Works matching IS 00135194 AND DT 2017 AND VI 53 AND IP 4
1
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 275, doi. 10.1049/el.2016.3964
- Jun Tan;
- Zaiping Nie;
- Dingbang Wen
- Article
2
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 222, doi. 10.1049/el.2016.4149
- Nobunaga, T.;
- Tanaka, H.;
- Tanahashi, I.;
- Watanabe, T.;
- Hattori, Y.
- Article
3
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 258, doi. 10.1049/el.2016.4539
- Aguirre, J.;
- Sánchez-Azqueta, C.;
- Guerrero, E.;
- Gimeno, C.;
- Celma, S.
- Article
4
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 226, doi. 10.1049/el.2016.4348
- Wu, Y.-L.;
- Yang, C.-H.;
- Wu, C.-H.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 212, doi. 10.1049/el.2016.3664
- Kumar, T. Sunil;
- Kanhangad, Vivek
- Article
8
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 208, doi. 10.1049/el.2017.0403
- Article
9
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 237, doi. 10.1049/el.2016.4569
- Article
10
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 256, doi. 10.1049/el.2016.4567
- Horton, A. S.;
- Chilton, S. L.;
- Sigmarsson, H. H.;
- Ruyle, J. E.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 239, doi. 10.1049/el.2016.4011
- Bin Gao;
- Mingyong Zeng;
- Fenggang Sun;
- Jie Liu
- Article
12
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 220, doi. 10.1049/el.2016.4438
- Bowen Zhao;
- Zhulou Cao;
- Sicheng Wang
- Article
13
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 249, doi. 10.1049/el.2016.3844
- Chang-Ming Chen;
- Jun Xu;
- Yao Yao
- Article
14
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 236, doi. 10.1049/el.2016.4328
- Article
15
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 218, doi. 10.1049/el.2016.4327
- Article
16
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 274, doi. 10.1049/el.2016.4297
- Feiqiang Chen;
- Junwei Nie;
- Shaojie Ni;
- Zhengrong Li;
- Feixue Wang
- Article
17
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 231, doi. 10.1049/el.2016.4286
- Article
18
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 229, doi. 10.1049/el.2016.4262
- Olivieri, M.;
- Menichelli, F.;
- Mastrandrea, A.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 233, doi. 10.1049/el.2016.4241
- Huihui Song;
- Yuhui Zheng;
- Kaihua Zhang
- Article
20
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 255, doi. 10.1049/el.2016.4215
- Article
21
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 285, doi. 10.1049/el.2016.4174
- Mekonnen, K. A.;
- van Zantvoort, J. H. C.;
- Tessema, N. M.;
- Cao, Z.;
- Tangdiongga, E.;
- Koonen, A. M. J.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 214, doi. 10.1049/el.2016.4006
- Qingguo Wei;
- Huayun Gong;
- Zongwu Lu
- Article
23
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 268, doi. 10.1049/el.2016.4134
- Herbert, J.;
- Bertling, K.;
- Taimre, T.;
- Rakić, A. D.;
- Wilson, S.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 279, doi. 10.1049/el.2016.4061
- Zhiqun Li;
- Chong Wang;
- Qin Li;
- Zhigong Wang
- Article
25
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 260, doi. 10.1049/el.2016.3628
- Sandalidis, H. G.;
- Chatzidiamantis, N. D.;
- Ntouni, G. D.;
- Karagiannidis, G. K.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 224, doi. 10.1049/el.2016.3877
- Article
27
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 216, doi. 10.1049/el.2016.3611
- Xu, L.;
- Cheng, J.;
- Chen, X.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 251, doi. 10.1049/el.2016.3330
- Lee, K. H.;
- Lee, D.;
- Yoon, J.;
- Kwon, O.;
- Lee, J.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 228, doi. 10.1049/el.2016.3782
- Romero, D. E. T.;
- Jimenez, M. G. C.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 266, doi. 10.1049/el.2016.3735
- Article
31
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 283, doi. 10.1049/el.2016.3710
- Das, M.;
- Sahu, B.;
- Bhanja, U.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 281, doi. 10.1049/el.2016.3309
- Jimenez, M. G. C.;
- Meyer-Baese, U.;
- Dolecek, G. J.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 270, doi. 10.1049/el.2016.3601
- Yi-Wei Tan;
- Chi-Seng Lam;
- Sai-Weng Sin;
- Man-Chung Wong;
- Seng-Pan, U.;
- Martins, Rui Paulo
- Article
34
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 262, doi. 10.1049/el.2016.3595
- Kumar, H.;
- Kumar, Y.;
- Singh, K.;
- Kumar, S.;
- Rawat, G.;
- Kumar, C.;
- Pal, B. N.;
- Jit, S.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 277, doi. 10.1049/el.2016.3541
- Peng Tong;
- Yinsheng Wei;
- Rongqing Xu
- Article
36
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 211, doi. 10.1049/el.2016.3486
- Article
37
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 243, doi. 10.1049/el.2016.3472
- Article
38
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 272, doi. 10.1049/el.2016.3111
- Jung, J.-H.;
- Nho, E.-C.;
- Chung, Y.-H.;
- Baek, S.-T.;
- Lee, J.-H.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 264, doi. 10.1049/el.2016.3160
- Article
40
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 241, doi. 10.1049/el.2016.3036
- Stojanović, N.;
- Stamenković, N.;
- Krstić, I.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 245, doi. 10.1049/el.2016.2942
- Article
42
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 247, doi. 10.1049/el.2016.2827
- Article
43
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 253, doi. 10.1049/el.2016.2715
- Qianwen Liu;
- Jianpeng Wang;
- Yixuan He
- Article