko, P.;
- Bučko, R.;
- Tomčíková, I.;
- Schweiner, D.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 411, doi. 10.1049/el.2018.0022
- Rafiei, V.;
- Karamzadeh, S.;
- Saygin, H.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 452, doi. 10.1049/el.2017.4456
- Kang, H. -J.;
- Yang, B. -D.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 426, doi. 10.1049/el.2017.4825
- Fei Hu;
- Dong Zhu;
- Xiaohui Peng;
- Peiwen Tang
- Article
21
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 437, doi. 10.1049/el.2017.4749
- Lei-Lei Guo;
- Kai-Xuan Zhang;
- Hua-Qing Wang
- Article
22
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 449, doi. 10.1049/el.2017.4743
- Mestdagh, D. J. G.;
- Monsalve, J. L. Gulfo;
- Brossier, J. -M.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 420, doi. 10.1049/el.2017.4738
- Villemur, M.;
- Julian, P.;
- Andreou, A. G.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 424, doi. 10.1049/el.2017.4725
- Article
25
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 414, doi. 10.1049/el.2017.4714
- Lee, E. -C.;
- An, T. -J.;
- Park, J. -S.;
- Ahn, G. -C.;
- Lee, S. -H.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 439, doi. 10.1049/el.2017.4028
- Ahn, H. -A.;
- Hong, S. -K.;
- Kwon, O. -K.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 422, doi. 10.1049/el.2017.4583
- Siyu Xu;
- Jihua Zhu;
- Yaochen Li;
- Jun Wang;
- Huimin Lu
- Article
28
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 428, doi. 10.1049/el.2017.4009
- Article
29
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 413, doi. 10.1049/el.2017.3970
- Ahn, J. W.;
- Ku, Y.;
- Kim, D. Y.;
- Sohn, J.;
- Kim, J. -H.;
- Kim, H. C.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 433, doi. 10.1049/el.2017.2922
- XuDong Chen;
- XingLai Ge;
- Fei Diao
- Article
31
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 527, doi. 10.1049/el.2017.4378
- Article
32
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 456, doi. 10.1049/el.2017.3748
- Jian-cheng Zhang;
- Tao Su;
- Ji-bin Zheng;
- Xuehui He
- Article
33
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 450, doi. 10.1049/el.2017.3396
- Choi, K.;
- Jung, J.;
- Park, H.;
- Seo, T.;
- Jeong, J.;
- Kwon, Y.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 523, doi. 10.1049/el.2017.4494
- Article
35
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 511, doi. 10.1049/el.2017.4473
- Li, Tianwu;
- Li, Da;
- Zhou, Liming;
- Li, Erping
- Article
36
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 525, doi. 10.1049/el.2018.0210
- Qin, Zhaotao;
- Wei, Shaoming;
- Wang, Jun
- Article
37
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 407, doi. 10.1049/el.2017.2519
- Rong Su;
- Peng Gao;
- Rongda Wang;
- Peng Wang
- Article
38
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 409, doi. 10.1049/el.2017.2491
- Feng-Gang Yan;
- Shuai Liu;
- Jun Wang;
- Ming Jin;
- Yi Shen
- Article
39
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 535, doi. 10.1049/el.2017.3648
- Rajabi, S.;
- Ghorashi, S.A.;
- Shah‐Mansouri, V.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 533, doi. 10.1049/el.2018.0125
- Wu, Hanguang;
- Xiong, Xiaoming;
- Gao, Huaien
- Article
41
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 531, doi. 10.1049/el.2017.4803
- Liao, Youchun;
- Mei, Niansong;
- Zhang, Zhaofeng
- Article
42
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 529, doi. 10.1049/el.2017.2673
- Khan, Shoaib;
- Ahmad, Mian Ilyas;
- Hussain, Farhan
- Article
43
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 519, doi. 10.1049/el.2018.0402
- Franco, R.A.P.;
- Vieira, F.H.T.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 517, doi. 10.1049/el.2018.0126
- Jiang, Yuan;
- Lin, Xian Qi;
- Wang, Bao;
- Tang, Cong
- Article
45
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 515, doi. 10.1049/el.2017.4349
- Baek, S.J.;
- Kim, J.C.;
- Yook, J.M.
- Article
46
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 513, doi. 10.1049/el.2018.0388
- Xia, Lei;
- Song, Lei;
- Wu, Bian;
- Bo, Xiaodong;
- Chen, Jianzhong
- Article
47
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 521, doi. 10.1049/el.2018.0268
- Keykhah, E.;
- Barakati, S.M.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 509, doi. 10.1049/el.2018.0373
- Luo, Ming;
- Tang, Xiao‐Hong;
- Lu, Di;
- Zhang, Yong‐Hong;
- Yu, Xu‐Min
- Article
49
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 507, doi. 10.1049/el.2017.4335
- Jaffry, S.;
- Hasan, S.F.;
- Gui, X.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 7, p. 506, doi. 10.1049/el.2017.4579
- Arafa, M.;
- Elwekeil, M.;
- Dessoky, M.
- Article