Works matching IS 00135194 AND DT 2018 AND VI 54 AND IP 10
1
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 653, doi. 10.1049/el.2018.0079
- Soltanzadeh, K.;
- Yousefi, M. R.
- Article
2
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 642, doi. 10.1049/el.2018.0341
- Shijie Deng;
- Morrison, Alan P.
- Article
4
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 636, doi. 10.1049/el.2018.0588
- Lee, H.;
- Jung, D.;
- Ren, D.;
- Choi, J. H.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 630, doi. 10.1049/el.2017.3479
- Ji Zhao;
- Hongbin Zhang;
- Gang Wang;
- Xiaofeng Liao
- Article
6
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 648, doi. 10.1049/el.2018.0745
- Park, H.-Y.;
- Seo, B.-J.;
- Park, K.-S.;
- Kang, K.-S.;
- Nho, E.-C.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 607, doi. 10.1049/el.2018.1357
- Article
9
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 606, doi. 10.1049/el.2018.1356
- Article
10
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 638, doi. 10.1049/el.2018.0905
- Chinni, V. K.;
- Latzel, P.;
- Zégaoui, M.;
- Coinon, C.;
- Wallart, X.;
- Peytavit, E.;
- Lampin, J. F.;
- Engenhardt, K.;
- Szriftgiser, P.;
- Zaknoune, M.;
- Ducournau, G.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 632, doi. 10.1049/el.2018.0891
- Guangkun Guo;
- Jie Liu;
- Dong Hou;
- Ke Liu;
- Houjun Wang;
- Xianhe Huang;
- Jie Ma;
- Fuyu Sun
- Article
12
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 620, doi. 10.1049/el.2018.0771
- Garde, M. P.;
- Lopez-Martin, A. J.;
- Ramirez-Angulo, J.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 618, doi. 10.1049/el.2018.0735
- Article
14
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 655, doi. 10.1049/el.2018.0704
- Article
15
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 665, doi. 10.1049/el.2018.0698
- Wangshuxing Ieu;
- Dewei Zhang;
- Dalong Lv;
- Ying Wu
- Article
16
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 612, doi. 10.1049/el.2017.4796
- Article
17
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 644, doi. 10.1049/el.2018.0692
- Labanca, I.;
- Ceccarelli, F.;
- Gulinatti, A.;
- Ghioni, M.;
- Rech, I.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 651, doi. 10.1049/el.2018.0683
- Feng An;
- Wen-Sheng Song;
- Ke-Xin Yang
- Article
19
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 663, doi. 10.1049/el.2018.0617
- Ali, R.;
- Shahin, N.;
- Kim, Y.-T.;
- Kim, B.-S.;
- Kim, S. W.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 616, doi. 10.1049/el.2018.0593
- Kim, J.;
- Park, J.;
- Kim, J.-G.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 628, doi. 10.1049/el.2018.0272
- Heng-Chao Li;
- Hong-Lian Zhou;
- Lei Pan;
- Qian Du
- Article
22
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 649, doi. 10.1049/el.2018.0564
- Article
23
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 661, doi. 10.1049/el.2018.0523
- Jian-Kang Xiao;
- Yong Li;
- Jian-Guo Ma
- Article
24
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 640, doi. 10.1049/el.2018.0521
- Döpke, B.;
- Surkamp, N.;
- Hu, Y.;
- Brenner, C.;
- Klehr, A.;
- Knigge, A.;
- Tränkle, G.;
- Hofmann, M. R.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 614, doi. 10.1049/el.2018.0491
- Article
26
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 657, doi. 10.1049/el.2018.0417
- Moon, J. S.;
- Grabar, R.;
- Antcliffe, M.;
- Fung, H.;
- Tang, Y.;
- Tai, H.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 622, doi. 10.1049/el.2018.0052
- Khan, A.;
- Kareem, P.;
- Kyung, C. M.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 659, doi. 10.1049/el.2018.0179
- Tao Li;
- Qian Zhu;
- Xiaolei Fan;
- Zengping Chen
- Article
29
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 667, doi. 10.1049/el.2018.0170
- Kiani, S.;
- Rezaei, P.;
- Karami, M.;
- Sadeghzadeh, R. A.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 611, doi. 10.1049/el.2017.4775
- Article
31
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 634, doi. 10.1049/el.2017.4675
- Huang, C.-Y.;
- Liu, J. Y.-C.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 624, doi. 10.1049/el.2017.4601
- Article
33
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 646, doi. 10.1049/el.2017.4769
- Tao Wang;
- Zhipeng Zhu;
- Shiqiang Zhu
- Article
34
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 10, p. 626, doi. 10.1049/el.2017.4276
- Kim, C. R.;
- Lee, S. H.;
- Lee, J. H.;
- Park, J.-I.
- Article