Works matching IS 00135194 AND DT 2017 AND VI 53 AND IP 6
1
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 419, doi. 10.1049/el.2017.0065
- Article
2
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 434, doi. 10.1049/el.2017.0182
- Chuan Shao;
- Yang Li;
- Jian-Xin Chen
- Article
3
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 415, doi. 10.1049/el.2017.0261
- Laquerbe, V.;
- Pascaud, R.;
- Callegari, T.;
- Liard, L.;
- Pascal, O.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 391, doi. 10.1049/el.2017.0037
- Article
8
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 421, doi. 10.1049/el.2016.4657
- Jin-Yuan Wang;
- Qing-Lin Li;
- Jian-Xia Zhu;
- Yongjin Wang
- Article
9
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 395, doi. 10.1049/el.2017.0248
- Article
10
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 430, doi. 10.1049/el.2017.0171
- Maoshen Jia;
- Jundai Sun;
- Feng Deng;
- Junyue Sun
- Article
11
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 411, doi. 10.1049/el.2016.4652
- Article
12
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 432, doi. 10.1049/el.2016.4412
- Üstünbaş, S.;
- Basar, E.;
- Aygölü, Ü.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 436, doi. 10.1049/el.2017.0032
- Article
14
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 382, doi. 10.1049/el.2016.4665
- Fengxia Yan;
- Jianliang Gao
- Article
15
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 393, doi. 10.1049/el.2016.4287
- Qiuyan Tao;
- Lianghao Wang;
- Dongxiao Li;
- Ming Zhang
- Article
16
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 399, doi. 10.1049/el.2017.0023
- Kim, Y. -H.;
- Kim, H.;
- Kim, S. -W.;
- Kim, H. -Y.;
- Ko, S. -J.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 424, doi. 10.1049/el.2016.4702
- Article
18
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 405, doi. 10.1049/el.2016.4629
- Ma, Jianbo;
- Sethu, Vidhyasaharan;
- Ambikairajah, Eliathamby;
- Lee, Kong Aik
- Article
19
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 370, doi. 10.1049/el.2016.4605
- Jun, S.;
- Sanz-Izquierdo, B.;
- Heirons, J.;
- Mao, C. X.;
- Gao, S.;
- Bird, D.;
- McClelland, A.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 375, doi. 10.1049/el.2016.4654
- Article
21
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 428, doi. 10.1049/el.2016.4419
- Wei Yang;
- Xiao-Cong Ma;
- Wei Liu;
- Jie Chen
- Article
22
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 423, doi. 10.1049/el.2016.3947
- Article
23
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 373, doi. 10.1049/el.2016.4608
- Niang, A.;
- Ratni, B.;
- de Lustrac, A.;
- Burokur, S. N.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 368, doi. 10.1049/el.2016.4563
- Article
25
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 367, doi. 10.1049/el.2016.4590
- Wuyi Yang;
- Wenyu Luo;
- Yu Zhang
- Article
26
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 371, doi. 10.1049/el.2016.4525
- Junbo Wang;
- Yuan Yao;
- Junsheng Yu;
- Xiaodong Chen
- Article
27
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 389, doi. 10.1049/el.2016.4519
- Yook, J. H.;
- Kim, I. H.;
- Han, M. S.;
- Son, Y. I.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 380, doi. 10.1049/el.2016.4489
- Article
29
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 376, doi. 10.1049/el.2016.4479
- Yang Gao;
- Defu Jiang;
- Ming Liu
- Article
30
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 401, doi. 10.1049/el.2016.2877
- Guimin Jia;
- Yujun Lu;
- Weibing Lu;
- Yihua Shi;
- Jinfeng Yang
- Article
31
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 384, doi. 10.1049/el.2016.4148
- Duchen, G.;
- Diaz, C.;
- Sanchez, G.;
- Perez, H.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 417, doi. 10.1049/el.2016.4089
- Hui Zhu;
- Cheng Gao;
- Hailin Chen;
- Qin Yin
- Article
33
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 413, doi. 10.1049/el.2016.4373
- Jin Li;
- Cheng Guo;
- Lijian Mao;
- Jun Xu
- Article
34
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 407, doi. 10.1049/el.2016.3815
- Redžović, H.;
- Vesović, M.;
- Smiljanić, A.;
- Bjelica, M.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 426, doi. 10.1049/el.2016.4163
- Raja Abdullah, R. S. A.;
- Salah, A. A.;
- Alnaeb, A. A.;
- Sali, A.;
- Rashid, N. E. Abd;
- Ibrahim, I. P.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 386, doi. 10.1049/el.2016.3776
- Article
37
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 403, doi. 10.1049/el.2016.3467
- Wei Wang;
- Zhongyong Wang;
- Qinghua Guo;
- Chuanzong Zhang;
- Peng Sun
- Article
38
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 409, doi. 10.1049/el.2016.3377
- Baek, M.-S.;
- Yun, J.;
- Hur, N.;
- Lim, H.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 387, doi. 10.1049/el.2016.3048
- Nenggan Zheng;
- Mengjie Jin;
- Hui Hong;
- Lei Huang;
- Zonghua Gu;
- Hong Li
- Article
40
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 438, doi. 10.1049/el.2016.2601
- A. Jude, M. J.;
- Kuppuswami, S.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 397, doi. 10.1049/el.2016.3320
- Article
42
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 6, p. 378, doi. 10.1049/el.2016.3287
- Garzón-Rey, J. M.;
- Aguiló, J.;
- Segura-Quijano, F.
- Article