Works matching IS 00135194 AND DT 2017 AND VI 53 AND IP 24
1
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1660, doi. 10.1049/el.2017.3501
- Xiaolong Li;
- Jianping Xu;
- Shungang Xu;
- Shengxian Zhuang;
- Fuban Qin
- Article
2
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1615, doi. 10.1049/el.2017.1868
- Xin Quan;
- Wensheng Pan;
- Zhengjie Li;
- Ying Liu;
- Youxi Tang
- Article
3
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1613, doi. 10.1049/el.2017.2738
- Article
4
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1611, doi. 10.1049/el.2017.2857
- Samui, S.;
- Chakrabarti, I.;
- Ghosh, S. K.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1610, doi. 10.1049/el.2017.3166
- Zhang, K.;
- Mase, S.;
- Nakamura, K.;
- Hamada, T.;
- Egawa, T.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1606, doi. 10.1049/el.2017.3297
- Wei Guo;
- Jie Chen;
- Wei Liu;
- Chunsheng Li
- Article
7
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1608, doi. 10.1049/el.2017.2913
- Ping Li;
- Junji Cheng;
- Xingbi Chen
- Article
8
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1604, doi. 10.1049/el.2017.3524
- Xueyao Hu;
- Man Lu;
- Yang Li;
- Yanhua Wang
- Article
9
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1602, doi. 10.1049/el.2017.2960
- Article
10
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1598, doi. 10.1049/el.2017.2780
- Deppe, D. G.;
- Leshin, J.;
- Eifert, L.;
- Tucker, F.;
- Hillyer, T.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1562, doi. 10.1049/el.2017.3243
- Nakano, H.;
- Kameta, Y.;
- Yamauchi, J.
- Article
12
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1596, doi. 10.1049/el.2017.2769
- Billet, M.;
- Desmet, Y.;
- Bavedila, F.;
- Barbieri, S.;
- Hänsel, W.;
- Holzwarth, R.;
- Ducournau, G.;
- Lampin, J.-F.;
- Peytavit, E.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1592, doi. 10.1049/el.2017.2232
- Rongzhou Zeng;
- Ping Li;
- Junhong Li;
- Yongbo Liao;
- Qingwei Zhang;
- Gang Wang
- Article
14
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1564, doi. 10.1049/el.2017.1924
- Article
15
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1591, doi. 10.1049/el.2017.3321
- Mung, S. W. Y.;
- Chan, W. S.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1594, doi. 10.1049/el.2017.3525
- Al-Moliki, Y. M.;
- Alresheedi, M. T.;
- Al-Harthi, Y.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1589, doi. 10.1049/el.2017.3451
- Yatao Peng;
- Lijun Zhang;
- Zhanqi Zheng;
- Yongqing Leng
- Article
18
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1583, doi. 10.1049/el.2017.2425
- Shilin Yang;
- Qiang Chen;
- Jiajun Bai;
- Yunqi Fu
- Article
19
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1582, doi. 10.1049/el.2017.3221
- Article
20
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1561, doi. 10.1049/el.2017.3233
- McGuigan, N.;
- Conway, G.;
- Cahill, R.;
- Zelenchuk, D.;
- Zabri, S.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1587, doi. 10.1049/el.2017.3486
- Yu, T.;
- Lin, B.-S.;
- Chang, Y.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1585, doi. 10.1049/el.2017.2657
- Ahmed, S.;
- Zakaria, Z.;
- Husain, M. N.;
- Ibrahim, I. M.;
- Alhegazi, A.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1580, doi. 10.1049/el.2017.3037
- Zai-Cheng Guo;
- Sai-Wai Wong;
- Jing-Yu Lin;
- Lei Zhu;
- Qing-Xin Chu
- Article
24
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1578, doi. 10.1049/el.2017.2990
- Yunfei Ye;
- Ping Wang;
- Ning Wu;
- Fen Ge;
- Fang Zhou
- Article
25
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1574, doi. 10.1049/el.2017.0689
- Kim, Y. H.;
- Park, J. B.;
- Son, W. S.;
- Yoon, T. S.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1576, doi. 10.1049/el.2017.3316
- Qingshuang Zhang;
- Aijun Liu;
- Xinhai Tong
- Article
27
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1572, doi. 10.1049/el.2017.2916
- Xin Xin;
- Jueping Cai;
- Ruilian Xie;
- Peng Wang
- Article
28
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1570, doi. 10.1049/el.2017.3138
- Jiaxin Liu;
- Guangjun Wen;
- Nan Sun
- Article
29
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1559, doi. 10.1049/el.2017.4096
- Article
30
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1568, doi. 10.1049/el.2017.1719
- Jeng-Shyang Pan;
- Chun-Sheng Yang;
- Chiou-Yng Lee
- Article
31
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 24, p. 1566, doi. 10.1049/el.2017.2768
- Article