Works matching IS 00135194 AND DT 2017 AND VI 53 AND IP 5
3
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 353, doi. 10.1049/el.2016.2587
- Zhen Heng Liao;
- XuChun Zhang
- Article
4
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 351, doi. 10.1049/el.2016.4205
- Guangzuo Li;
- Ning Wang;
- Ran Wang;
- Keshu Zhang;
- Yirong Wu
- Article
5
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 349, doi. 10.1049/el.2016.3535
- Jieyi Liu;
- Linrang Zhang;
- Shanshan Zhao;
- Nan Liu;
- Juan Zhang
- Article
6
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 345, doi. 10.1049/el.2016.4082
- El Aroudi, A.;
- Mandal, K.;
- Giaouris, D.;
- Banerjee, S.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 337, doi. 10.1049/el.2016.4581
- Bai, X.;
- Kong, Z.;
- Siek, L.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 335, doi. 10.1049/el.2016.4570
- Yunlu Li;
- Dazhi Wang;
- Yi Ning;
- Nanmu Hui
- Article
9
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 333, doi. 10.1049/el.2016.3650
- Article
10
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 330, doi. 10.1049/el.2016.4325
- Article
11
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 326, doi. 10.1049/el.2016.3619
- Dong-Nhat, N.;
- Nguyen, L.;
- Malekmohammadi, A.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 324, doi. 10.1049/el.2016.4469
- Keya Tao;
- Bo Li;
- Yiming Tang;
- Ming Zhang;
- Yaming Bo
- Article
13
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 310, doi. 10.1049/el.2016.4066
- Article
14
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 496, doi. 10.1049/el.2016.4625
- Article
15
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 494, doi. 10.1049/el.2016.4502
- Liang, Chenyu;
- Zhang, Wenjia;
- Sun, Lin;
- You, Yue;
- Yang, Fan;
- Du, Jiangbing;
- He, Zuyuan
- Article
16
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 492, doi. 10.1049/el.2016.4653
- Chen, Yingmei;
- Li, Jiquan;
- Zhang, Zhen;
- Wang, Hui;
- Zhang, Yunan
- Article
17
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 312, doi. 10.1049/el.2016.3769
- Article
18
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 476, doi. 10.1049/el.2017.0328
- Article
19
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 490, doi. 10.1049/el.2016.3629
- Li, Jian;
- Huang, Yongjun;
- Li, Yi;
- Wen, Guangjun;
- Xiao, Fulin
- Article
20
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 308, doi. 10.1049/el.2016.4290
- Article
21
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 302, doi. 10.1049/el.2016.4173
- Article
22
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 298, doi. 10.1049/el.2016.3400
- Didier, P.;
- Razan, F.;
- Caplain, E.;
- Michiel, M.;
- Delamarche, C.;
- Nogues, C.;
- Le Huerou, J. Y.;
- Serfaty, S.;
- Larzabal, P.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 510, doi. 10.1049/el.2017.0044
- Tang, Qinghua;
- Li, Yanghua;
- Li, Wenguang
- Article
24
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 508, doi. 10.1049/el.2016.4192
- Zhang, Hao;
- Kang, Wei;
- Wu, Wen
- Article
25
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 506, doi. 10.1049/el.2016.4623
- Jiang, Dongyang;
- Sin, Sai‐Weng;
- U, Seng‐Pan;
- Martins, Rui Paulo;
- Maloberti, Franco
- Article
26
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 504, doi. 10.1049/el.2016.4642
- Bao, Dongxuan;
- Zou, Zhuo;
- Qin, Yajie;
- Zheng, Li‐Rong
- Article
27
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 502, doi. 10.1049/el.2016.4439
- Upadhyay, A.;
- Pachori, R.B.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 500, doi. 10.1049/el.2016.4598
- Leng, Xiangguang;
- Ji, Kefeng;
- Zhou, Shilin;
- Xing, Xiangwei;
- Zou, Huanxin
- Article
29
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 498, doi. 10.1049/el.2017.0344
- Domingo, N.;
- Barragán, L.A.;
- Montiel, J.M.M.;
- Domínguez, A.;
- Artigas, J.I.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 488, doi. 10.1049/el.2016.4131
- Shang, Xiaobang;
- Lancaster, Michael;
- Dong, Yu‐Liang
- Article
31
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 484, doi. 10.1049/el.2016.4338
- Fujita, K.;
- Zhou, J.;
- Pommerenke, D.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 482, doi. 10.1049/el.2016.4103
- Ieu, Wangshuxing;
- Zhang, Dewei;
- Zhou, Dongfang
- Article
33
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 480, doi. 10.1049/el.2016.3795
- Khan, S.;
- Jones, T.R.;
- Deif, S.;
- Daneshmand, M.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 478, doi. 10.1049/el.2016.3788
- Dou, Jiangling;
- Jiang, Shu;
- Xu, Jinping;
- Wang, Wenbo
- Article
35
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 486, doi. 10.1049/el.2016.4399
- Parment, F.;
- Ghiotto, A.;
- Vuong, T.‐P.;
- Duchamp, J.‐M.;
- Wu, K.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 475, doi. 10.1049/el.2016.3431
- Hayati, M.;
- Ekhteraei, M.;
- Shama, F.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 473, doi. 10.1049/el.2016.4442
- Zhang, Guiyun;
- Yi, Hao;
- Wang, Shengshui;
- Han, Minghua
- Article
38
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 471, doi. 10.1049/el.2016.4662
- Otter, W.J.;
- Ridler, N.M.;
- Yasukochi, H.;
- Soeda, K.;
- Konishi, K.;
- Yumoto, J.;
- Kuwata‐Gonokami, M.;
- Lucyszyn, S.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 469, doi. 10.1049/el.2016.2234
- Yan, Q.;
- Gong, Q.;
- Yu, F.R.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 467, doi. 10.1049/el.2016.3869
- Article
41
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 465, doi. 10.1049/el.2016.4756
- Article
42
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 463, doi. 10.1049/el.2017.0394
- Yakopcic, C.;
- Bontupalli, V.;
- Hasan, R.;
- Mountain, D.;
- Taha, T.M.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 461, doi. 10.1049/el.2017.0388
- Jung, Y.‐H.;
- Hong, S.‐K.;
- Kwon, O.‐K.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 459, doi. 10.1049/el.2016.4770
- Article
45
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 458, doi. 10.1049/el.2017.0422
- Xie, Liangbo;
- Nie, Wei;
- Xiong, Lian;
- Su, Jian
- Article
46
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 456, doi. 10.1049/el.2016.4233
- Suzuki, D.;
- Natsui, M.;
- Ikeda, S.;
- Endoh, T.;
- Ohno, H.;
- Hanyu, T.
- Article
47
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 454, doi. 10.1049/el.2017.0347
- Lopez‐Martin, A.J.;
- Garde, M.P.;
- Ramirez‐Angulo, J.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 452, doi. 10.1049/el.2016.4043
- Mao, W.;
- Li, Y.;
- Heng, C.H.;
- Lian, Y.
- Article
49
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 450, doi. 10.1049/el.2016.4788
- Silva, S.J.;
- Scardovelli, T.A.;
- Martucci, H.N.;
- Boschi, S.R.M.S.;
- Silva, A.P.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 5, p. 448, doi. 10.1049/el.2017.0229
- Yang, Long;
- Zhang, Zhi‐ya;
- Wu, Dan;
- Fu, Guang;
- Yan, Zehong
- Article