Works matching IS 00135194 AND DT 2017 AND VI 53 AND IP 3
1
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 203, doi. 10.1049/el.2016.3785
- Article
2
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 201, doi. 10.1049/el.2016.3717
- Kun Wang;
- Bin Li;
- Ming Jian Zhao;
- Zhao Hui Wu
- Article
3
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 200, doi. 10.1049/el.2016.1750
- Article
4
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 198, doi. 10.1049/el.2016.2813
- Han, S.-W.;
- Park, S.-H.;
- Kim, H.-S.;
- Jo, M.-G.;
- Cha, H.-Y.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 196, doi. 10.1049/el.2016.3820
- Article
6
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 194, doi. 10.1049/el.2016.3882
- Yoon, D.;
- Seo, M.-G.;
- Song, K.;
- Kaynak, M.;
- Tillack, B.;
- Rieh, J.-S.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 193, doi. 10.1049/el.2016.3888
- Qijia Guo;
- Xiaoxuan Zhang;
- Tianying Chang;
- Hong-Liang Cui;
- Xianzhong Tian
- Article
8
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 191, doi. 10.1049/el.2016.3983
- Lei Qiu;
- Tian Jin;
- Yuan He;
- Biying Lu;
- Zhimin Zhou
- Article
9
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 189, doi. 10.1049/el.2016.3229
- Vinisha, C. V.;
- Mohammed^Yazeen, P. S.;
- Mahima, P.;
- Joy, Vineetha;
- Nair, R. U.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 187, doi. 10.1049/el.2016.3956
- Hui Zhang;
- Yao Lu;
- Jianxun Su;
- Zengrui Li;
- Jinbo Liu;
- Yang, Yaoqing (Lamar)
- Article
11
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 185, doi. 10.1049/el.2016.3930
- Deqing Yu;
- Qiming Cheng;
- Jie Gao;
- Fengren Tan;
- Yu Zhang
- Article
12
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 183, doi. 10.1049/el.2016.3659
- Torres, Boris;
- Quintero, Vanessa;
- Estevez, Claudio;
- Orchard, Marcos;
- Azurdia, César
- Article
13
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 181, doi. 10.1049/el.2016.3935
- Kang, S.;
- Yang, S.;
- Kim, H.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 179, doi. 10.1049/el.2016.3923
- Jayalath, S.;
- Ongayo, D.;
- Hanif, M.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 177, doi. 10.1049/el.2016.4151
- Gorji, S. A.;
- Ektesabi, M.;
- Zheng, J.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 175, doi. 10.1049/el.2016.3409
- Frigo, N. J.;
- Hutchinson, M. N.;
- Williams, C. R. S.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 173, doi. 10.1049/el.2016.4308
- Kalyuzhnyy, N. A.;
- Mintairov, S. A.;
- Nadtochiy, A. M.;
- Nevedomskiy, V. N.;
- Rybalchenko, D. V.;
- Shvarts, M. Z.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 171, doi. 10.1049/el.2016.3858
- Acconcia, Giulia;
- Cariaggi, Davide;
- Labanca, Ivan;
- Rech, Ivan;
- Ghioni, Massimo
- Article
19
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 169, doi. 10.1049/el.2016.4122
- Kang, D.-W.;
- Jeon, W.;
- Choi, J.;
- Jo, J.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 167, doi. 10.1049/el.2016.4039
- Article
21
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 165, doi. 10.1049/el.2016.3640
- Article
22
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 163, doi. 10.1049/el.2016.4223
- Dong Chen;
- Lei Zhu;
- Huizheng Bu;
- Chonghu Cheng
- Article
23
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 162, doi. 10.1049/el.2016.3682
- Seddiki, M. L.;
- Ghanem, F.;
- Nedil, M.;
- Bouklif, A.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 160, doi. 10.1049/el.2016.3825
- Kuo Cao;
- Yongpeng Wu;
- Weiwei Yang;
- Yueming Cai
