Works matching IS 00135194 AND DT 2018 AND VI 54 AND IP 6
1
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 332, doi. 10.1049/el.2018.0672
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2
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 331, doi. 10.1049/el.2018.0671
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3
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 363, doi. 10.1049/el.2017.4836
- Haidong Qiao;
- Dalu Guo;
- Jinchao Mou;
- Mingxun Li;
- Zhaohui Ma;
- Xin Lv
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4
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 336, doi. 10.1049/el.2017.4081
- Ishihara, K.;
- Murakami, T.;
- Abeysekera, H.;
- Akimoto, M.;
- Takatori, Y.
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5
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 361, doi. 10.1049/el.2017.4821
- Lidan Yao;
- Yongle Wu;
- Mingxing Li;
- Lingxiao Jiao;
- Weimin Wang;
- Jinchun Gao;
- Yuanan Liu
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6
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 374, doi. 10.1049/el.2017.4768
- Auth, D.;
- Drzewietzki, L.;
- Weber, C.;
- Klehr, A.;
- Knigge, A.;
- Breuer, S.
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8
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 330, doi. 10.1049/el.2018.0669
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9
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 340, doi. 10.1049/el.2018.0071
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10
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 391, doi. 10.1049/el.2017.4845
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11
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 364, doi. 10.1049/el.2017.4739
- Maafa, M. R.;
- Pham, S. K.;
- Ravichandran, M.;
- Maywar, D. N.
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12
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 398, doi. 10.1049/el.2017.4653
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13
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 385, doi. 10.1049/el.2017.4204
- Yucheng Yi;
- Xianrong Wan;
- Jianxin Yi;
- Xiaomao Cao
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14
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 381, doi. 10.1049/el.2017.4771
- Yin-Ya Li;
- Guo-Qing Qi;
- An-Dong Sheng
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15
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 338, doi. 10.1049/el.2017.4682
- Elsobky, M.;
- Mahsereci, Y.;
- Yu, Z.;
- Richter, H.;
- Burghartz, J. N.;
- Keck, J.;
- Klauk, H.;
- Zschieschang, U.
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16
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 344, doi. 10.1049/el.2017.3996
- Xue, H.;
- Patel, R.;
- Boppana, N. V. V. K.;
- Ren, S.
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17
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 370, doi. 10.1049/el.2017.4647
- Fiorillo, A. S.;
- Pullano, S. A.;
- Rudenko, S. P.;
- Stetsenko, M. O.;
- Maksimenko, L. S.;
- Krishchenko, I. M.;
- Synyuk, V. S.
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18
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 378, doi. 10.1049/el.2017.3434
- Ghaffarinejad, A.;
- Lu, Y.;
- Hinchet, R.;
- Galayko, D.;
- Hasani, J. Y.;
- Kim, S. W.;
- Basset, P.
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19
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 366, doi. 10.1049/el.2017.4628
- Wenjie Feng;
- Xueke Ma;
- Wenquan Che;
- Yongle Wu
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20
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 368, doi. 10.1049/el.2017.4615
- Shiyong Chen;
- Guoqiang Zhao;
- Mingchun Tang;
- Yantao Yu
- Article
21
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 383, doi. 10.1049/el.2017.4613
- Yang Li;
- Hong Ma;
- Li Cheng;
- De Yu
- Article
22
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 352, doi. 10.1049/el.2017.4592
- Mengke Yuan;
- Xiaopeng Zhang
- Article
23
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 335, doi. 10.1049/el.2017.4539
- Kaikun Niu;
- Zhixiang Huang;
- Bo Wu;
- Xianliang Wu
- Article
24
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 372, doi. 10.1049/el.2017.4534
- Al-mashaal, A. K.;
- Wood, G.;
- Mastropaolo, E.;
- Cheung, R.
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25
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 379, doi. 10.1049/el.2017.4492
- Yong Zhou;
- Yanqi Zheng;
- Ka Nang Leung
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26
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 354, doi. 10.1049/el.2017.4444
- Kim, H.-G.;
- Park, J.-S.;
- Kim, D.-G.;
- Lee, H.-K.
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27
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 393, doi. 10.1049/el.2017.4434
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28
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 342, doi. 10.1049/el.2017.4394
- Lee, J.;
- Choi, S.;
- Cho, Y.;
- Choi, J.
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29
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 395, doi. 10.1049/el.2017.4360
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30
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 376, doi. 10.1049/el.2017.4343
- Tschirhart, D. J.;
- Babazadeh, A.
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31
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 346, doi. 10.1049/el.2017.4341
- Kang, K.-T.;
- Kim, S.-Y.;
- Lee, K.-Y.
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32
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 350, doi. 10.1049/el.2017.3902
- An, J. S.;
- Kim, K. J.;
- Choi, C. M.;
- Shindo, S.;
- Sutou, Y.;
- Song, Y. H.
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33
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 357, doi. 10.1049/el.2017.4159
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34
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 356, doi. 10.1049/el.2017.4117
- Min Zhu;
- Hua Qu;
- Jihong Zhao
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35
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 389, doi. 10.1049/el.2017.4010
- Alibrahim, Fuad;
- Inggs, Michael
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36
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 387, doi. 10.1049/el.2017.3873
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37
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 348, doi. 10.1049/el.2017.3887
- Peigen Zhou;
- Jixin Chen;
- Pinpin Yan;
- Debin Hou;
- Wei Hong
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38
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 397, doi. 10.1049/el.2017.3033
- Xing Cheng;
- Dejun Liu;
- Shuo Feng;
- Qi Pan;
- Huafeng Fang
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39
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 359, doi. 10.1049/el.2017.3010
- Artner, G.;
- Zöchmann, E.;
- Pratschner, S.;
- Lerch, M.;
- Rupp, M.;
- Mecklenbräuker, C. F.
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40
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 398, doi. 10.1049/el.2017.4653
- Article
41
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 397, doi. 10.1049/el.2017.3033
- Cheng, Xing;
- Liu, Dejun;
- Feng, Shuo;
- Pan, Qi;
- Fang, Huafeng
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42
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 395, doi. 10.1049/el.2017.4360
- Article
43
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 393, doi. 10.1049/el.2017.4434
- Article
44
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 381, doi. 10.1049/el.2017.4771
- Li, Yin‐Ya;
- Qi, Guo‐Qing;
- Sheng, An‐Dong
- Article
45
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 379, doi. 10.1049/el.2017.4492
- Zhou, Yong;
- Zheng, Yanqi;
- Leung, Ka Nang
- Article
46
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 387, doi. 10.1049/el.2017.3873
- Article
47
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 374, doi. 10.1049/el.2017.4768
- Auth, D.;
- Drzewietzki, L.;
- Weber, C.;
- Klehr, A.;
- Knigge, A.;
- Breuer, S.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 385, doi. 10.1049/el.2017.4204
- Yi, Yucheng;
- Wan, Xianrong;
- Yi, Jianxin;
- Cao, Xiaomao
- Article
49
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 391, doi. 10.1049/el.2017.4845
- Article
50
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 6, p. 389, doi. 10.1049/el.2017.4010
- Alibrahim, Fuad;
- Inggs, Michael
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