Works matching IS 00135194 AND DT 2018 AND VI 54 AND IP 18
1
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1066, doi. 10.1049/el.2018.1106
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2
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1094, doi. 10.1049/el.2018.5160
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3
- 2018
- Letter to the Editor
4
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1084, doi. 10.1049/el.2018.5215
- Ranzini, S. M.;
- Rossi, S. M.;
- Figueiredo, R. C.;
- Franz, L. V.;
- Chiuchiarelli, A.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1091, doi. 10.1049/el.2018.5518
- Ghavamirad, R.;
- Sebt, M. A.;
- Babashah, H.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1078, doi. 10.1049/el.2018.5062
- Mitchell, D. S.;
- Ruyle, J. E.;
- Sigmarsson, H. H.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1068, doi. 10.1049/el.2018.5479
- Almehmadi, F. S.;
- Badarneh, O. S.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1090, doi. 10.1049/el.2018.5035
- Mosalanejad, M.;
- Brebels, S.;
- Soens, C.;
- Vandenbosch, G. A. E.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1088, doi. 10.1049/el.2018.5261
- Mengying Xia;
- Weimin Su;
- Hong Gu;
- Zheng Dai;
- Wenjuan Li;
- Jianchao Yang
- Article
10
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1086, doi. 10.1049/el.2018.1034
- Article
11
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1082, doi. 10.1049/el.2018.5450
- Xianglian Feng;
- Zhihang Wu;
- Tianshu Wang;
- Huilin Jiang;
- Yuwei Su;
- Hexin Jiang;
- Shiming Gao
- Article
12
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1080, doi. 10.1049/el.2018.5879
- Article
13
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1076, doi. 10.1049/el.2018.5530
- Article
14
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1074, doi. 10.1049/el.2018.5067
- Article
15
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1072, doi. 10.1049/el.2018.5611
- Yujie Wang;
- Chunxia Zhou;
- Kang Zhou;
- Wen Wu
- Article
16
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1070, doi. 10.1049/el.2018.5008
- Arif, A.;
- Baloch, N.;
- Kwon, B. I.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1064, doi. 10.1049/el.2018.0999
- Qihong He;
- Ziping Gong;
- Hengyu Ke
- Article
18
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1108, doi. 10.1049/el.2018.5679
- Li, Ping;
- Cheng, Junji;
- Chen, Xing bi
- Article
19
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1062, doi. 10.1049/el.2018.5346
- Article
20
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1061, doi. 10.1049/el.2018.5629
- Mostafa, M. M.;
- Abuelfadl, T. M.;
- Safwat, A. M. E.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1059, doi. 10.1049/el.2018.5006
- Qing Gong;
- Rong Lin Li;
- Yuehui Cui
- Article
22
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1132, doi. 10.1049/el.2018.5758
- Zhou, Kang;
- Zhou, Chunxia;
- Wu, Wen
- Article
23
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1130, doi. 10.1049/el.2018.6070
- Gai, Chao;
- Jiao, Yong‐Chang;
- Zhao, Yu‐Long
- Article
24
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1141, doi. 10.1049/el.2018.5468
- Beaulieu, Norman;
- Deng, Sisi;
- Gao, Yuanxiang
- Article
26
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1057, doi. 10.1049/el.2018.6620
- Article
27
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1134, doi. 10.1049/el.2018.5871
- Maity, S.;
- Ghosal, R.;
- Gangopadhyaya, M.;
- Gupta, B.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1139, doi. 10.1049/el.2018.5561
- Wang, Jun;
- Qin, Zhaotao;
- Wei, Shaoming;
- Sun, Zhongsheng;
- Xiang, Hong
- Article
29
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1137, doi. 10.1049/el.2018.6141
- Iqbal, M.T.;
- Maswood, A.I.;
- Khan, M.S.U.;
- Tariq, M.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1116, doi. 10.1049/el.2018.5485
- Fu, Ning;
- Huang, Guoxing;
- Sun, Liwen;
- Qiao, Liyan
- Article
31
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1135, doi. 10.1049/el.2018.6225
- Kantola, E.;
- Penttinen, J.‐P.;
- Ranta, S.;
- Guina, M.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1114, doi. 10.1049/el.2018.5411
- Article
33
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1122, doi. 10.1049/el.2018.5078
- Seo, H.;
- Kim, B.;
- Chun, J.‐H.;
- Kim, S.‐J.;
- Choi, J.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1120, doi. 10.1049/el.2018.0915
- Article
35
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1128, doi. 10.1049/el.2018.5663
- Liu, Zhiqiang;
- Xu, Jinping;
- Wang, Wenbo
- Article
36
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1126, doi. 10.1049/el.2018.5240
- AbdulRehman, M.;
- Khalid, S.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1124, doi. 10.1049/el.2018.5497
- Yang, Wen‐Wen;
- Zhu, Yan‐Yuan;
- Chen, Jian‐Xin
- Article
38
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1106, doi. 10.1049/el.2018.5482
- Article
39
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1110, doi. 10.1049/el.2018.1326
- Zhang, Monica M.Y.;
- Xu, Yifang;
- Wu, Huaming
- Article
40
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1118, doi. 10.1049/el.2018.5071
- Xie, Jianxiao;
- Jing, Xiaojun;
- Gao, Hui
- Article
41
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1098, doi. 10.1049/el.2018.6689
- Article
42
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1098, doi. 10.1049/el.2018.6687
- Article
43
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1112, doi. 10.1049/el.2018.5867
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44
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1101, doi. 10.1049/el.2018.6044
- Lee, H.;
- Yang, H.;
- Myeong, S.;
- Lee, K.
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45
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1099, doi. 10.1049/el.2018.6772
- Article
46
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1094, doi. 10.1049/el.2018.5160
- Article
47
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1104, doi. 10.1049/el.2018.5717
- Alam, T.;
- Islam, M.T.;
- Cho, M.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1102, doi. 10.1049/el.2018.5639
- Wang, Chao;
- Yuan, Bin;
- Mao, Junfa;
- Shi, Wenxuan
- Article
49
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1091, doi. 10.1049/el.2018.5518
- Ghavamirad, R.;
- Sebt, M.A.;
- Babashah, H.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 18, p. 1090, doi. 10.1049/el.2018.5035
- Mosalanejad, M.;
- Brebels, S.;
- Soens, C.;
- Vandenbosch, G.A.E.
- Article