Works matching IS 00135194 AND DT 2018 AND VI 54 AND IP 3
1
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 111, doi. 10.1049/el.2018.0136
- Article
3
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 122, doi. 10.1049/el.2017.4178
- Yi-Xuan Zhang;
- Yong-Chang Jiao;
- Zheng Zhang;
- Bin Li
- Article
4
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 130, doi. 10.1049/el.2017.4120
- Tsai, J.-H.;
- Xiao, H.;
- Cheng, J.-H.;
- Chang, R.-A.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 163, doi. 10.1049/el.2017.3346
- Zhu Yang;
- Zegang Ding;
- Liang Chen;
- Teng Long
- Article
6
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 161, doi. 10.1049/el.2017.3855
- Kumar, A.;
- Panigrahi, R. K.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 114, doi. 10.1049/el.2017.3840
- Chunmei Meng;
- Jin Shi;
- Jian-Xin Chen
- Article
8
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 142, doi. 10.1049/el.2017.3843
- Article
9
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 113, doi. 10.1049/el.2017.4149
- Maddio, S.;
- Pelosi, G.;
- Righini, M.;
- Selleri, S.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 151, doi. 10.1049/el.2017.4108
- Combs, A. W.;
- Shiroma, W. A.;
- Ohta, A. T.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 118, doi. 10.1049/el.2017.4087
- Article
12
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 175, doi. 10.1049/el.2017.4047
- Kim, S.-J.;
- Seo, D.-I.;
- Kim, J.-S.;
- Song, R.;
- Kim, B.-S.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 173, doi. 10.1049/el.2017.4027
- Fernando, S.;
- Sethu, V.;
- Ambikairajah, E.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 157, doi. 10.1049/el.2017.4013
- Noah, M.;
- Umetani, K.;
- Yamamoto, M.;
- Imaoka, J.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 136, doi. 10.1049/el.2017.3982
- Jeong, J.;
- Yoon, T. S.;
- Park, J. B.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 128, doi. 10.1049/el.2017.3969
- Ghaedrahmati, Hanie;
- Jianjun Zhou
- Article
17
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 155, doi. 10.1049/el.2017.3945
- Soenen, W.;
- Lambrecht, J.;
- Yin, X.;
- Spiga, S.;
- Amann, M.-C.;
- Van Steenberge, G.;
- Bakopoulos, P.;
- Bauwelinck, J.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 165, doi. 10.1049/el.2017.3963
- Xingyu Lu;
- Jianchao Yang;
- Chao Ma;
- Hong Gu;
- Weimin Su
- Article
19
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 171, doi. 10.1049/el.2017.3908
- Rebollo-Neira, L.;
- Sanches, I.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 177, doi. 10.1049/el.2017.3875
- Jiakuo Zuo;
- Longxiang Yang
- Article
21
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 132, doi. 10.1049/el.2017.3699
- Guiheng Zhang;
- Wei Zhang;
- Jun Fu;
- Zhuang Li
- Article
22
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 153, doi. 10.1049/el.2017.3668
- Article
23
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 159, doi. 10.1049/el.2017.3299
- Qinghui Fan;
- Deliang Xiang;
- Chongyuan Fan
- Article
24
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 126, doi. 10.1049/el.2017.3827
- Taeyoon Seo;
- Seongwoog Oh;
- Yeowool Huh;
- Jeiwon Cho;
- Youngwoo Kwon
- Article
25
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 231, doi. 10.1049/el.2017.3326
- Article
26
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 179, doi. 10.1049/el.2017.3825
- Bin Hu;
- Zhenyu Shi;
- Yi Wang
- Article
27
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 246, doi. 10.1049/el.2017.2978
- Baek, H.J.;
- Cho, J.;
- Shin, J.W.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 134, doi. 10.1049/el.2017.3538
- Article
29
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 124, doi. 10.1049/el.2017.2092
- Elamien, M. B.;
- Mahmoud, S. A.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 252, doi. 10.1049/el.2017.3688
- Mekkawy, Tamer;
- Yao, Rugui;
- Zuo, Xiaoya;
- Wang, Ling
- Article
31
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 167, doi. 10.1049/el.2017.3198
- Tianxiang Dai;
- Chun Wa Chan;
- Xc Deng;
- Huaping Jiang;
- Gammon, Peter M.;
- Jennings, Mike R.;
- Mawby, Phil A.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 144, doi. 10.1049/el.2017.3158
- Article
33
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 169, doi. 10.1049/el.2017.2993
- Article
34
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 148, doi. 10.1049/el.2017.2750
- Ranjbaran, S.;
- Ebadollahi, S.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 120, doi. 10.1049/el.2017.2456
- Zavvari, M.;
- Ebadzadeh, R.;
- Mohammadifar, M.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 116, doi. 10.1049/el.2017.2350
- Chun-Mei Liu;
- Shaoqiu Xiao;
- Zongtang Zhang;
- Jiaxin Feng
- Article
37
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 150, doi. 10.1049/el.2017.2201
- Henry, D.;
- Aubert, H.;
- Pons, P.;
- Lorenzo, J.;
- Lázaro, A.;
- Girbau, D.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 138, doi. 10.1049/el.2017.2147
- Yuhui Zheng;
- Shunfeng Wang;
- Kaihua Zhang
- Article
39
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 140, doi. 10.1049/el.2017.1913
- Jingjing Sun;
- Xiantao Cheng
- Article
40
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 146, doi. 10.1049/el.2017.2008
- da Rocha Jr., V. C.;
- de Lemos-Neto, J. S.;
- Alcoforado, M. L. M. G.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 250, doi. 10.1049/el.2017.2455
- Cao, Xuelin;
- Yang, Bo;
- Song, Zuxun
- Article
42
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 248, doi. 10.1049/el.2017.3476
- Marojevic, V.;
- Gomez‐Miguelez, I.;
- Gelonch‐Bosch, A.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 239, doi. 10.1049/el.2017.3803
- Das, Rajashree;
- Baishya, Srimanta
- Article
44
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 235, doi. 10.1049/el.2017.4085
- Fang, Chao;
- Liu, Yanyang;
- Suo, Zhiyong;
- Li, Zhenfang;
- Chen, Junli
- Article
45
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 237, doi. 10.1049/el.2017.3906
- Wu, Chenyang;
- Wei, Zhonghao;
- Bi, Hui;
- Zhang, Bingchen;
- Lin, Yun;
- Hong, Wen
- Article
46
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 233, doi. 10.1049/el.2017.4267
- Article
47
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 244, doi. 10.1049/el.2017.2918
- Article
48
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 242, doi. 10.1049/el.2017.4014
- Guo, Ying;
- Li, Shenghong;
- Fan, Bo
- Article
49
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 241, doi. 10.1049/el.2017.4330
- Wu, Guoan;
- Liang, Jinxin;
- Li, Wenguang
- Article
50
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 3, p. 227, doi. 10.1049/el.2017.3012
- Zheng, Zhong;
- Liu, Lu;
- Zhao, Che;
- Hu, Weiwei
- Article