Works matching IS 00135194 AND DT 2017 AND VI 53 AND IP 21
1
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1414, doi. 10.1049/el.2017.2849
- Xingwei Hu;
- Xiangyu Meng;
- Cuiping Yu;
- Yuanan Liu
- Article
2
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1437, doi. 10.1049/el.2017.2721
- Article
3
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1390, doi. 10.1049/el.2017.3641
- Article
4
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1393, doi. 10.1049/el.2017.2149
- Aeini, M.;
- Jarchi, S.;
- Faraji-Dana, R.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1435, doi. 10.1049/el.2017.2917
- Geumbee Kim;
- Jeongwon Lee;
- Haewoon Nam;
- Daeyoung Park
- Article
7
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1427, doi. 10.1049/el.2017.2787
- Yu Zehua;
- Li Jun;
- Zhang Yuhong;
- Liao Guisheng
- Article
8
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1426, doi. 10.1049/el.2017.2892
- Kai Zhang;
- Guobin Wan;
- Yurong Pu;
- Chen Zheng;
- Xiaoli Xi
- Article
10
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1410, doi. 10.1049/el.2017.3029
- Llamas-Garro, Ignacio;
- Mira, Fermin;
- Peng Zheng;
- Zhifu Liu;
- Lin-Sheng Wu;
- Yi Wang
- Article
11
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1431, doi. 10.1049/el.2017.1608
- Bouchhima, B.;
- Amara, R.;
- Hadj-Alouane, M. Turki
- Article
12
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1422, doi. 10.1049/el.2017.2659
- Leiming Lin;
- Jianping Xu;
- Yiming Chen;
- Xiaoqiang Wang;
- Jing Cao
- Article
13
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1416, doi. 10.1049/el.2017.1715
- Sheikhi, A.;
- Alipour, A.;
- Hemesi, H.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1420, doi. 10.1049/el.2017.2436
- Chao Yang;
- Wei Li;
- Shaohua Yu
- Article
15
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1406, doi. 10.1049/el.2017.2087
- Zhou, H.;
- Wei, L.;
- Creighton, D.;
- Nahavandi, S.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1400, doi. 10.1049/el.2017.2297
- Yannan Ren;
- Ju Liu;
- Hui Yuan;
- Wenbo Wan
- Article
17
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1418, doi. 10.1049/el.2017.2360
- Article
18
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1398, doi. 10.1049/el.2017.1308
- Article
19
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1396, doi. 10.1049/el.2017.1130
- Jingbo Zhang;
- Jinkai Wang;
- Chunyu Peng;
- Xuan Li;
- Zhiting Lin;
- Xiulong Wu
- Article
20
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1404, doi. 10.1049/el.2017.1753
- Article
21
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1429, doi. 10.1049/el.2017.2013
- Han-Gyu Kim;
- Gil-Jin Jang;
- Jeong-Sik Park;
- Yung-Hwan Oh;
- Ho-Jin Choi
- Article
22
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1412, doi. 10.1049/el.2017.1938
- Oh, S.;
- Choi, J.;
- Shin, B.;
- Yoon, W.-S.;
- Jeong, J.;
- Lee, J.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1424, doi. 10.1049/el.2017.1887
- Guangzuo Li;
- Ning Wang;
- Di Mo;
- Ran Wang;
- Zenghui Zhang;
- Yirong Wu
- Article
24
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1402, doi. 10.1049/el.2017.1811
- Subramaniam, J.;
- Raju, J. K.;
- Ebenezer, D.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1394, doi. 10.1049/el.2017.1777
- Article
26
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1439, doi. 10.1049/el.2017.1029
- Hao Wu;
- Tao Liu;
- Jin Xu;
- Fang Wang
- Article
27
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1408, doi. 10.1049/el.2017.0507
- Mesquita, D. P. P.;
- Gomes, J. P. P.;
- Souza Junior, A. H.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1433, doi. 10.1049/el.2017.0244
- Article
29
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1493, doi. 10.1049/el.2017.1949
- Article
30
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1491, doi. 10.1049/el.2017.2915
- Xiong, Yuyong;
- Chen, Shiqian;
- Xing, Guanpei;
- Peng, Zhike;
- Zhang, Wenming
- Article
31
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1454, doi. 10.1049/el.2017.2587
- Xue, Jingjing;
- Jiang, Wen;
- Gong, Shuxi
- Article
32
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1489, doi. 10.1049/el.2017.1993
- Cao, Jianan;
- Cheng, Shuai;
- Khan, Rafiq
- Article
33
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1477, doi. 10.1049/el.2017.2647
- Liu, Yi;
- Yang, Hu;
- He, Yan;
- Zhu, Jiang
- Article
34
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1468, doi. 10.1049/el.2017.2625
- Xu, Xiaogang;
- Zhao, Yang;
- Ding, Yong
- Article
35
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1487, doi. 10.1049/el.2017.3183
- Petersen, A.;
- Stone, D.A.;
- Foster, M.P.
- Article
36
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1485, doi. 10.1049/el.2017.2970
- Wang, Wu;
- Lin, Xianlin;
- Chen, Jiaqiao;
- Cai, Fenghuang;
- Chai, Qinqin;
- Lin, Qiongbin
- Article
37
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1483, doi. 10.1049/el.2017.2804
- Liu, Hongchen;
- Wang, Liuchao;
- Li, Fei;
- Ji, Yuliang
- Article
38
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1464, doi. 10.1049/el.2017.2444
- Suresh, K.;
- Palanivel, J.;
- Thamilmaran, K.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1481, doi. 10.1049/el.2017.2064
- Ahmad, H.;
- Aidit, S.N.;
- Thambiratnam, K.;
- Tiu, Z.C.
- Article
40
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1479, doi. 10.1049/el.2017.2754
- Li, Min;
- Yang, Wan;
- Zhang, Zhigang;
- Wang, Aimin
- Article
41
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1475, doi. 10.1049/el.2017.2615
- Yun, J.;
- Kim, J.;
- Yoon, D.;
- Rieh, J.‐S.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1473, doi. 10.1049/el.2017.2072
- Dong, Boxiang;
- Mi, Jian‐xun
- Article
43
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1471, doi. 10.1049/el.2017.2351
- Article
44
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1452, doi. 10.1049/el.2017.2817
- Ma, Chao;
- Li, Huan;
- Zhang, Bin;
- Ye, Dexin;
- Huangfu, Jiangtao;
- Sun, Yongzhi;
- Zhu, Weiqiang;
- Li, Changzhi;
- Ran, Lixin
- Article
45
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1445, doi. 10.1049/el.2017.3792
- Article
46
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1470, doi. 10.1049/el.2017.2501
- Article
47
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1426, doi. 10.1049/el.2017.2892
- Zhang, Kai;
- Wan, Guobin;
- Pu, Yurong;
- Zheng, Chen;
- Xi, Xiaoli
- Article
48
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1466, doi. 10.1049/el.2017.1987
- Article
49
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1462, doi. 10.1049/el.2017.2961
- Vacca, M.;
- Graziano, M.;
- Ottavi, M
- Article
50
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 21, p. 1460, doi. 10.1049/el.2017.2379
- Ji, Xincun;
- Xia, Xiaojuan;
- He, Lin;
- Guo, Yufeng
- Article