Works matching IS 00135194 AND DT 2018 AND VI 54 AND IP 20
1
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1187, doi. 10.1049/el.2018.6266
- Yisheng Yuan;
- Xianglong Mei
- Article
2
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1191, doi. 10.1049/el.2018.5090
- Article
3
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1189, doi. 10.1049/el.2018.5811
- Xiaohong Lin;
- Xianmao Li;
- Xin Man;
- Wei Tian
- Article
4
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1186, doi. 10.1049/el.2018.6170
- Lengyel, T.;
- Simpanen, E.;
- Gustavsson, J. S.;
- Larsson, A.;
- Karlsson, M.;
- Andrekson, P. A.;
- Sorin, W. V.;
- Mathai, S.;
- Tan, M. R.;
- Bickham, S.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1184, doi. 10.1049/el.2018.6383
- Tsai, J.-H.;
- Lin, F.-M.;
- Xiao, H.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1182, doi. 10.1049/el.2018.5648
- Xin Wei;
- Lei Liu;
- Ling-Zhi Luo;
- Zheng Bin Wang
- Article
7
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1180, doi. 10.1049/el.2018.5856
- Mingxun Li;
- Xin Lv;
- Jinchao Mou;
- Dalu Guo;
- Haidong Qiao;
- Zhaohui Ma;
- Haidong Hao
- Article
8
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1178, doi. 10.1049/el.2018.5696
- Xinrong Guan;
- Hui Shi;
- Ning Ding;
- Weiwei Yang;
- Yueming Cai
- Article
9
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1176, doi. 10.1049/el.2018.5352
- Mengshi Hu;
- Yongyu Chang;
- Yi Xiong;
- Tianyi Zeng
- Article
10
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1174, doi. 10.1049/el.2018.5649
- Awasthi, S. K.;
- Singh, Y. N.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1172, doi. 10.1049/el.2018.5437
- Ziming Hong;
- Qingsong Ai;
- Kun Chen
- Article
12
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1170, doi. 10.1049/el.2018.5027
- Haofeng Zhang;
- Yang Long;
- Chunxia Zhao
- Article
13
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1168, doi. 10.1049/el.2018.5619
- Tai-Ran Xia;
- Chang-Ping Du
- Article
14
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1166, doi. 10.1049/el.2018.5018
- Shufeng Wang;
- Junxin Zhang;
- Junyou Zhang
- Article
15
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1164, doi. 10.1049/el.2018.5575
- Sotner, R.;
- Polak, L.;
- Jerabek, J.;
- Petrzela, J.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1162, doi. 10.1049/el.2018.5863
- Kim, Y.;
- Park, S.-J.;
- Nam, H.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1160, doi. 10.1049/el.2018.5126
- Sabarathinam, S.;
- Thamilmaran, K.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1158, doi. 10.1049/el.2018.6068
- Le, S.;
- Srinivasan, S. K.;
- Smith, S. C.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1156, doi. 10.1049/el.2018.6145
- Yu, C.;
- Lee, D.;
- Park, H.;
- Jin, S.;
- Ahn, G.-C.;
- Burm, J.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1154, doi. 10.1049/el.2018.5524
- Ziyang Luo;
- Yan Lu;
- Martins, Rui P.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1152, doi. 10.1049/el.2018.5701
- Ameen, M.;
- Chaudhary, R. K.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1150, doi. 10.1049/el.2018.5772
- Kaim, Vikrant;
- Kanaujia, Binod K.;
- Rambabu, Karumudi
- Article
23
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1149, doi. 10.1049/el.2018.5009
- Chakrabarti, S.;
- Chakraborty, A.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1147, doi. 10.1049/el.2018.6893
- Article