Works matching IS 00135194 AND DT 2018 AND VI 54 AND IP 16
1
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 986, doi. 10.1049/el.2018.5362
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2
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 993, doi. 10.1049/el.2018.5331
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3
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 999, doi. 10.1049/el.2018.5233
- Lefaida, S.;
- Soltani, F.;
- Mezache, A.
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4
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 971, doi. 10.1049/el.2018.5114
- Dudarin, A.;
- Molnar, G.;
- Vucic, M.
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5
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 984, doi. 10.1049/el.2018.5113
- Giambra, M. A.;
- Benfante, A.;
- Zeiss, L.;
- Pernice, R.;
- Miseikis, V.;
- Pernice, W. H. P.;
- Jang, M. H.;
- Ahn, J. -H.;
- Cino, A.C.;
- Stivala, S.;
- Calandra, E.;
- Busacca, A. C.;
- Danneau, R.
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6
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 1003, doi. 10.1049/el.2018.1228
- Xiaopeng Yang;
- Shuai Li;
- Teng Long;
- Sarkar, Tapan K.
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7
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 965, doi. 10.1049/el.2018.1406
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9
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 990, doi. 10.1049/el.2018.1321
- Termos, H.;
- Rampone, T.;
- Sharaiha, A.
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10
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 978, doi. 10.1049/el.2018.1253
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12
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 967, doi. 10.1049/el.2018.1216
- Wendi Yang;
- Hanjun Jiang;
- Zhihua Wang
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13
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 969, doi. 10.1049/el.2018.1218
- Zaiming Fu;
- Hanglin Liu;
- Nan Ren
- Article
14
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 997, doi. 10.1049/el.2018.1123
- Article
15
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 1007, doi. 10.1049/el.2018.0375
- Gang Zhang;
- Zhenyao Qian;
- Jiquan Yang
- Article
16
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 982, doi. 10.1049/el.2018.1086
- Choi, W.;
- Byreddy, P. R.;
- Chen, Z.;
- Chen, A. J.;
- Newman, A. J.;
- K. K. O.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 973, doi. 10.1049/el.2018.0619
- Mollabashi, H. E.;
- Mazinan, A. H.
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18
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 995, doi. 10.1049/el.2018.0984
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19
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 975, doi. 10.1049/el.2018.0224
- Le Qin;
- Jiaju Tan;
- Zhen Wang;
- Guoli Wang;
- Xuemei Guo
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20
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 991, doi. 10.1049/el.2018.0961
- Gow, P. C.;
- McBryde, D.;
- Berry, S. A.;
- Apostolopoulos, V.
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21
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 1009, doi. 10.1049/el.2018.0968
- Fan Meng;
- Chao Yu;
- Xiao-Wei Zhu
- Article
22
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 988, doi. 10.1049/el.2018.0940
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23
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 1001, doi. 10.1049/el.2018.0921
- Yesheng Gao;
- Xiaojiang Guo;
- Xingzhao Liu
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24
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 980, doi. 10.1049/el.2018.0786
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25
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 977, doi. 10.1049/el.2017.4256
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26
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 16, p. 1005, doi. 10.1049/el.2017.4776
- Oliveira, F. D. R.;
- Batista, E. L. O.;
- Seara, R.
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