Works matching IS 00135194 AND DT 2017 AND VI 53 AND IP 2
1
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 121, doi. 10.1049/el.2016.3438
- Article
2
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 119, doi. 10.1049/el.2016.3007
- Choi, C. M.;
- Sukegawa, H.;
- Mitani, S.;
- Song, Y. H.
- Article
3
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 117, doi. 10.1049/el.2016.3872
- Bong-Hyun You;
- Jae-Hoon Lee;
- Soo-Yeon Lee;
- Seok-Ha Hong;
- Hyun-Chang Kim;
- Ha-Ram Ju;
- Moon-Chul Choi;
- Deog-Kyoon Jeong
- Article
4
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 115, doi. 10.1049/el.2016.3898
- Alkhodary, M. T.;
- Muqaibel, A. H.
- Article
5
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 113, doi. 10.1049/el.2016.3944
- Ye Tian;
- Hongyin Shi;
- He Xu
- Article
6
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 111, doi. 10.1049/el.2016.3818
- Yu Zhang;
- Gong Zhang;
- Xinhai Wang
- Article
7
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 110, doi. 10.1049/el.2016.2479
- Yingzhi Kan;
- Yongfeng Zhu;
- Jianxiong Zhou;
- Lei Yang;
- Liang Tang;
- Qiang Fu
- Article
8
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 108, doi. 10.1049/el.2016.3018
- Xiao, Z.;
- Khoa, B. A.;
- Siek, L.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 106, doi. 10.1049/el.2016.3986
- Tianfeng Wang;
- Xin Liu;
- Houjun Tang;
- Muhammad Ali
- Article
10
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 104, doi. 10.1049/el.2016.3909
- Article
11
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 102, doi. 10.1049/el.2016.3096
- Article
12
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 100, doi. 10.1049/el.2016.3833
- Zhuo Yang;
- Fangjuan Bian;
- Jing Zhu;
- Weifeng Sun;
- Ye Tian;
- Xin Tong;
- Yuanzheng Zhu;
- Peng Ye
- Article
13
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 98, doi. 10.1049/el.2016.3582
- Yuya Takubo;
- Shinji Yamashita
- Article
14
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 96, doi. 10.1049/el.2016.4025
- Okayama, H.;
- Onawa, Y.;
- Shimura, D.;
- Yaegashi, H.;
- Sasaki, H.
- Article
15
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 95, doi. 10.1049/el.2016.3778
- Awad, E.;
- Abdel-Rahman, M.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 93, doi. 10.1049/el.2016.3732
- Möller, C.;
- Zhang, F.;
- Fuchs, C.;
- Berger, C.;
- Rehn, A.;
- Ruiz Perez, A.;
- Rahimi-Iman, A.;
- Hader, J.;
- Koch, M.;
- Moloney, J. V.;
- Koch, S. W.;
- Stolz, W.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 91, doi. 10.1049/el.2016.3099
- Zhiyong Tan;
- Hua Li;
- Wenjian Wan;
- Zhanglong Fu;
- Chang Wang;
- Juncheng Cao
- Article
18
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 89, doi. 10.1049/el.2016.3879
- Becerra-González, Juan Antonio;
- Madero-Ayora, María José;
- Reina-Tosina, Javier;
- Crespo-Cadenas, Carlos
- Article
19
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 87, doi. 10.1049/el.2016.3200
- Article
20
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 85, doi. 10.1049/el.2016.3500
- Qingshuang Zhang;
- Aijun Liu;
- Xiaohu Liang
- Article
21
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 72, doi. 10.1049/el.2016.3756
- Habbachi, N.;
- Boussetta, H.;
- Boukabache, A.;
- Kallala, M. A.;
- Pons, P.;
- Besbes, K.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 83, doi. 10.1049/el.2016.3242
- Al-Hmood, H.;
- Al-Raweshidy, H. S.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 68, doi. 10.1049/el.2016.3967
- Article
24
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 66, doi. 10.1049/el.2016.3029
- Yunfeng Hu;
- Angqi Liu;
- Bin Li;
- Zhaohui Wu
- Article
25
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 64, doi. 10.1049/el.2016.2699
- Tianyi Li;
- Xiaodong Xu;
- Tao Yin;
- Wei Li;
- Haigang Yang
- Article
26
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 81, doi. 10.1049/el.2016.3686
- Ke Wang;
- Aijun Liu;
- Xiaohu Liang;
- Siming Peng
- Article
27
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 70, doi. 10.1049/el.2016.3032
- Xing Wei;
- Zhujia Chen;
- Wei Li;
- Haigang Yang
- Article
28
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 79, doi. 10.1049/el.2016.0863
- Park, C.;
- Kim, J.;
- Kweon, I. S.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 77, doi. 10.1049/el.2016.3273
- De Matteis, M.;
- Donno, A.;
- D'Amico, S.;
- Baschirotto, A.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 75, doi. 10.1049/el.2016.3558
- Article
31
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 74, doi. 10.1049/el.2016.2307
- Yunong Zhang;
- Liangyu He;
- Shuai Li;
- Dechao Chen;
- Yaqiong Ding
- Article
32
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 62, doi. 10.1049/el.2016.2351
- Wang, C.-C.;
- Tsai, T.-Y.;
- Lee, T.-J.;
- Ruan, K.-W.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 60, doi. 10.1049/el.2016.3639
- Nikolic, B.;
- Dimitrijevic, B.;
- Aleksic, S.;
- Raicevic, N.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 58, doi. 10.1049/el.2016.3889
- Khajepour, Somayeh;
- Ghaffarian, Mohammad Saeid;
- Moradi, Gholamreza
- Article
35
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 57, doi. 10.1049/el.2016.3807
- Wei Xiao;
- Tengda Mei;
- Yu Lan;
- Yunqiu Wu;
- Ruimin Xu;
- Yuehang Xu
- Article
36
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 55, doi. 10.1049/el.2016.4592
- Article
37
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 2, p. 54, doi. 10.1049/el.2016.4664
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