Works matching IS 00135194 AND DT 2017 AND VI 53 AND IP 7
1
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 506, doi. 10.1049/el.2016.4623
- Dongyang Jiang;
- Sai-Weng Sin;
- Seng-Pan U.;
- Martins, Rui Paulo;
- Maloberti, Franco
- Article
2
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 463, doi. 10.1049/el.2017.0394
- Yakopcic, C.;
- Bontupalli, V.;
- Hasan, R.;
- Mountain, D.;
- Taha, T. M.
- Article
3
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 454, doi. 10.1049/el.2017.0347
- Lopez-Martin, A. J.;
- Garde, M. P.;
- Ramirez-Angulo, J.
- Article
4
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 448, doi. 10.1049/el.2017.0229
- Long Yang;
- Zhi-ya Zhang;
- Dan Wu;
- Guang Fu;
- Zehong Yan
- Article
6
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 443, doi. 10.1049/el.2017.0943
- Article
7
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 442, doi. 10.1049/el.2017.0895
- Article
8
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 465, doi. 10.1049/el.2016.4756
- Article
9
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 458, doi. 10.1049/el.2017.0422
- Liangbo Xie;
- Wei Nie;
- Lian Xiong;
- Jian Su
- Article
10
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 498, doi. 10.1049/el.2017.0344
- Domingo, N.;
- Barragán, L. A.;
- Montiel, J. M. M.;
- Domínguez, A.;
- Artigas, J. I.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 461, doi. 10.1049/el.2017.0388
- Jung, Y.-H.;
- Hong, S.-K.;
- Kwon, O.-K.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 476, doi. 10.1049/el.2017.0328
- Article
13
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 450, doi. 10.1049/el.2016.4788
- Silva, S. J.;
- Scardovelli, T. A.;
- Martucci, H. N.;
- Boschi, S. R. M. S.;
- Silva, A. P.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 445, doi. 10.1049/el.2017.0237
- Yali Yao;
- Fushun Zhang;
- Fan Zhang
- Article
15
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 510, doi. 10.1049/el.2017.0044
- Qinghua Tang;
- Yanghua Li;
- Wenguang Li
- Article
16
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 471, doi. 10.1049/el.2016.4662
- Otter, W. J.;
- Ridler, N. M.;
- Yasukochi, H.;
- Soeda, K.;
- Konishi, K.;
- Yumoto, J.;
- Kuwata-Gonokami, M.;
- Lucyszyn, S.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 486, doi. 10.1049/el.2016.4399
- Parment, F.;
- Ghiotto, A.;
- Vuong, T.-P.;
- Duchamp, J.-M.;
- Wu, K.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 459, doi. 10.1049/el.2016.4770
- Article
19
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 504, doi. 10.1049/el.2016.4642
- Dongxuan Bao;
- Zhuo Zou;
- Yajie Qin;
- Li-Rong Zheng
- Article
20
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 492, doi. 10.1049/el.2016.4653
- Yingmei Chen;
- Jiquan Li;
- Zhen Zhang;
- Hui Wang;
- Yunan Zhang
- Article
21
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 496, doi. 10.1049/el.2016.4625
- Article
22
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 456, doi. 10.1049/el.2016.4233
- Suzuki, D.;
- Natsui, M.;
- Ikeda, S.;
- Endoh, T.;
- Ohno, H.;
- Hanyu, T.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 488, doi. 10.1049/el.2016.4131
- Xiaobang Shang;
- Lancaster, Michael;
- Yu-Liang Dong
- Article
24
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 482, doi. 10.1049/el.2016.4103
- Wangshuxing Ieu;
- Dewei Zhang;
- Dongfang Zhou
- Article
25
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 500, doi. 10.1049/el.2016.4598
- Xiangguang Leng;
- Kefeng Ji;
- Shilin Zhou;
- Xiangwei Xing;
- Huanxin Zou
- Article
26
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 494, doi. 10.1049/el.2016.4502
- Chenyu Liang;
- Wenjia Zhang;
- Lin Sun;
- Yue You;
- Fan Yang;
- Jiangbing Du;
- Zuyuan He
- Article
27
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 473, doi. 10.1049/el.2016.4442
- Guiyun Zhang;
- Hao Yi;
- Shengshui Wang;
- Minghua Han
- Article
28
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 502, doi. 10.1049/el.2016.4439
- Upadhyay, A.;
- Pachori, R. B.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 446, doi. 10.1049/el.2016.4054
- Article
30
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 484, doi. 10.1049/el.2016.4338
- Fujita, K.;
- Zhou, J.;
- Pommerenke, D.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 452, doi. 10.1049/el.2016.4043
- Mao, W.;
- Li, Y.;
- Heng, C. H.;
- Lian, Y.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 508, doi. 10.1049/el.2016.4192
- Hao Zhang;
- Wei Kang;
- Wen Wu
- Article
33
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 490, doi. 10.1049/el.2016.3629
- Jian Li;
- Yongjun Huang;
- Yi Li;
- Guangjun Wen;
- Fulin Xiao
- Article
34
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 475, doi. 10.1049/el.2016.3431
- Hayati, M.;
- Ekhteraei, M.;
- Shama, F.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 467, doi. 10.1049/el.2016.3869
- Article
36
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 480, doi. 10.1049/el.2016.3795
- Khan, S.;
- Jones, T. R.;
- Deif, S.;
- Daneshmand, M.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 478, doi. 10.1049/el.2016.3788
- Jiangling Dou;
- Shu Jiang;
- Jinping Xu;
- Wenbo Wang
- Article
38
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 7, p. 468, doi. 10.1049/el.2016.2234
- Yan, Q.;
- Gong, Q.;
- Yu, F. R.
- Article