Works matching IS 00135194 AND DT 2018 AND VI 54 AND IP 21
1
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1206, doi. 10.1049/el.2018.6268
- Yangyang Lu;
- Jing Zhu;
- Kongsheng Hu;
- Siyuan Yu;
- Weifeng Sun;
- Yunwu Zhang;
- Long Zhang
- Article
2
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1214, doi. 10.1049/el.2018.6051
- Fernandes, R.;
- Sanchez, G.;
- Cataldo, R.;
- Webber, T.;
- Marcon, C.
- Article
3
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1202, doi. 10.1049/el.2018.5510
- Xusheng Wang;
- Ming Zhang;
- Francis Rodes;
- Congjun Cao
- Article
4
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1222, doi. 10.1049/el.2018.6028
- Shivan, T.;
- Hossain, M.;
- Stoppel, D.;
- Weimann, N.;
- Boppel, S.;
- Doerner, R.;
- Heinrich, W.;
- Krozer, V.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1224, doi. 10.1049/el.2018.5436
- Article
6
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1197, doi. 10.1049/el.2018.7123
- Article
7
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1196, doi. 10.1049/el.2018.7106
- Article
9
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1243, doi. 10.1049/el.2018.6512
- Xiaoyong Yan;
- Lijuan Sun;
- Jian Zhou;
- Aiguo Song
- Article
10
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1220, doi. 10.1049/el.2018.6469
- Article
11
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1208, doi. 10.1049/el.2018.6437
- Xiaolin Yang;
- Menglian Zhao;
- Xiaobo Wu
- Article
12
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1231, doi. 10.1049/el.2018.5408
- Mustafa, Y.;
- Zhaikhan, A.;
- Ruderman, A.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1218, doi. 10.1049/el.2018.6159
- Article
14
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1233, doi. 10.1049/el.2018.6081
- Pieraccini, M.;
- Miccinesi, L.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1229, doi. 10.1049/el.2018.6062
- Li, L. H.;
- Garrasi, K.;
- Kundu, I.;
- Han, Y. J.;
- Salih, M.;
- Vitiello, M. S.;
- Davies, A. G.;
- Linfield, E. H.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1210, doi. 10.1049/el.2018.5484
- Article
17
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1245, doi. 10.1049/el.2018.5823
- Article
18
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1241, doi. 10.1049/el.2018.5830
- Bin Hu;
- Xiaochuan Wu;
- Xin Zhang;
- Qiang Yang;
- Weibo Deng
- Article
19
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1235, doi. 10.1049/el.2018.5640
- Article
20
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1201, doi. 10.1049/el.2018.5520
- Shen Zheng;
- Chao Li;
- Xiaojuan Zhang;
- Guangyou Fang
- Article
21
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1228, doi. 10.1049/el.2018.5559
- Yeh, C. H.;
- Chow, C. W.;
- Gu, C. S.;
- Guo, B. S.;
- Cheng, Y. J.;
- Chen, J. H.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1204, doi. 10.1049/el.2018.5393
- Article
23
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1237, doi. 10.1049/el.2018.5225
- Hui Wang;
- Jianxin Yi;
- Xianrong Wan
- Article
24
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1199, doi. 10.1049/el.2018.5244
- Cui, Y. H.;
- Zhang, P. P.;
- Li, R. L.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1226, doi. 10.1049/el.2018.5091
- Tian Zhang;
- Zhiqing Yang;
- Jianing Sun;
- Shuang Qiao
- Article
26
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1239, doi. 10.1049/el.2018.5069
- Article
27
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1243, doi. 10.1049/el.2018.6512
- Yan, Xiaoyong;
- Sun, Lijuan;
- Zhou, Jian;
- Song, Aiguo
- Article
28
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1216, doi. 10.1049/el.2018.5211
- Haifeng Li;
- Guoqi Liu;
- Jian Zou
- Article
29
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1212, doi. 10.1049/el.2018.5189
- Kang, I. H.;
- Hong, M. T.;
- Bae, B. S.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1241, doi. 10.1049/el.2018.5830
- Hu, Bin;
- Wu, Xiaochuan;
- Zhang, Xin;
- Yang, Qiang;
- Deng, Weibo
- Article
31
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1239, doi. 10.1049/el.2018.5069
- Article
32
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1245, doi. 10.1049/el.2018.5823
- Article
33
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1226, doi. 10.1049/el.2018.5091
- Zhang, Tian;
- Yang, Zhiqing;
- Sun, Jianing;
- Qiao, Shuang
- Article
34
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1237, doi. 10.1049/el.2018.5225
- Wang, Hui;
- Yi, Jianxin;
- Wan, Xianrong
- Article
35
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1233, doi. 10.1049/el.2018.6081
- Pieraccini, M.;
- Miccinesi, L.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1231, doi. 10.1049/el.2018.5408
- Mustafa, Y.;
- Zhaikhan, A.;
- Ruderman, A.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1229, doi. 10.1049/el.2018.6062
- Li, L.H.;
- Garrasi, K.;
- Kundu, I.;
- Han, Y.J.;
- Salih, M.;
- Vitiello, M.S.;
- Davies, A.G.;
- Linfield, E.H.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1228, doi. 10.1049/el.2018.5559
- Yeh, C.H.;
- Chow, C.W.;
- Gu, C.S.;
- Guo, B.S.;
- Cheng, Y.J.;
- Chen, J.H.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1235, doi. 10.1049/el.2018.5640
- Article
40
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1224, doi. 10.1049/el.2018.5436
- Article
41
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1222, doi. 10.1049/el.2018.6028
- Shivan, T.;
- Hossain, M.;
- Stoppel, D.;
- Weimann, N.;
- Boppel, S.;
- Doerner, R.;
- Heinrich, W.;
- Krozer, V.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1220, doi. 10.1049/el.2018.6469
- Article
43
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1206, doi. 10.1049/el.2018.6268
- Lu, Yangyang;
- Zhu, Jing;
- Hu, Kongsheng;
- Yu, Siyuan;
- Sun, Weifeng;
- Zhang, Yunwu;
- Zhang, Long
- Article
44
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1176, doi. 10.1049/el.2018.5352
- Hu, Mengshi;
- Chang, Yongyu;
- Xiong, Yi;
- Zeng, Tianyi
- Article
45
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1201, doi. 10.1049/el.2018.5520
- Zheng, Shen;
- Li, Chao;
- Zhang, Xiaojuan;
- Fang, Guangyou
- Article
46
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1218, doi. 10.1049/el.2018.6159
- Zhao, Jianwei;
- Jia, Weimin
- Article
47
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1210, doi. 10.1049/el.2018.5484
- Article
48
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1208, doi. 10.1049/el.2018.6437
- Yang, Xiaolin;
- Zhao, Menglian;
- Wu, Xiaobo
- Article
49
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1216, doi. 10.1049/el.2018.5211
- Li, Haifeng;
- Liu, Guoqi;
- Zou, Jian
- Article
50
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 21, p. 1214, doi. 10.1049/el.2018.6051
- Fernandes, R.;
- Sanchez, G.;
- Cataldo, R.;
- Webber, T.;
- Marcon, C.
- Article