Works matching IS 00135194 AND DT 2018 AND VI 54 AND IP 4
1
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 192, doi. 10.1049/el.2017.4154
- Sarabia, K. J.;
- Shiroma, W. A.;
- Ohta, A. T.
- Article
2
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 217, doi. 10.1049/el.2017.4213
- Gang Zhang;
- Jiquan Yang;
- Yang Zhao
- Article
3
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 237, doi. 10.1049/el.2017.3906
- Chenyang Wu;
- Zhonghao Wei;
- Hui Bi;
- Bingchen Zhang;
- Yun Lin;
- Wen Hong
- Article
4
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 184, doi. 10.1049/el.2018.0309
- Article
5
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 187, doi. 10.1049/el.2017.4364
- Jie Liu;
- Jianying Li;
- Rui Xu
- Article
6
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 180, doi. 10.1049/el.2017.4348
- Longyue Qu;
- Haiyan Piao;
- Yunhao Qu;
- Hyung-Hoon Kim;
- Hyeongdong Kim
- Article
7
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 185, doi. 10.1049/el.2018.0308
- Article
8
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 225, doi. 10.1049/el.2017.4300
- Mengdan Kong;
- Yongle Wu;
- Zheng Zhuang;
- Yuanan Liu
- Article
9
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 206, doi. 10.1049/el.2017.4277
- Afeng Yang;
- Xue Jiang;
- Day-Uei Li, David
- Article
10
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 190, doi. 10.1049/el.2017.4346
- Article
11
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 196, doi. 10.1049/el.2017.4333
- Mowla, A.;
- Taimre, T.;
- Bertling, K.;
- Wilson, S.;
- Rakič, A. D.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 241, doi. 10.1049/el.2017.4330
- Guoan Wu;
- Jinxin Liang;
- Wenguang Li
- Article
13
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 252, doi. 10.1049/el.2017.3688
- Tamer Mekkawy;
- Rugui Yao;
- Xiaoya Zuo;
- Ling Wang
- Article
14
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 233, doi. 10.1049/el.2017.4267
- Article
15
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 223, doi. 10.1049/el.2017.4233
- Kai Da Xu;
- Fengyu Zhang;
- Yanhui Liu;
- Wei Nie
- Article
16
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 219, doi. 10.1049/el.2017.4160
- Hong-Wei Deng;
- Fei Liu;
- Tao Xu;
- Liang Sun;
- Yi-Fan Xue
- Article
17
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 200, doi. 10.1049/el.2017.4113
- Winterstein, A.;
- Nossek, J. A.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 208, doi. 10.1049/el.2017.4189
- Yuenan Li;
- Dongdong Wang;
- Jingru Wang
- Article
19
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 202, doi. 10.1049/el.2017.4180
- Tomič, J. J.;
- Poljak, P. D.;
- Kušljevič, M. D.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 198, doi. 10.1049/el.2017.4168
- Wong, C. -H.;
- Li, Y.;
- Du, J.;
- Wang, X.;
- Chang, M. -C. F.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 204, doi. 10.1049/el.2017.3577
- Wilson, E. D.;
- Clairon, Q.;
- Taylor, C. J.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 221, doi. 10.1049/el.2017.4144
- Vaezi, A.;
- Gharakhili, F. Geran
- Article
23
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 250, doi. 10.1049/el.2017.2455
- Xuelin Cao;
- Bo Yang;
- Zuxun Song
- Article
24
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 235, doi. 10.1049/el.2017.4085
- Chao Fang;
- Yanyang Liu;
- Zhiyong Suo;
- Zhenfang Li;
- Junli Chen
- Article
25
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 229, doi. 10.1049/el.2017.4056
- Article
26
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 242, doi. 10.1049/el.2017.4014
- Ying Guo;
- Shenghong Li;
- Bo Fan
- Article
27
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 215, doi. 10.1049/el.2017.3965
- Article
28
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 213, doi. 10.1049/el.2017.3928
- Oh, G. -G.;
- Lee, Y. -W.;
- Lee, B.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 239, doi. 10.1049/el.2017.3803
- Das, Rajashree;
- Baishya, Srimanta
- Article
30
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 212, doi. 10.1049/el.2017.3527
- Xing Liu;
- Liang Zhou;
- Qi Zeng
- Article
31
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 248, doi. 10.1049/el.2017.3476
- Marojevic, V.;
- Gomez-Miguelez, I.;
- Gelonch-Bosch, A.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 231, doi. 10.1049/el.2017.3326
- Roggia, L.;
- Costa, P. F. S.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 194, doi. 10.1049/el.2017.1890
- Abdelrahman, S. A.;
- Abdelwahab, M. M.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 210, doi. 10.1049/el.2017.3133
- Article
35
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 227, doi. 10.1049/el.2017.3012
- Zhong Zheng;
- Lu Liu;
- Che Zhao;
- Weiwei Hu
- Article
36
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 246, doi. 10.1049/el.2017.2978
- Baek, H. J.;
- Cho, J.;
- Shin, J. W.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 244, doi. 10.1049/el.2017.2918
- Article