Works matching IS 00135194 AND DT 2018 AND VI 54 AND IP 12
1
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 741, doi. 10.1049/el.2018.1112
- Ai He;
- Weixin Gai;
- Liangxiao Tang
- Article
2
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 789, doi. 10.1049/el.2018.0764
- Yildirim, I.;
- Basar, E.;
- Kurt, G. K.
- Article
3
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 731, doi. 10.1049/el.2018.1384
- Article
4
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 779, doi. 10.1049/el.2018.1217
- Article
5
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 764, doi. 10.1049/el.2018.0716
- Politis, A. C.;
- Hilas, C. S.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 732, doi. 10.1049/el.2018.1387
- Article
8
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 833, doi. 10.1049/el.2018.1246
- Gu, Hui;
- Ge, Lei;
- Xu, Lijie
- Article
10
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 768, doi. 10.1049/el.2018.1251
- Article
11
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 737, doi. 10.1049/el.2018.1213
- Zhongyang Liu;
- Cheng Zhuo;
- Xiaowei Xu
- Article
12
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 754, doi. 10.1049/el.2018.0958
- Jiachen Yang;
- Kyohoon Sim;
- Bin Jiang;
- Wen Lu
- Article
13
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 775, doi. 10.1049/el.2018.1130
- Siqi Li;
- Wenbin Shu;
- Sizhao Lu
- Article
14
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 743, doi. 10.1049/el.2018.1091
- Article
15
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 777, doi. 10.1049/el.2018.1079
- Mizumoto, I.;
- Yoshii, Y.;
- Yamamoto, K.;
- Oguma, H.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 787, doi. 10.1049/el.2018.0945
- Article
17
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 760, doi. 10.1049/el.2018.0989
- Jeong, C. Y.;
- Yang, H. S.;
- Moon, K. D.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 735, doi. 10.1049/el.2018.0765
- Tinglong Tang;
- Shengyong Chen;
- Luo, Jake
- Article
19
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 739, doi. 10.1049/el.2018.0731
- Talbi, Y.;
- Campo, E.;
- Brulin, D.;
- Fourniols, J. Y.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 770, doi. 10.1049/el.2018.0881
- Tadokoro, Y.;
- Funayama, K.;
- Tanaka, H.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 781, doi. 10.1049/el.2018.0855
- Jing Wang;
- Ping Guo;
- Yin-wei Li;
- Dong-mei Wu;
- Li-fu Chen
- Article
22
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 746, doi. 10.1049/el.2018.0800
- Article
23
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 766, doi. 10.1049/el.2018.0482
- Article
24
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 783, doi. 10.1049/el.2018.0247
- Xing-Chang Fu;
- Yuanjie Lv;
- Li-Jiang Zhang;
- Tong Zhang;
- Xian-Jie Li;
- Xubo Song;
- Zhirong Zhang;
- Yulong Fang;
- Zhihong Feng
- Article
25
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 762, doi. 10.1049/el.2017.4572
- Cong Liu;
- Miao Huang;
- Longhua Ma;
- Zheming Lu
- Article
26
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 774, doi. 10.1049/el.2018.0720
- Ledentsov Jr., N.;
- Agustin, M.;
- Chorchos, L.;
- Ledentsov, N. N.;
- Turkiewicz, J. P.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 758, doi. 10.1049/el.2017.4835
- Kun Xia;
- Zheng Li;
- Yusong Tang;
- Yanhong Ye;
- Feng Zhu
- Article
28
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 785, doi. 10.1049/el.2018.0680
- Xuelian Yu;
- Thaler, Lore;
- Baker, Christopher J.;
- Smith, Graeme E.;
- Linsen Zhao
- Article
29
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 756, doi. 10.1049/el.2018.0676
- Article
30
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 842, doi. 10.1049/el.2018.1208
- Zhu, Beibei;
- Xue, Min;
- Pan, Shilong
- Article
31
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 752, doi. 10.1049/el.2018.0412
- Baoxian Wang;
- Quanle Zhang;
- Weigang Zhao
- Article
32
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 758, doi. 10.1049/el.2018.0394
- Ling Mei;
- Zeyu Chen;
- Jianhuang Lai
- Article
33
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 772, doi. 10.1049/el.2018.0391
- Chansaengsri, K.;
- Onlaor, K.;
- Tunhoo, B.;
- Thiwawong, T.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 744, doi. 10.1049/el.2018.0302
- Sakthivel, E.;
- Arunraja, M.;
- Uma, K. D.;
- Shanthi, T.;
- Muthukrishnan, A.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 840, doi. 10.1049/el.2018.0475
- Tadokoro, Y.;
- Ohno, Y.;
- Tanaka, H.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 829, doi. 10.1049/el.2017.4813
- Chen, Qing;
- Li, Yin;
- Qi, Chuanda
- Article
37
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 848, doi. 10.1049/el.2017.3981
- Hao, Ronghui;
- Wu, Dongdong;
- Fu, Kai;
- Song, Liang;
- Chen, Fu;
- Zhao, Jie;
- Du, Zhongkai;
- Zhang, Bingliang;
- Wang, Qilong;
- Yu, Guohao;
- Cheng, Kai;
- Cai, Yong;
- Zhang, Xinping;
- Zhang, Baoshun
- Article
38
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 750, doi. 10.1049/el.2017.3238
- Article
39
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 852, doi. 10.1049/el.2018.1006
- Al‐Hmood, H.;
- Al‐Raweshidy, H.S.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 850, doi. 10.1049/el.2018.0366
- Xu, Yan;
- Yu, Hang;
- Zhang, Jiahe
- Article
41
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 837, doi. 10.1049/el.2018.1151
- Xia, Xinlin;
- Cheng, Xu;
- Chen, Fengjun;
- Deng, Xianjin
- Article
42
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 846, doi. 10.1049/el.2018.1103
- Zhang, Peng;
- Wang, Ping;
- Cheng, Julian
- Article
43
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 844, doi. 10.1049/el.2018.0633
- Article
44
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 835, doi. 10.1049/el.2018.1242
- Xu, Yong;
- Sun, Miao;
- Peng, Ting‐hui;
- Luo, Yong;
- Pu, You‐lei;
- Wang, Jian‐xun;
- Wu, Ze‐Wei;
- Liu, Guo;
- Yan, Ran
- Article
45
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 839, doi. 10.1049/el.2018.0922
- Article
46
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 827, doi. 10.1049/el.2018.0448
- Article
47
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 825, doi. 10.1049/el.2018.0699
- Chen, Qixiao;
- Zheng, Liming;
- Zhang, Dalong;
- Wei, Baodian;
- Ma, Xiao
- Article
48
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 823, doi. 10.1049/el.2018.0424
- Fei, Bowen;
- Qiu, Yunfei;
- Liu, Daqian
- Article
49
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 831, doi. 10.1049/el.2018.0338
- Article
50
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 12, p. 821, doi. 10.1049/el.2018.0324
- Liu, Yixiu;
- Zhang, Yunzhou;
- Coleman, Sonya;
- Chi, Jianning
- Article