Works matching IS 00135194 AND DT 2018 AND VI 54 AND IP 17
1
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1053, doi. 10.1049/el.2018.5390
- Jiaojiao Wu;
- Lei Zuo;
- Ming Li
- Article
2
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1017, doi. 10.1049/el.2018.5386
- Qilong Song;
- Yang Wang;
- Kai Liu;
- Jie Zhang
- Article
3
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1040, doi. 10.1049/el.2018.5380
- Chieh, J. C. S.;
- Rowland, J.;
- Sharma, S.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1030, doi. 10.1049/el.2018.5135
- Lee, L. K.;
- Yoon, Y. B.;
- Kim, S. W.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1022, doi. 10.1049/el.2018.5047
- Kim, T.;
- Oh, M. H.;
- Kwon, M. W.;
- Park, B.-G.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1045, doi. 10.1049/el.2018.5258
- Loghmari, Z.;
- Bahriz, M.;
- Thomas, D. Díaz;
- Meguekam, A.;
- Nguyen Van, H.;
- Teissier, R.;
- Baranov, A. N.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1015, doi. 10.1049/el.2018.1410
- Article
9
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1043, doi. 10.1049/el.2018.1291
- Korivi, N.;
- Nujhat, N.;
- Ahmed, S.;
- Jiang, L.;
- Das, K.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1020, doi. 10.1049/el.2018.1280
- Linqi Shi;
- Weixin Gai;
- Liangxiao Tang;
- Xiao Xiang;
- Ai He
- Article
11
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1018, doi. 10.1049/el.2018.1284
- Xinpeng Xing;
- Peng Zhu;
- Hui Liu;
- Georges Gielen
- Article
12
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1036, doi. 10.1049/el.2018.1060
- Article
13
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1026, doi. 10.1049/el.2018.0496
- Feng Xiao;
- Kejie Huang;
- Yue Qiu;
- Haibin Shen
- Article
14
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1032, doi. 10.1049/el.2018.0889
- Article
15
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1034, doi. 10.1049/el.2018.0524
- Article
16
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1028, doi. 10.1049/el.2018.0790
- Article
17
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1038, doi. 10.1049/el.2018.0478
- Vatta, F.;
- Soranzo, A.;
- Babich, F.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1042, doi. 10.1049/el.2018.0299
- Chenglin Li;
- Xiaoping Liao;
- Hao Yan
- Article
19
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1049, doi. 10.1049/el.2018.0295
- Narayanan, R. M.;
- Liu, A. Z.;
- Singerman, P. G.;
- Rangaswamy, M.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1047, doi. 10.1049/el.2018.0264
- Ghodsi, M.;
- Barakati, S. M.;
- Sadr, S. M.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1051, doi. 10.1049/el.2018.0208
- Wenwu Kang;
- Yunhua Zhang;
- Xiao Dong
- Article
22
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1024, doi. 10.1049/el.2017.4385
- van der Westhuizen, Y.;
- Chai, D.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1045, doi. 10.1049/el.2018.5258
- Loghmari, Z.;
- Bahriz, M.;
- Thomas, D. Díaz;
- Meguekam, A.;
- Van, H. Nguyen;
- Teissier, R.;
- Baranov, A.N.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1053, doi. 10.1049/el.2018.5390
- Wu, Jiaojiao;
- Zuo, Lei;
- Li, Ming
- Article
25
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1051, doi. 10.1049/el.2018.0208
- Kang, Wenwu;
- Zhang, Yunhua;
- Dong, Xiao
- Article
26
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1043, doi. 10.1049/el.2018.1291
- Korivi, N.;
- Nujhat, N.;
- Ahmed, S.;
- Jiang, L.;
- Das, K.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1049, doi. 10.1049/el.2018.0295
- Narayanan, R.M.;
- Liu, A.Z.;
- Singerman, P.G.;
- Rangaswamy, M.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1047, doi. 10.1049/el.2018.0264
- Ghodsi, M.;
- Barakati, S.M.;
- Sadr, S.M.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1038, doi. 10.1049/el.2018.0478
- Vatta, F.;
- Soranzo, A.;
- Babich, F.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1042, doi. 10.1049/el.2018.0299
- Li, Chenglin;
- Liao, Xiaoping;
- Yan, Hao
- Article
31
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1040, doi. 10.1049/el.2018.5380
- Chieh, J.C.S.;
- Rowland, J.;
- Sharma, S.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1036, doi. 10.1049/el.2018.1060
- Article
33
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1034, doi. 10.1049/el.2018.0524
- Article
34
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1032, doi. 10.1049/el.2018.0889
- Article
35
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1001, doi. 10.1049/el.2018.0921
- Gao, Yesheng;
- Guo, Xiaojiang;
- Liu, Xingzhao
- Article
36
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1026, doi. 10.1049/el.2018.0496
- Xiao, Feng;
- Huang, Kejie;
- Qiu, Yue;
- Shen, Haibin
- Article
37
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1015, doi. 10.1049/el.2018.1410
- Article
38
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1028, doi. 10.1049/el.2018.0790
- Article
39
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1022, doi. 10.1049/el.2018.5047
- Kim, T.;
- Oh, M.H.;
- Kwon, M.W.;
- Park, B.‐G.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1030, doi. 10.1049/el.2018.5135
- Lee, L.K.;
- Yoon, Y.B.;
- Kim, S.W.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1024, doi. 10.1049/el.2017.4385
- Article
42
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1020, doi. 10.1049/el.2018.1280
- Shi, Linqi;
- Gai, Weixin;
- Tang, Liangxiao;
- Xiang, Xiao;
- He, Ai
- Article
43
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1005, doi. 10.1049/el.2017.4776
- Oliveira, F.D.R.;
- Batista, E.L.O.;
- Seara, R.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1003, doi. 10.1049/el.2018.1228
- Yang, Xiaopeng;
- Li, Shuai;
- Long, Teng;
- Sarkar, Tapan K.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1017, doi. 10.1049/el.2018.5386
- Song, Qilong;
- Wang, Yang;
- Liu, Kai;
- Zhang, Jie
- Article
46
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1018, doi. 10.1049/el.2018.1284
- Xing, Xinpeng;
- Zhu, Peng;
- Liu, Hui;
- Gielen, Georges
- Article
47
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 999, doi. 10.1049/el.2018.5233
- Lefaida, S.;
- Soltani, F.;
- Mezache, A.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 997, doi. 10.1049/el.2018.1123
- Article
49
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1014, doi. 10.1049/el.2018.1411
- Article
50
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 17, p. 1014, doi. 10.1049/el.2018.1409
- Article