Works matching IS 00135194 AND DT 2018 AND VI 54 AND IP 2
1
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 496, doi. 10.1049/el.2017.3860
- Sen, T.;
- Anoop, C. S.;
- Sen, S.
- Article
2
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 103, doi. 10.1049/el.2017.2732
- Article
3
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 105, doi. 10.1049/el.2017.3698
- Lingxiao Jiao;
- Yongle Wu;
- Zheng Zhuang;
- Mingxing Li;
- Yuanan Liu
- Article
4
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 101, doi. 10.1049/el.2017.2036
- Viani, F.;
- Migliore, M. D.;
- Polo, A.;
- Salucci, M.;
- Massa, A.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 99, doi. 10.1049/el.2017.3868
- Article
6
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 76, doi. 10.1049/el.2017.2476
- Lee, J.;
- Seo, W.;
- Kim, D.-W.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 97, doi. 10.1049/el.2017.3837
- Xia Shen;
- Tiesheng Yan;
- Qi Li;
- Yingmin Wang;
- Weirong Chen
- Article
8
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 95, doi. 10.1049/el.2017.3535
- Wang, W.-L.;
- Lin, H.;
- Yu, C.-L.;
- Henrickson, L. E.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 89, doi. 10.1049/el.2017.3576
- Abraham, C.;
- Subburaj, V.;
- Jena, D.;
- Perumal, P.;
- Jose, B. R.;
- Mathew, J.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 77, doi. 10.1049/el.2017.1840
- Na Wang;
- Junsong Fu;
- Jiwen Zeng
- Article
11
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 91, doi. 10.1049/el.2017.3816
- Article
12
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 93, doi. 10.1049/el.2017.3958
- Yunzhong Dai;
- Shengxian Zhuang;
- Wenzhu Li;
- Luhang Jiang
- Article
13
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 87, doi. 10.1049/el.2017.4021
- Article
14
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 85, doi. 10.1049/el.2017.3478
- Hao Zhang;
- Wei Kang;
- Wen Wu
- Article
15
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 83, doi. 10.1049/el.2017.3372
- Lin, Y.-A.;
- Chang, H.-Y.;
- Wang, Y.-C.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 54, doi. 10.1049/el.2017.4679
- Article
17
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 74, doi. 10.1049/el.2017.4058
- Article
18
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 79, doi. 10.1049/el.2017.3683
- Yichao Guo;
- Hao Huan;
- Ran Tao
- Article
19
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 72, doi. 10.1049/el.2017.3853
- Balachandran, Arya;
- Yong Chen;
- Pilsoon Choi;
- Chirn Chye Boon
- Article
20
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 70, doi. 10.1049/el.2017.3830
- Article
21
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 68, doi. 10.1049/el.2017.3850
- Yong Luo;
- Jiayou Xu;
- Guangli Yang;
- Hiroshi Toshiyoshi
- Article
22
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 54, doi. 10.1049/el.2017.4679
- Article
24
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 66, doi. 10.1049/el.2017.3711
- Jinqiang Zhao;
- Niansong Mei;
- Zhaofeng Zhang;
- Lingqin Meng
- Article
25
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 64, doi. 10.1049/el.2017.3912
- Article
26
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 62, doi. 10.1049/el.2017.3387
- Hwang, C.-S.;
- Chu, T.-L.;
- Chen, Y.-G.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 61, doi. 10.1049/el.2017.3694
- Sultana, J.;
- Islam, Md. S.;
- Islam, M. R.;
- Abbott, D.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 59, doi. 10.1049/el.2017.3989
- Peruzzi, M.;
- Masson, F.;
- Mandolesi, P.;
- Perotoni, M.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 56, doi. 10.1049/el.2017.4676
- Article
30
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 55, doi. 10.1049/el.2017.4677
- Article
31
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 54, doi. 10.1049/el.2017.4679
- Article
32
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 54, doi. 10.1049/el.2017.4679
- Article
33
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 54, doi. 10.1049/el.2017.4679
- Article
34
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 8, doi. 10.1049/el.2017.3098
- Buttazzoni, G.;
- Vescovo, R.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 97, doi. 10.1049/el.2017.3837
- Shen, Xia;
- Yan, Tiesheng;
- Li, Qi;
- Wang, Yingmin;
- Chen, Weirong
- Article
36
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 95, doi. 10.1049/el.2017.3535
- Wang, W.‐L.;
- Lin, H.;
- Yu, C.‐L.;
- Henrickson, L.E.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 105, doi. 10.1049/el.2017.3698
- Jiao, Lingxiao;
- Wu, Yongle;
- Zhuang, Zheng;
- Li, Mingxing;
- Liu, Yuanan
- Article
38
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 83, doi. 10.1049/el.2017.3372
- Lin, Y.‐A.;
- Chang, H.‐Y.;
- Wang, Y.‐C.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 103, doi. 10.1049/el.2017.2732
- Article
40
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 101, doi. 10.1049/el.2017.2036
- Viani, F.;
- Migliore, M.D.;
- Polo, A.;
- Salucci, M.;
- Massa, A.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 99, doi. 10.1049/el.2017.3868
- Article
42
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 89, doi. 10.1049/el.2017.3576
- Abraham, C.;
- Subburaj, V.;
- Jena, D.;
- Perumal, P.;
- Jose, B. R.;
- Mathew, J.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 87, doi. 10.1049/el.2017.4021
- Article
44
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 93, doi. 10.1049/el.2017.3958
- Dai, Yunzhong;
- Zhuang, Shengxian;
- Li, Wenzhu;
- Jiang, Luhang
- Article
45
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 91, doi. 10.1049/el.2017.3816
- Article
46
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 85, doi. 10.1049/el.2017.3478
- Zhang, Hao;
- Kang, Wei;
- Wu, Wen
- Article
47
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 81, doi. 10.1049/el.2017.3860
- Sen, T.;
- Anoop, C.S.;
- Sen, S.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 79, doi. 10.1049/el.2017.3683
- Guo, Yichao;
- Huan, Hao;
- Tao, Ran;
- Wang, Yue
- Article
49
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 77, doi. 10.1049/el.2017.1840
- Wang, Na;
- Fu, Junsong;
- Zeng, Jiwen
- Article
50
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 2, p. 76, doi. 10.1049/el.2017.2476
- Lee, J.;
- Seo, W.;
- Kim, D.‐W.
- Article