Works matching IS 00135194 AND DT 2018 AND VI 54 AND IP 23
1
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1307, doi. 10.1049/el.2018.7477
- Article
3
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1324, doi. 10.1049/el.2018.6727
- Keqi Wang;
- Haifeng Hu;
- Tundong Liu
- Article
4
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1326, doi. 10.1049/el.2018.6932
- Kim, T. H.;
- Yu, C.;
- Lee, S. W.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1351, doi. 10.1049/el.2018.6897
- Razzak, T.;
- Hwang, S.;
- Coleman, A.;
- Bajaj, S.;
- Xue, H.;
- Zhang, Y.;
- Jamal-Eddine, Z.;
- Sohel, S. H.;
- Lu, W.;
- Khan, A.;
- Rajan, S.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1346, doi. 10.1049/el.2018.6844
- Dandan Meng;
- Xianpeng Wang;
- Mengxing Huang;
- Chong Shen
- Article
8
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1328, doi. 10.1049/el.2018.6478
- Yifang Xu;
- Tianli Liao;
- Jing Chen
- Article
9
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1332, doi. 10.1049/el.2018.6426
- Dhivya, R.;
- Padmapriya, V.;
- Sundararaman, R.;
- Rayappan, J. B. B.;
- Amirtharajan, R.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1334, doi. 10.1049/el.2018.6079
- Ya Zhong;
- Yuanbo Guo;
- Chunhui Liu
- Article
11
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1317, doi. 10.1049/el.2018.6880
- Garde, M. P.;
- Lopez-Martin, A. J.;
- Carvajal, R. G.;
- Galan, J. A.;
- Ramirez-Angulo, J.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1311, doi. 10.1049/el.2018.6644
- Nawaz, H.;
- Gürbüz, Ö.;
- Tekin, I.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1338, doi. 10.1049/el.2018.5667
- von Vangerow, C.;
- Göttel, B.;
- Müller, D.;
- Zwick, T.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1336, doi. 10.1049/el.2018.6631
- Yichao Guo;
- Hao Huan;
- Ran Tao;
- Yue Wang
- Article
15
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1319, doi. 10.1049/el.2018.6630
- Article
16
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1344, doi. 10.1049/el.2018.6532
- Hong Jiang;
- Wen-Gen Tang;
- Shuai-Xuan Pang
- Article
17
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1342, doi. 10.1049/el.2018.6510
- Khoshnami, A.;
- Sadeghkhani, I.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1313, doi. 10.1049/el.2018.6011
- Chen, Y.-H.;
- Chen, S.-W.;
- Juan, Y.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1309, doi. 10.1049/el.2018.5810
- Weiyang Yin;
- Hou Zhang;
- Tao Zhong;
- Qiang Chen
- Article
20
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1322, doi. 10.1049/el.2018.5718
- Mengying Jin;
- Yunjie Chen;
- Fanlong Zhang
- Article
21
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1315, doi. 10.1049/el.2018.6074
- John, B.;
- Spink, C.;
- Braunschweig, M.;
- Ranjan, R.;
- Schroeder, D.;
- Koops, A.;
- Woldt, G.;
- Adam, G.;
- Krautschneider, W. H.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1321, doi. 10.1049/el.2018.5051
- Kim, B.-S.;
- Sun, J.-Y.;
- Kim, S.-W.;
- Kang, M.-C.;
- Ko, S.-J.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1330, doi. 10.1049/el.2018.5905
- Yiliu Feng;
- Zhengfa Liang;
- Hengzhu Liu
- Article
24
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1353, doi. 10.1049/el.2018.5238
- Article
25
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1340, doi. 10.1049/el.2018.5034
- Zhibin Ren;
- Yahui Sun;
- Jiasheng Hu;
- Shuqing Zhang;
- Zihao Lin;
- Xiyang Zhi
- Article
26
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1350, doi. 10.1049/el.2018.5136
- Article
27
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 23, p. 1348, doi. 10.1049/el.2018.5075
- Abdelmoneam, A.;
- Iñiguez, B.
- Article