Works matching IS 00135194 AND DT 2017 AND VI 53 AND IP 19
1
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1287, doi. 10.1049/el.2017.3264
- Article
4
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 49, doi. 10.1049/el.2017.2835
- Feng Huang;
- Jianpeng Wang;
- Jiasheng Hong;
- Wen Wu
- Article
5
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 47, doi. 10.1049/el.2017.2604
- Xing-Yu Dong;
- Wen-Wen Yang;
- Hui Tang;
- Jian-Xin Chen
- Article
6
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 45, doi. 10.1049/el.2017.2548
- Kaur, A.;
- Sharma, S.;
- Mishra, A.
- Article
7
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 43, doi. 10.1049/el.2017.2523
- Liang, W.;
- Mukherjee, A.;
- Sakalas, P.;
- Pawlak, A.;
- Schröter, M.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 41, doi. 10.1049/el.2017.2513
- Morf, T.;
- Seifried, M.;
- Cevrero, A.;
- Ozkaya, I.;
- Menolfi, C.;
- Kuchta, D.;
- Kossel, M.;
- Francese, P.;
- Kull, L.;
- Kropp, J.;
- Toifl, T.
- Article
9
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 39, doi. 10.1049/el.2017.2492
- Chengyong Yu;
- En Li;
- Gaofeng Guo
- Article
10
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 37, doi. 10.1049/el.2017.2485
- Habib, M. H. U.;
- McFarlane, N.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 35, doi. 10.1049/el.2017.2483
- Article
12
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 33, doi. 10.1049/el.2017.2481
- Karami, M.;
- Rezaei, P.;
- Kiani, S.;
- Sadeghzadeh, R. A.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 31, doi. 10.1049/el.2017.2454
- Article
14
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 29, doi. 10.1049/el.2017.2355
- Jingjing Li;
- Hongbin Li;
- Shan Ouyang
- Article
15
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 27, doi. 10.1049/el.2017.2289
- Article
16
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 25, doi. 10.1049/el.2017.2271
- Chen, W.-X.;
- Lee, C.-H.;
- Hsu, C.-I. G.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 23, doi. 10.1049/el.2017.2257
- Gupta, S.;
- Briqech, Z.;
- Sebak, A. R.
- Article
18
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 21, doi. 10.1049/el.2017.2225
- Iwaki, T.;
- Ishiwaki, S.;
- Sawada, T.;
- Yamamoto, M.
- Article
19
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 19, doi. 10.1049/el.2017.2166
- Haiyan Xu;
- Jianpeng Wang;
- Zhiping Chen;
- Na Zhang;
- Yaping Zheng
- Article
20
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 17, doi. 10.1049/el.2017.2157
- Dehua Zhao;
- Yinsheng Wei;
- Yongtan Liu
- Article
21
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 15, doi. 10.1049/el.2017.2090
- Torres, V.;
- Valls, J.;
- Canet, M. J.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 13, doi. 10.1049/el.2017.2070
- Saso, J. M.;
- Lopez-Martin, A. J.;
- Garde, M. P.;
- Ramirez-Angulo, J.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 11, doi. 10.1049/el.2017.1804
- Kyeongwon Park;
- Haeun Kim;
- Arim Lee;
- Donghoon Kang;
- Wangrok Oh
- