Works matching IS 00135194 AND DT 2017 AND VI 53 AND IP 8
1
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 564, doi. 10.1049/el.2017.0466
- Shareef, E.;
- Dawood, M.;
- Boehm, J.
- Article
2
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 562, doi. 10.1049/el.2017.0013
- Wei Xie;
- Fei Wen;
- Jiangbo Liu;
- Qun Wan
- Article
3
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 560, doi. 10.1049/el.2016.4631
- Jeon, H.;
- Chung, Y.;
- Chung, W.;
- Kim, J.;
- Yang, H.
- Article
4
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 558, doi. 10.1049/el.2016.4524
- Xianxiang Yu;
- Guolong Cui;
- Peng Ge;
- Lingjiang Kong
- Article
5
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 570, doi. 10.1049/el.2016.4597
- Article
6
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 566, doi. 10.1049/el.2017.0324
- Hongmeng Chen;
- Yaobing Lu;
- Heqiang Mu;
- Xiaoli Yi;
- Jing Liu;
- Zeyu Wang;
- Ming Li
- Article
7
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 568, doi. 10.1049/el.2017.0469
- Lele Qu;
- Yanan Ge;
- Tianhong Yang
- Article
8
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 556, doi. 10.1049/el.2016.4703
- Nawaz, M.;
- Saqib, M. A.;
- Kashif, S. A. R.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 554, doi. 10.1049/el.2017.0470
- Yao-Wu Wang;
- Min-Wu Chen;
- Lei Guo;
- Jie Luo
- Article
10
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 552, doi. 10.1049/el.2017.0022
- Bui, D. H. N.;
- Vuong, T. P.;
- Allard, B.;
- Verdier, J.;
- Benech, P.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 551, doi. 10.1049/el.2016.4541
- Pérez-Bailón, J.;
- Márquez, A.;
- Calvo, B.;
- Medrano, N.;
- Martínez, P. A.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 549, doi. 10.1049/el.2016.4269
- Hashimoto, J.;
- Yoshinaga, H.;
- Mori, H.;
- Tsuji, Y.;
- Murata, M.;
- Kato, T.;
- Ekawa, M.;
- Iguchi, Y.;
- Katsuyama, T.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 548, doi. 10.1049/el.2017.0379
- Niang, A.;
- de Lustrac, A.;
- Burokur, S. N.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 546, doi. 10.1049/el.2016.3620
- Article
15
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 538, doi. 10.1049/el.2016.4755
- Junyu Shi;
- Dasheng Cui;
- Haidong Hao;
- Changjiang Deng;
- Xin Lv
- Article
16
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 544, doi. 10.1049/el.2016.3793
- Article
17
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 542, doi. 10.1049/el.2017.0380
- Hammou, D.;
- Nedil, M.;
- Tatu, S. O.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 540, doi. 10.1049/el.2016.4333
- Bing Liu;
- Zijun Guo;
- Xiangyun Wei;
- Yu Ma;
- Renrong Zhao;
- Ke Xing;
- Lei Wu
- Article
19
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 536, doi. 10.1049/el.2017.0568
- Chanyong Jeon;
- Jeong Woo Lee
- Article
20
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 520, doi. 10.1049/el.2017.0260
- Xiaole Kang;
- Jianxun Su;
- Hui Zhang;
- Zengrui Li;
- Yaoqing (Lamar) Yang
- Article
21
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 518, doi. 10.1049/el.2016.2923
- Article
22
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 534, doi. 10.1049/el.2016.3865
- Article
23
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 532, doi. 10.1049/el.2016.4733
- Honarparvar, M.;
- de la Rosa, J. M.;
- Nabki, F.;
- Sawan, M.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 530, doi. 10.1049/el.2016.4680
- Quan Liu;
- Zhiqiang Xu;
- Zhengying LI
- Article
25
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 522, doi. 10.1049/el.2016.2640
- Shixi Zou;
- Jiaolong Wei;
- Xin Man
- Article
26
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 516, doi. 10.1049/el.2017.0172
- Akbari, M.;
- Ali, M. M.;
- Farahani, M.;
- Sebak, A. R.;
- Denidni, T.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 528, doi. 10.1049/el.2017.0318
- Payandehnia, P.;
- Mirzaie, H.;
- Maghami, H.;
- Muhlestein, J.;
- Temes, G. C.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 526, doi. 10.1049/el.2016.4471
- Article
29
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 515, doi. 10.1049/el.2017.0603
- Article
31
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 512, doi. 10.1049/el.2017.1090
- Article
33
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 424, doi. 10.1049/el.2016.4171
- Cha, M.;
- Han, S.;
- Kim, H.;
- Mun, D.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 631, doi. 10.1049/el.2016.2994
- Article
35
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 629, doi. 10.1049/el.2017.0005
- Zhang, Q.;
- Wan, J.W;
- Wang, D.D;
- Chen, J.Y;
- Wang, D.H
- Article
36
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 628, doi. 10.1049/el.2017.0196
- Zhang, Gaoyuan;
- Wang, Dan;
- Song, Liang;
- Wu, Honghai;
- Xie, Ping;
- Ji, Baofeng;
- Wen, Hong
- Article
37
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 626, doi. 10.1049/el.2016.4190
- Article
38
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 624, doi. 10.1049/el.2017.0580
- Gao, Shan‐Shan;
- Sun, Sheng;
- Li, Jia‐Lin;
- Yan, Tao
- Article
39
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 622, doi. 10.1049/el.2016.4548
- Fernández‐Berni, J.;
- Niemier, M.;
- Hu, X.S.;
- Lu, H.;
- Li, W.;
- Fay, P.;
- Carmona‐Galán, R.;
- Rodríguez‐Vázquez, Á.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 620, doi. 10.1049/el.2017.0167
- Cheng, Ziyang;
- He, Zishu;
- Li, Ruiyang;
- Wang, Zhilei
- Article
41
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 618, doi. 10.1049/el.2016.4125
- Luo, Zhongtao;
- Song, Tiecheng;
- He, Zishu;
- Hu, Jinfeng
- Article
42
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 616, doi. 10.1049/el.2017.0660
- Article
43
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 615, doi. 10.1049/el.2017.0378
- Alexander, J.K.;
- Morrissey, P.E.;
- Yang, H.;
- Yang, M.;
- Zhao, Y.;
- Rensing, M.;
- O'Brien, P.;
- Peters, F.H.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 613, doi. 10.1049/el.2016.4476
- Daniel, H.S.;
- Gopalakrishnan, G.K.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 611, doi. 10.1049/el.2017.0203
- Article
46
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 609, doi. 10.1049/el.2017.0140
- Bhutani, A.;
- Goettel, B.;
- Thelemann, T.;
- Zwick, T.
- Article
47
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 607, doi. 10.1049/el.2017.0637
- Article
48
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 606, doi. 10.1049/el.2017.0226
- Song, Bin;
- He, Songbai;
- Peng, Jun;
- Zhao, Yatao
- Article
49
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 604, doi. 10.1049/el.2017.0194
- Article
50
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 602, doi. 10.1049/el.2016.3891
- Ma, Teng;
- Wu, Jiangxing;
- Hu, Yuxiang;
- Huang, Wanwei
- Article