Works matching IS 00135194 AND DT 2018 AND VI 54 AND IP 22
1
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1340, doi. 10.1049/el.2018.5034
- Ren, Zhibin;
- Sun, Yahui;
- Hu, Jiasheng;
- Zhang, Shuqing;
- Lin, Zihao;
- Zhi, Xiyang
- Article
2
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1407, doi. 10.1049/el.2018.5684
- Quan, Xin;
- Pan, Wensheng;
- Liu, Ying;
- Tang, Youxi
- Article
3
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1405, doi. 10.1049/el.2018.6404
- Wu, Qingyang;
- Feres, Carlos;
- Kuzmenko, Daniel;
- Zhi, Ding;
- Yu, Zhou;
- Liu, Xin;
- 'Leo' Liu, Xiaoguang
- Article
4
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1358, doi. 10.1049/el.2018.7588
- Article
5
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1361, doi. 10.1049/el.2018.6390
- Article
6
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1401, doi. 10.1049/el.2018.6675
- Lara, Pedro;
- Olinto, Karen da S.;
- Petraglia, Felipe R.;
- Haddad, Diego B.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1403, doi. 10.1049/el.2018.6461
- Article
8
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1399, doi. 10.1049/el.2018.6352
- Lee, J.H.;
- Ha, J.;
- Piyapatarakul, T.;
- Yoon, C.;
- Jeon, B.;
- Yoon, G.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1397, doi. 10.1049/el.2018.6273
- Sun, Yukun;
- Yang, Fan;
- Yuan, Ye;
- Yu, Fengyuan;
- Xiang, Qianwen;
- Zhu, Zhiying
- Article
11
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1395, doi. 10.1049/el.2018.7118
- Yoshikawa, H.;
- Kwoen, J.;
- Doe, T.;
- Izumi, M.;
- Iwamoto, S.;
- Arakawa, Y.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1393, doi. 10.1049/el.2018.6529
- Theodosiou, A.;
- Fokine, M.;
- Hawkins, T.;
- Ballato, J.;
- Gibson, U.J.;
- Kalli, K.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1391, doi. 10.1049/el.2018.5604
- Testa, F.;
- Giorgi, L.;
- Bigongiari, A.;
- Bianchi, A.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1390, doi. 10.1049/el.2018.6216
- Hamaoka, F.;
- Nakamura, M.;
- Nagatani, M.;
- Wakita, H.;
- Yamazaki, H.;
- Kobayashi, T.;
- Nosaka, H.;
- Miyamoto, Y.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1388, doi. 10.1049/el.2018.6154
- Chu, Peng;
- Zheng, Kai‐Lai;
- Xu, Feng;
- Wu, Ke
- Article
16
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1386, doi. 10.1049/el.2018.6430
- Van Eeckhaute, M.;
- Gottlob, E.;
- De Doncker, P.;
- Horlin, F.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1384, doi. 10.1049/el.2018.6054
- Liu, Lidong;
- Li, Yi;
- Zhang, Zhaolun;
- Song, Huansheng;
- Jin, Zhao
- Article
18
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1381, doi. 10.1049/el.2018.5111
- Gong, J.;
- Lee, H.;
- Kang, J.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1379, doi. 10.1049/el.2018.6280
- Liu, Feng;
- Marcellin, Michael W.;
- Goodman, Nathan A.;
- Bilgin, Ali
- Article
20
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1377, doi. 10.1049/el.2018.6506
- Binol, H.;
- Guvenc, I.;
- Bulut, E.;
- Akkaya, K.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1375, doi. 10.1049/el.2018.6149
- Wang, Benzhang;
- Feng, Yiliu;
- Liu, Hengzhu
- Article
22
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1373, doi. 10.1049/el.2018.6851
- Ma, Pengfei;
- Ma, Jie;
- Wang, Xujiao;
- Yang, Lichuang;
- Wang, Nannan
- Article
23
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1372, doi. 10.1049/el.2018.6923
- Article
24
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1370, doi. 10.1049/el.2018.6340
- Hwang, Young‐Ha;
- Jeong, Deog‐Kyoon
- Article
25
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1368, doi. 10.1049/el.2018.5389
