Works matching IS 00135194 AND DT 2018 AND VI 54 AND IP 5
1
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 305, doi. 10.1049/el.2017.4542
- Takahashi, S.;
- Tajiri, T.;
- Watanabe, K.;
- Ota, Y.;
- Iwamoto, S.;
- Arakawa, Y.
- Article
2
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 276, doi. 10.1049/el.2017.4435
- Yongqing Wang;
- Xiao Zhao;
- Qisheng Zhang;
- Xiaolong Lv
- Article
3
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 257, doi. 10.1049/el.2018.0515
- Article
4
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 258, doi. 10.1049/el.2018.0513
- Article
6
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 327, doi. 10.1049/el.2017.4536
- Article
7
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 319, doi. 10.1049/el.2017.4464
- Article
9
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 288, doi. 10.1049/el.2017.4814
- Article
10
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 309, doi. 10.1049/el.2017.4561
- Shin, S.-H.;
- Hong, S.-K.;
- Kwon, O.-K.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 272, doi. 10.1049/el.2017.4550
- Article
12
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 299, doi. 10.1049/el.2017.4429
- Jinchen Wang;
- Songbai He;
- Decheng Gan
- Article
13
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 315, doi. 10.1049/el.2017.4544
- Article
14
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 284, doi. 10.1049/el.2017.4391
- Silva-Pereira, M.;
- Caldinhas Vaz, J.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 268, doi. 10.1049/el.2017.4322
- Article
16
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 307, doi. 10.1049/el.2017.4312
- Article
17
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 311, doi. 10.1049/el.2017.4286
- Pengliang Yuan;
- Chenjiang Guo;
- Qi Zheng;
- Jun Ding
- Article
18
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 295, doi. 10.1049/el.2017.4049
- Xiaobo Zhang;
- Wenbo Xu;
- Yun Tian;
- Jiaru Lin
- Article
19
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 297, doi. 10.1049/el.2017.3398
- Ji-Yong Kim;
- Hee-Young Kim;
- Daihee Park;
- Yongwha Chung
- Article
20
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 262, doi. 10.1049/el.2017.4223
- Zahid, Z.;
- Qu, L.;
- Kim, H. H.;
- Kim, H.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 282, doi. 10.1049/el.2017.4211
- Article
22
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 261, doi. 10.1049/el.2017.3393
- Article
23
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 286, doi. 10.1049/el.2017.4242
- Dajun Sun;
- Lu Liu;
- Youwen Zhang
- Article
24
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 274, doi. 10.1049/el.2017.4225
- Chen Cai;
- Yumei Zhou;
- Jianzhong Zhao
- Article
25
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 264, doi. 10.1049/el.2017.4138
- Jingming Zheng;
- Yang Yang;
- Xiaoxiang He;
- Chenyang Mao;
- Jin Gao;
- Chun Zhou
- Article
26
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 294, doi. 10.1049/el.2017.3155
- Article
27
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 292, doi. 10.1049/el.2017.4052
- Ershadi-Nasab, S.;
- Kasaei, S.;
- Sanaei, E.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 278, doi. 10.1049/el.2017.3339
- Article
29
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 301, doi. 10.1049/el.2017.4029
- Moutaouekkil, M.;
- Talbi, A.;
- El Boudouti, E. H.;
- Elmazria, O.;
- Djafari-Rouhani, B.;
- Pernod, P.;
- Bou Matar, O.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 270, doi. 10.1049/el.2017.4032
- Wang, S.;
- Lopez, C. M.;
- Ballini, M.;
- Van Helleputte, N.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 290, doi. 10.1049/el.2017.3959
- Sunila, M. S.;
- Sankaranarayanan, V.;
- Sundereswaran, K.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 313, doi. 10.1049/el.2017.3934
- Chong Wang;
- Xin Wang;
- Xuefeng Zheng;
- Qing He;
- Ji Wu;
- Ye Tian;
- Wei Mao;
- Xiaohua Ma;
- Yue Hao
- Article
33
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 303, doi. 10.1049/el.2017.3822
- Article
34
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 321, doi. 10.1049/el.2017.3752
- Salam, A. O.;
- Sheriff, R. E.;
- Al-Araji, S. R.;
- Mezher, K.;
- Nasir, Q.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 325, doi. 10.1049/el.2017.3630
- Tao Li;
- Yongzhao Li;
- Mingjun Gao;
- Hailin Zhang
- Article
36
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 280, doi. 10.1049/el.2017.3676
- Wen-mao Luo;
- Ye-rong Zhang
- Article
37
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 266, doi. 10.1049/el.2017.3331
- Article
38
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 317, doi. 10.1049/el.2017.2935
- Arcos, C. D.;
- Vellasco, M.;
- Alcaim, A.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 5, p. 323, doi. 10.1049/el.2017.2515
- Xu Yang;
- Pengpeng Chen;
- Shouwan Gao;
- Qiang Niu
- Article