Works matching IS 00135194 AND DT 2017 AND VI 53 AND IP 22
1
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1445, doi. 10.1049/el.2017.3792
- Article
2
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1447, doi. 10.1049/el.2017.3194
- Row, Jeen-Sheen;
- Yu-Hsin Wu
- Article
4
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1487, doi. 10.1049/el.2017.3183
- Petersen, A.;
- Stone, D. A.;
- Foster, M. P.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1479, doi. 10.1049/el.2017.2754
- Min Li;
- Wan Yang;
- Zhigang Zhang;
- Aimin Wang
- Article
7
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1456, doi. 10.1049/el.2017.3096
- Raja Abdullah, R. S. A.;
- Saleh, N. L.;
- Abdul Rashid, N. E.;
- Ahmad, S. M. S.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1485, doi. 10.1049/el.2017.2970
- Wu Wang;
- Xianlin Lin;
- Jiaqiao Chen;
- Fenghuang Cai;
- Qinqin Chai;
- Qiongbin Lin
- Article
9
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1483, doi. 10.1049/el.2017.2804
- Hongchen Liu;
- Liuchao Wang;
- Fei Li;
- Yuliang Ji
- Article
10
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1458, doi. 10.1049/el.2017.3072
- Article
11
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1448, doi. 10.1049/el.2017.2479
- Chenyang Mao;
- Yang Yang;
- Xiaoxiang He;
- Jingming Zheng;
- Ting Liu
- Article
12
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1462, doi. 10.1049/el.2017.2961
- Vacca, M.;
- Graziano, M.;
- Ottavi, M.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1491, doi. 10.1049/el.2017.2915
- Yuyong Xiong;
- Shiqian Chen;
- Guanpei Xing;
- Zhike Peng;
- Wenming Zhang
- Article
14
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1452, doi. 10.1049/el.2017.2817
- Chao Ma;
- Huan Li;
- Bin Zhang;
- Dexin Ye;
- Jiangtao Huangfu;
- Yongzhi Sun;
- Weiqiang Zhu;
- Changzhi Li;
- Lixin Ran
- Article
15
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1477, doi. 10.1049/el.2017.2647
- Yi Liu;
- Hu Yang;
- Yan He;
- Jiang Zhu
- Article
16
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1470, doi. 10.1049/el.2017.2501
- Article
17
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1450, doi. 10.1049/el.2017.2431
- Yuehong Hu;
- Shaobin Liu;
- Xiangkun Kong;
- Chenyang Mao
- Article
18
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1468, doi. 10.1049/el.2017.2625
- Xiaogang Xu;
- Yang Zhao;
- Yong Ding
- Article
19
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1475, doi. 10.1049/el.2017.2615
- Yun, J.;
- Kim, J.;
- Yoon, D.;
- Rieh, J.-S.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1454, doi. 10.1049/el.2017.2587
- Jingjing Xue;
- Wen Jiang;
- Shuxi Gong
- Article
21
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1460, doi. 10.1049/el.2017.2379
- Xincun Ji;
- Xiaojuan Xia;
- Lin He;
- Yufeng Guo
- Article
22
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1464, doi. 10.1049/el.2017.2444
- Suresh, K.;
- Palanivel, J.;
- Thamilmaran, K.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1471, doi. 10.1049/el.2017.2351
- Article
24
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1466, doi. 10.1049/el.2017.1987
- Article
25
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1473, doi. 10.1049/el.2017.2072
- Article
26
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1489, doi. 10.1049/el.2017.1993
- Jianan Cao;
- Shuai Cheng;
- Khan, Rafiq
- Article
27
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1481, doi. 10.1049/el.2017.2064
- Ahmad, H.;
- Aidit, S. N.;
- Thambiratnam, K.;
- Tiu, Z. C.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 22, p. 1493, doi. 10.1049/el.2017.1949
- Article