- Li, C.‐L.;
- Kim, Y.‐W.;
- Lee, Y.S.;
- Han, T.H.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1366, doi. 10.1049/el.2018.6779
- Payandehnia, P.;
- Maghami, H.;
- Mirzaie, H.;
- Temes, G.C.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1362, doi. 10.1049/el.2018.6790
- Liang, Zhipeng;
- Ouyang, Jun;
- Yang, Feng
- Article
28
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1364, doi. 10.1049/el.2018.5753
- Miklavčič, P.;
- Vidmar, M.;
- Batagelj, B.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1353, doi. 10.1049/el.2018.5238
- Article
30
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1351, doi. 10.1049/el.2018.6897
- Razzak, T.;
- Hwang, S.;
- Coleman, A.;
- Bajaj, S.;
- Xue, H.;
- Zhang, Y.;
- Jamal‐Eddine, Z.;
- Sohel, S.H.;
- Lu, W.;
- Khan, A.;
- Rajan, S.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1359, doi. 10.1049/el.2018.7587
- Article
32
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1358, doi. 10.1049/el.2018.7606
- Article
33
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1336, doi. 10.1049/el.2018.6631
- Guo, Yichao;
- Huan, Hao;
- Tao, Ran;
- Wang, Yue
- Article
34
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1298, doi. 10.1049/el.2018.5734
- Uprety, S.;
- Hanggi, D.;
- Yapabandara, K.;
- Mirkhani, V.;
- Khanal, M.P.;
- Schoenek, B.;
- Dhar, S.;
- Park, M.;
- Hamilton, M.;
- Wang, S.;
- Hames, W.E.;
- Sk, M.H.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1350, doi. 10.1049/el.2018.5136
- Article
36
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1342, doi. 10.1049/el.2018.6510
- Khoshnami, A.;
- Sadeghkhani, I.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1338, doi. 10.1049/el.2018.5667
- Vangerow, C.;
- Göttel, B.;
- Müller, D.;
- Zwick, T.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1348, doi. 10.1049/el.2018.5075
- Abdelmoneam, A.;
- Iñiguez, B.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1346, doi. 10.1049/el.2018.6844
- Meng, Dandan;
- Wang, Xianpeng;
- Huang, Mengxing;
- Shen, Chong
- Article
40
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1344, doi. 10.1049/el.2018.6532
- Jiang, Hong;
- Tang, Wen‐Gen;
- Pang, Shuai‐Xuan
- Article
41
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1334, doi. 10.1049/el.2018.6079
- Zhong, Ya;
- Guo, Yuanbo;
- Liu, Chunhui
- Article
42
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1332, doi. 10.1049/el.2018.6426
- Dhivya, R.;
- Padmapriya, V.;
- Sundararaman, R.;
- Rayappan, J.B.B.;
- Amirtharajan, R.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1328, doi. 10.1049/el.2018.6478
- Xu, Yifang;
- Liao, Tianli;
- Chen, Jing
- Article
44
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1326, doi. 10.1049/el.2018.6932
- Kim, T.H.;
- Yu, C.;
- Lee, S.W.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1324, doi. 10.1049/el.2018.6727
- Wang, Keqi;
- Hu, Haifeng;
- Liu, Tundong
- Article
46
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1296, doi. 10.1049/el.2018.6456
- Li, Siming;
- Lv, Jing;
- Tian, Shiwei
- Article
47
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1330, doi. 10.1049/el.2018.5905
- Feng, Yiliu;
- Liang, Zhengfa;
- Liu, Hengzhu
- Article
48
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1321, doi. 10.1049/el.2018.5051
- Kim, B.‐S.;
- Sun, J.‐Y.;
- Kim, S.‐W.;
- Kang, M.‐C.;
- Ko, S.‐J.
- Article
49
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1322, doi. 10.1049/el.2018.5718
- Jin, Mengying;
- Chen, Yunjie;
- Zhang, Fanlong
- Article
50
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 22, p. 1306, doi. 10.1049/el.2018.7480
- Article