Works matching IS 00135194 AND DT 2018 AND VI 54 AND IP 13
2
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 802, doi. 10.1049/el.2018.1135
- Yibo Liu;
- Luhong Mao;
- Baoyong Chi
- Article
4
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 815, doi. 10.1049/el.2018.1345
- Article
5
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 810, doi. 10.1049/el.2018.1153
- Di Wang;
- Liji Wu;
- Xiangmin Zhang
- Article
6
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 837, doi. 10.1049/el.2018.1151
- Xinlin Xia;
- Xu Cheng;
- Fengjun Chen;
- Xianjin Deng
- Article
7
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 833, doi. 10.1049/el.2018.1246
- Article
8
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 808, doi. 10.1049/el.2018.1338
- Lu Wang;
- Sen Zhang;
- Yi-Cheng Zeng;
- Zhi-Jun Li
- Article
9
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 825, doi. 10.1049/el.2018.0699
- Qixiao Chen;
- Liming Zheng;
- Dalong Zhang;
- Baodian Wei;
- Xiao Ma
- Article
10
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 835, doi. 10.1049/el.2018.1242
- Yong Xu;
- Miao Sun;
- Ting-hui Peng;
- Yong Luo;
- You-lei Pu;
- Jian-xun Wang;
- Ze-Wei Wu;
- Guo Liu;
- Ran Yan
- Article
11
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 842, doi. 10.1049/el.2018.1208
- Beibei Zhu;
- Min Xue;
- Shilong Pan
- Article
12
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 797, doi. 10.1049/el.2018.1194
- Jeong, J. G.;
- Park, N. J.;
- Yoon, Y. J.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 812, doi. 10.1049/el.2018.1157
- Article
14
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 846, doi. 10.1049/el.2018.1103
- Peng Zhang;
- Ping Wang;
- Julian Cheng
- Article
15
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 800, doi. 10.1049/el.2018.1051
- Niaz, Muhammad Wasif;
- Sadiq, Muhammad Shahzad;
- Yingzeng Yin;
- Shufeng Zheng;
- Jingdong Chen
- Article
16
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 798, doi. 10.1049/el.2018.1059
- Yunxue Xu;
- Longyue Qu;
- Hyung-Hoon Kim;
- Hyeongdong Kim
- Article
17
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 817, doi. 10.1049/el.2018.1108
- Article
18
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 852, doi. 10.1049/el.2018.1006
- Al-Hmood, H.;
- Al-Raweshidy, H. S.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 813, doi. 10.1049/el.2018.1000
- Quintero, A.;
- Perez, C.;
- Gutierrez, E.;
- Hernandez, L.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 806, doi. 10.1049/el.2018.0937
- Xing Yang;
- Houjun Wang;
- Ke Liu
- Article
21
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 840, doi. 10.1049/el.2018.0475
- Tadokoro, Y.;
- Ohno, Y.;
- Tanaka, H.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 839, doi. 10.1049/el.2018.0922
- Article
23
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 804, doi. 10.1049/el.2018.0780
- Article
24
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 850, doi. 10.1049/el.2018.0366
- Yan Xu;
- Hang Yu;
- Jiahe Zhang
- Article
25
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 844, doi. 10.1049/el.2018.0633
- Article
26
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 821, doi. 10.1049/el.2018.0324
- Yixiu Liu;
- Yunzhou Zhang;
- Coleman, Sonya;
- Jianning Chi
- Article
27
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 827, doi. 10.1049/el.2018.0448
- Article
28
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 823, doi. 10.1049/el.2018.0424
- Bowen Fei;
- Yunfei Qiu;
- Daqian Liu
- Article
29
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 831, doi. 10.1049/el.2018.0338
- Article
30
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 819, doi. 10.1049/el.2018.0123
- Article
31
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 829, doi. 10.1049/el.2017.4813
- Qing Chen;
- Yin Li;
- Chuanda Qi
- Article
32
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 13, p. 848, doi. 10.1049/el.2017.3981
- Ronghui Hao;
- Dongdong Wu;
- Kai Fu;
- Liang Song;
- Fu Chen;
- Jie Zhao;
- Zhongkai Du;
- Bingliang Zhang;
- Qilong Wang;
- Guohao Yu;
- Kai Cheng;
- Yong Cai;
- Xinping Zhang;
- Baoshun Zhang
- Article