Works matching IS 00135194 AND DT 2018 AND VI 54 AND IP 25
1
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1454, doi. 10.1049/el.2018.6151
- Xie, Y.;
- Lee, J.H.;
- Song, T.L.
- Article
2
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1460, doi. 10.1049/el.2018.5622
- Senapati, Rajiv;
- Pati, Hemanta Kumar
- Article
3
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1458, doi. 10.1049/el.2018.7020
- Gong, J.;
- Lee, H.;
- Park, M.;
- Choi, J.W.;
- Kang, J.
- Article
4
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1456, doi. 10.1049/el.2018.5771
- Zhang, Renmin;
- Zhang, Hua;
- Xu, Wei
- Article
5
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1442, doi. 10.1049/el.2018.6321
- Article
6
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1464, doi. 10.1049/el.2018.6507
- Minango, J.;
- Altamirano, C.D.;
- Almeida, C.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1462, doi. 10.1049/el.2018.6490
- Gao, Yong;
- Huang, Yankui;
- Huo, Tingting
- Article
8
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1440, doi. 10.1049/el.2018.7390
- Kang, H.L.;
- Lee, Y.S.;
- Sim, S.M.;
- Yu, J.H.;
- Shin, K.Y.;
- Lee, S.H.;
- Kim, J.M.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1438, doi. 10.1049/el.2018.6903
- Xiao, Jian‐Kang;
- Zhang, Min;
- Ma, Jian‐Guo
- Article
10
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1450, doi. 10.1049/el.2018.7057
- McNeill, N.;
- Stark, B.H.;
- Finney, S.J.;
- Holliday, D.;
- Dymond, H.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1452, doi. 10.1049/el.2018.6584
- Choi, I.O.;
- Jung, J.H.;
- Kim, K.T.;
- Riggs, L.;
- Kim, S.H.;
- Park, S.H.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1436, doi. 10.1049/el.2018.5104
- Stojanović, N.;
- Krstić, I.;
- Stamenković, N.;
- Perenić, G.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1448, doi. 10.1049/el.2018.6875
- Ozaki, J.;
- Nakano, S.;
- Jyo, T.;
- Nagatani, M.;
- Ogiso, Y.;
- Kanazawa, S.;
- Nosaka, H.;
- Kikuchi, N.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1446, doi. 10.1049/el.2018.6350
- Article
15
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1444, doi. 10.1049/el.2018.7403
- Chen, Jianfei;
- Zhang, Sheng;
- Zhang, Chao;
- Li, Yuehua
- Article
16
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1435, doi. 10.1049/el.2018.6548
- Jabeen, D.;
- Iqrar, T.;
- Faisal Khan, M.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1433, doi. 10.1049/el.2018.6712
- Zhao, Kang;
- Zhu, Xiyang;
- Jiang, Hanjun;
- Zhang, Chun;
- Wang, Zhihua;
- Fu, Bowen
- Article
18
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1429, doi. 10.1049/el.2018.7039
- Shibayama, J.;
- Suzuki, K.;
- Yamauchi, J.;
- Nakano, H.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1412, doi. 10.1049/el.2018.7786
- Article
20
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1431, doi. 10.1049/el.2018.6066
- Article
21
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1412, doi. 10.1049/el.2018.7741
- Article
22
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1427, doi. 10.1049/el.2018.6498
- Article
23
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1425, doi. 10.1049/el.2018.6829
- Article
24
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1423, doi. 10.1049/el.2018.7267
- Article
25
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1421, doi. 10.1049/el.2018.6485
- Mattia, O.E.;
- Guermandi, D.;
- Torfs, G.;
- Wambacq, P.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1419, doi. 10.1049/el.2018.5744
- Nandapurkar, K.B.;
- Anoop, C.S.;
- Dutta, P.K.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1417, doi. 10.1049/el.2018.6121
- Martens, E.;
- Hershberg, B.;
- Craninckx, J.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1415, doi. 10.1049/el.2018.7801
- Article
29
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1413, doi. 10.1049/el.2018.7612
- Article
30
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1429, doi. 10.1049/el.2018.7039
- Shibayama, J.;
- Suzuki, K.;
- Yamauchi, J.;
- Nakano, H.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1423, doi. 10.1049/el.2018.7267
- Article
32
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1458, doi. 10.1049/el.2018.7020
- Gong, J.;
- Kang, J.;
- Lee, H.;
- Park, M.;
- Choi, J. W.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1440, doi. 10.1049/el.2018.7390
- Kang, H. L.;
- Lee, Y. S.;
- Sim, S. M.;
- Kim, J. M.;
- Yu, J. H.;
- Shin, K. Y.;
- Lee, S. H.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1450, doi. 10.1049/el.2018.7057
- McNeill, N.;
- Holliday, D.;
- Stark, B. H.;
- Dymond, H.;
- Finney, S. J.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1415, doi. 10.1049/el.2018.7801
- Article
37
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1444, doi. 10.1049/el.2018.7403
- Jianfei Chen;
- Sheng Zhang;
- Chao Zhang;
- Yuehua Li
- Article
38
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1435, doi. 10.1049/el.2018.6548
- Jabeen, D.;
- Iqrar, T.;
- Khan, M. Faisal
- Article
39
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1448, doi. 10.1049/el.2018.6875
- Ozaki, J.;
- Nakano, S.;
- Ogiso, Y.;
- Kanazawa, S.;
- Kikuchi, N.;
- Jyo, T.;
- Nagatani, M.;
- Nosaka, H.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1425, doi. 10.1049/el.2018.6829
- Article
41
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1433, doi. 10.1049/el.2018.6712
- Kang Zhao;
- Xiyang Zhu;
- Hanjun Jiang;
- Chun Zhang;
- Zhihua Wang;
- Bowen Fu
- Article
42
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1452, doi. 10.1049/el.2018.6584
- Choi, I. O.;
- Kim, K. T.;
- Jung, J. H.;
- Riggs, L.;
- Kim, S. H.;
- Park, S. H.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1438, doi. 10.1049/el.2018.6903
- Jian-Kang Xiao;
- Min Zhang;
- Jian-Guo Ma
- Article
44
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1464, doi. 10.1049/el.2018.6507
- Minango, J.;
- de Almeida, C.;
- Altamirano, C. D.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1427, doi. 10.1049/el.2018.6498
- Article
46
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1462, doi. 10.1049/el.2018.6490
- Yong Gao;
- Yankui Huang;
- Tingting Huo
- Article
47
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1421, doi. 10.1049/el.2018.6485
- Guermandi, D.;
- Mattia, O. E.;
- Wambacq, P.;
- Torfs, G.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1446, doi. 10.1049/el.2018.6350
- Article
49
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1442, doi. 10.1049/el.2018.6321
- Article
50
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 25, p. 1454, doi. 10.1049/el.2018.6151
- Xie, Y.;
- Song, T. L.;
- Lee, J. H.
- Article