- Article
25
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 158, doi. 10.1049/el.2016.3221
- Zhao Yang;
- Hui Tian;
- Shaoshuai Fan;
- Guilin Chen
- Article
26
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 156, doi. 10.1049/el.2016.2810
- Xing Wang;
- Ji Chen;
- Jiangxu Yu
- Article
27
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 154, doi. 10.1049/el.2016.2951
- Article
28
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 152, doi. 10.1049/el.2016.2613
- Shu Liu;
- Shaojing Su;
- Desheng Liu;
- Zhiping Huang;
- Mingyan Xiao
- Article
29
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 150, doi. 10.1049/el.2016.3416
- Article
30
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 148, doi. 10.1049/el.2016.2600
- Shichuan Ding;
- Jun Hang;
- Hao Li;
- Qunjing Wang
- Article
31
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 146, doi. 10.1049/el.2016.2520
- Abolhasani, M.;
- Rahmani, M.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 144, doi. 10.1049/el.2016.3132
- Yu Lei;
- Houpeng Chen;
- Xi Li;
- Qian Wang;
- Qi Zhang;
- Jiajun Hu;
- Xiaoyun Li;
- Zhitang Song
- Article
33
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 142, doi. 10.1049/el.2016.4320
- Dong Liu;
- Xianhe Huang;
- Jianguo Hu;
- Yuanlin Tang;
- Yan Wang
- Article
34
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 140, doi. 10.1049/el.2016.3025
- Stojanović, N.;
- Stamenković, N.;
- Krstić, I.
- Article
35
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 138, doi. 10.1049/el.2016.3899
- Kumar, S.;
- Loan, S. A.;
- Alamoud, A. M.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 136, doi. 10.1049/el.2016.4107
- Thomas-Erviti, G.;
- Algueta-Miguel, J. M.;
- De la Cruz Blas, C. A.;
- Carrillo, J. M.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 134, doi. 10.1049/el.2016.4086
- Hai-Gao Xue;
- Xue-Xia Yang;
- Zhewang Ma;
- Yan Wang
- Article
38
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 132, doi. 10.1049/el.2016.3548
- Sharma, A.;
- Ranjan, P.;
- Gangwar, R. K.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 130, doi. 10.1049/el.2016.3932
- Dong Ni;
- Shiwen Yang;
- Yikai Chen;
- Feng Yang
- Article
40
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 129, doi. 10.1049/el.2016.3669
- Occhiuzzi, C.;
- Amendola, S.;
- Manzari, S.;
- Caizzone, S.;
- Marrocco, G.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 126, doi. 10.1049/el.2017.0169
- Article
44
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 285, doi. 10.1049/el.2016.4174
- Mekonnen, K.A.;
- Zantvoort, J.H.C.;
- Tessema, N.M.;
- Cao, Z.;
- Tangdiongga, E.;
- Koonen, A.M.J.
- Article
45
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 283, doi. 10.1049/el.2016.3710
- Das, M.;
- Sahu, B.;
- Bhanja, U.
- Article
46
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 281, doi. 10.1049/el.2016.3309
- Jimenez, M.G.C.;
- Meyer‐Baese, U.;
- Dolecek, G.J.
- Article
47
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 279, doi. 10.1049/el.2016.4061
- Li, Zhiqun;
- Wang, Chong;
- Li, Qin;
- Wang, Zhigong
- Article
48
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 277, doi. 10.1049/el.2016.3541
- Tong, Peng;
- Wei, Yinsheng;
- Xu, Rongqing
- Article
49
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 275, doi. 10.1049/el.2016.3964
- Tan, Jun;
- Nie, Zaiping;
- Wen, Dingbang
- Article
50
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 274, doi. 10.1049/el.2016.4297
- Chen, Feiqiang;
- Nie, Junwei;
- Ni, Shaojie;
- Li, Zhengrong;
- Wang, Feixue
- Article