Works matching IS 00135194 AND DT 2017 AND VI 53 AND IP 23
1
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1498, doi. 10.1049/el.2017.3942
- Article
5
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1504, doi. 10.1049/el.2017.3394
- Article
6
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1528, doi. 10.1049/el.2017.3367
- Yanjia Shi;
- Kang Zhou;
- Chunxia Zhou;
- Wen Wu
- Article
7
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1510, doi. 10.1049/el.2017.3041
- Lyu, Y.;
- Ramkaj, A.;
- Tavernier, F.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1544, doi. 10.1049/el.2017.3024
- Hongqi Ben;
- XuesongWang;
- Tao Meng;
- Zhenduo Chen
- Article
9
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1537, doi. 10.1049/el.2017.2689
- Mirkhanov, S.;
- Quarterman, A. H.;
- Kahle, H.;
- Bek, R.;
- Pecoroni, R.;
- Smyth, C. J. C.;
- Vollmer, S.;
- Swift, S.;
- Michler, P.;
- Jetter, M.;
- Wilcox, K. G.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1516, doi. 10.1049/el.2017.2811
- Maundy, B. J.;
- Elwakil, A. S.;
- Elamien, M. B.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1536, doi. 10.1049/el.2017.2702
- Rongzhou Zeng;
- Ping Li;
- Junhong Li;
- Yongbo Liao;
- Qingwei Zhang;
- Xiaodong Xie
- Article
12
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1524, doi. 10.1049/el.2017.3366
- Feng Wei;
- Xi Bei Zhao;
- Xin Yi Wang;
- Bin Li;
- Xiao Wei Shi
- Article
13
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1552, doi. 10.1049/el.2017.3329
- Article
14
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1541, doi. 10.1049/el.2017.3261
- Joo, D. M.;
- Byun, J. E.;
- Lee, B. K.;
- Kim, J. S.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1542, doi. 10.1049/el.2017.3191
- Xiao-hua Zhang;
- Wen-kai Yue
- Article
16
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1514, doi. 10.1049/el.2017.3101
- Pham, K. V.;
- Truong, S. N.;
- Yang, W.;
- Min, K. -S.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1615, doi. 10.1049/el.2017.1868
- Quan, Xin;
- Pan, Wensheng;
- Li, Zhengjie;
- Liu, Ying;
- Tang, Youxi
- Article
18
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1530, doi. 10.1049/el.2017.3009
- Yadav, R.;
- Dahiya, P. K.;
- Mishra, R.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1550, doi. 10.1049/el.2017.2692
- Hunter, A. J.;
- Connors, W. A.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1518, doi. 10.1049/el.2017.2958
- Fayu Wan;
- Xiangwei Wang;
- Binhong Li
- Article
21
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1539, doi. 10.1049/el.2017.2944
- Andreeva, E. V.;
- Anikeev, A. S.;
- Il'chenko, S. N.;
- Chamorovskiy, A.;
- Yakubovich, S. D.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1502, doi. 10.1049/el.2017.2921
- Boyu Hua;
- Xiaoxiang He;
- Yang Yang
- Article
23
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1508, doi. 10.1049/el.2017.2828
- Mazumder, O.;
- Kundu, A.;
- Lenka, P.;
- Bhaumik, S.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1611, doi. 10.1049/el.2017.2857
- Samui, S.;
- Chakrabarti, I.;
- Ghosh, S.K.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1546, doi. 10.1049/el.2017.2774
- El Agroudy, N.;
- El-Shennawy, M.;
- Joram, N.;
- Ellinger, F.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1613, doi. 10.1049/el.2017.2738
- Article
27
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1506, doi. 10.1049/el.2017.2683
- Li-Jie Xu;
- Bo Li;
- Ming Zhang;
- Yaming Bo
- Article
28
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1548, doi. 10.1049/el.2017.2652
- Shahbazi, N.;
- Abbasfar, A.;
- Jabbarian-Jahromi, M.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1501, doi. 10.1049/el.2017.2208
- Zhao, X.;
- Yeo, S. P.;
- Ong, L. C.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1534, doi. 10.1049/el.2017.2452
- Moslemi, P.;
- Chen, L. R.;
- Rochette, M.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1512, doi. 10.1049/el.2017.2151
- Hoang, V. -P.;
- Dao, V. -L.;
- Pham, C. -K.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1610, doi. 10.1049/el.2017.3166
- Zhang, K.;
- Mase, S.;
- Nakamura, K.;
- Hamada, T.;
- Egawa, T.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1602, doi. 10.1049/el.2017.2960
- Article
34
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1532, doi. 10.1049/el.2017.2048
- Zhengbin Xu;
- Jie Xu;
- Yinjie Cui;
- Jian Juo;
- Cheng Qian
- Article
35
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1526, doi. 10.1049/el.2017.1866
- Alizadeh, P.;
- Parini, C. G.;
- Rajab, K. Z.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1522, doi. 10.1049/el.2017.1767
- Lee, D. H.;
- Chang, J. Y.;
- Heo, Y. S.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1554, doi. 10.1049/el.2017.1609
- Talha Younas;
- Jiandong Li;
- Jehangir Arshad;
- Muluneh Mekonnen Tulu
- Article
38
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1520, doi. 10.1049/el.2017.1505
- Article
39
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1598, doi. 10.1049/el.2017.2780
- Deppe, D.G.;
- Leshin, J.;
- Eifert, L.;
- Tucker, F.;
- Hillyer, T.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1596, doi. 10.1049/el.2017.2769
- Billet, M.;
- Desmet, Y.;
- Bavedila, F.;
- Barbieri, S.;
- Hänsel, W.;
- Holzwarth, R.;
- Ducournau, G.;
- Lampin, J.‐F.;
- Peytavit, E.
- Article
41
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1589, doi. 10.1049/el.2017.3451
- Peng, Yatao;
- Zhang, Lijun;
- Zheng, Zhanqi;
- Leng, Yongqing
- Article
42
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1580, doi. 10.1049/el.2017.3037
- Guo, Zai‐Cheng;
- Wong, Sai‐Wai;
- Lin, Jing‐Yu;
- Zhu, Lei;
- Chu, Qing‐Xin
- Article
43
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1608, doi. 10.1049/el.2017.2913
- Li, Ping;
- Cheng, Junji;
- Chen, Xingbi
- Article
44
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1606, doi. 10.1049/el.2017.3297
- Guo, Wei;
- Chen, Jie;
- Liu, Wei;
- Li, Chunsheng
- Article
45
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1604, doi. 10.1049/el.2017.3524
- Hu, Xueyao;
- Lu, Man;
- Li, Yang;
- Wang, Yanhua
- Article
46
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1600, doi. 10.1049/el.2017.3501
- Li, Xiaolong;
- Xu, Jianping;
- Xu, Shungang;
- Zhuang, Shengxian;
- Qin, Fuban
- Article
47
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1578, doi. 10.1049/el.2017.2990
- Ye, Yunfei;
- Wang, Ping;
- Wu, Ning;
- Ge, Fen;
- Zhou, Fang
- Article
48
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1576, doi. 10.1049/el.2017.3316
- Zhang, Qingshuang;
- Liu, Aijun;
- Tong, Xinhai
- Article
49
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1561, doi. 10.1049/el.2017.3233
- McGuigan, N.;
- Conway, G.;
- Cahill, R.;
- Zelenchuk, D.;
- Zabri, S.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 23, p. 1594, doi. 10.1049/el.2017.3525
- Al‐Moliki, Y.M.;
- Alresheedi, M.T.;
- Al‐Harthi, Y.
- Article