Works matching IS 00135194 AND DT 2017 AND VI 53 AND IP 25
2
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1659, doi. 10.1049/el.2017.3677
- Yun-Long Lu;
- Yi Wang;
- Changzhou Hua;
- Taijun Liu
- Article
3
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1674, doi. 10.1049/el.2017.3334
- Chongsheng Zhang;
- Pengyou Wang;
- Hui Guo;
- Gaojuan Fan;
- Ke Chen;
- Kämäräinen, Joni-Kristian
- Article
4
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1667, doi. 10.1049/el.2017.3239
- Article
5
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1671, doi. 10.1049/el.2017.2887
- Article
6
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1669, doi. 10.1049/el.2017.3502
- Guolong Liang;
- Yu Hao;
- Zhan Fan
- Article
7
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1676, doi. 10.1049/el.2017.3175
- Jaeyoon Lee;
- Heejin Hong;
- Dongweon Yoon
- Article
8
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1655, doi. 10.1049/el.2017.2397
- Ieu Wangshuxing;
- Dongfang Zhou;
- Dewei Zhang;
- Shuaitao Han
- Article
9
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1672, doi. 10.1049/el.2017.2863
- Carpenter, L. G.;
- Berry, S. A.;
- Gawith, C. B. E.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1661, doi. 10.1049/el.2017.3355
- Melkumov, M. A.;
- Mikhailov, V.;
- Hegai, A. M.;
- Riumkin, K. E.;
- Westbrook, P. S.;
- DiGiovanni, D. J.;
- Dianov, E. M.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1642, doi. 10.1049/el.2017.3159
- Article
12
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1665, doi. 10.1049/el.2017.2677
- Zahid, Taimoor;
- Kun Xu;
- Weimin Li
- Article
13
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1663, doi. 10.1049/el.2017.3593
- Zhang, H.;
- Tan, Z.;
- Nguyen, K.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1653, doi. 10.1049/el.2017.3649
- Peng Chu;
- Wei Hong;
- Kai-Lai Zheng;
- Wen-Wen Yang;
- Feng Xu;
- Ke Wu
- Article
15
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1629, doi. 10.1049/el.2017.3120
- Zhang, H.;
- Monaco, E.;
- Bassi, M.;
- Mazzanti, A.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1650, doi. 10.1049/el.2017.3441
- Das, B. K.;
- Chakraborty, M.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1657, doi. 10.1049/el.2017.3795
- Chuanming Zhu;
- Wei Kang;
- Wen Wu
- Article
18
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1648, doi. 10.1049/el.2017.3877
- Kim, G.;
- Yang, S.;
- Sim, J.-Y.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1627, doi. 10.1049/el.2017.1859
- Lin, Y. F.;
- Liao, C. T.;
- Chen, H. M.;
- Jiang, Z. D.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1651, doi. 10.1049/el.2016.4408
- Lim, J. H.;
- Choi, S. L.;
- Kim, C. B.;
- Lim, E. G.;
- Hong, H. B.;
- Park, J. W.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1646, doi. 10.1049/el.2017.2475
- Article
22
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1644, doi. 10.1049/el.2017.0900
- Yong Ding;
- Ruizhe Deng;
- Xiaobao Shang
- Article
23
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1631, doi. 10.1049/el.2017.2424
- Peng Liu;
- Zhiqiang You;
- Jishun Kuang;
- Elimu, Michael;
- Shuo Cai;
- Weizheng Wang
- Article
24
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1640, doi. 10.1049/el.2017.2776
- Neto, E. C.;
- Cortez, P. C.;
- Rodrigues, V. E.;
- Cavalcante, T. S.;
- Valente, I. R. S.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1638, doi. 10.1049/el.2017.3178
- Liu HongYi;
- DongLin Su;
- Chen Yao;
- Zhao ZiHua
- Article
26
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1625, doi. 10.1049/el.2017.2159
- Article
27
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1623, doi. 10.1049/el.2017.2825
- Sarkar, D.;
- Srivastava, K. V.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1636, doi. 10.1049/el.2017.3058
- Article
29
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1635, doi. 10.1049/el.2017.2836
- Sarabia, K. J.;
- Yamada, S. S.;
- Gough, R. C.;
- Moorefield, M. R.;
- Combs, A. W.;
- Shiroma, W. A.;
- Ohta, A. T.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1633, doi. 10.1049/el.2017.3390
- Stamenkovic', N.;
- Stojanovic', N.;
- Krstic', I.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1653, doi. 10.1049/el.2017.3649
- Chu, Peng;
- Hong, Wei;
- Zheng, Kai‐Lai;
- Yang, Wen‐Wen;
- Xu, Feng;
- Wu, Ke
- Article
32
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1621, doi. 10.1049/el.2017.4298
- Article
33
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1620, doi. 10.1049/el.2017.4301
- Article
34
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1678, doi. 10.1049/el.2017.3985
- Article
35
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1676, doi. 10.1049/el.2017.3175
- Lee, Jaeyoon;
- Hong, Heejin;
- Yoon, Dongweon
- Article
36
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1672, doi. 10.1049/el.2017.2863
- Carpenter, L.G.;
- Berry, S.A.;
- Gawith, C.B.E.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1671, doi. 10.1049/el.2017.2887
- Article
39
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1665, doi. 10.1049/el.2017.2677
- Zahid, Taimoor;
- Xu, Kun;
- Li, Weimin
- Article
40
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1667, doi. 10.1049/el.2017.3239
- Article
41
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1674, doi. 10.1049/el.2017.3334
- Zhang, Chongsheng;
- Wang, Pengyou;
- Guo, Hui;
- Fan, Gaojuan;
- Chen, Ke;
- Kämäräinen, Joni‐Kristian
- Article
42
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1650, doi. 10.1049/el.2017.3441
- Das, B.K.;
- Chakraborty, M.
- Article
43
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1648, doi. 10.1049/el.2017.3877
- Kim, G.;
- Yang, S.;
- Sim, J.‐Y.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1669, doi. 10.1049/el.2017.3502
- Liang, Guolong;
- Hao, Yu;
- Fan, Zhan
- Article
45
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1663, doi. 10.1049/el.2017.3593
- Zhang, H.;
- Tan, Z.;
- Nguyen, K.
- Article
46
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1661, doi. 10.1049/el.2017.3355
- Melkumov, M.A.;
- Mikhailov, V.;
- Hegai, A.M.;
- Riumkin, K.E.;
- Westbrook, P.S.;
- DiGiovanni, D.J.;
- Dianov, E.M.
- Article
47
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1659, doi. 10.1049/el.2017.3677
- Lu, Yun‐Long;
- Wang, Yi;
- Hua, Changzhou;
- Liu, Taijun
- Article
48
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1646, doi. 10.1049/el.2017.2475
- Article
49
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1644, doi. 10.1049/el.2017.0900
- Ding, Yong;
- Deng, Ruizhe;
- Shang, Xiaobao
- Article
50
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 25, p. 1657, doi. 10.1049/el.2017.3795
- Zhu, Chuanming;
- Kang, Wei;
- Wu, Wen
- Article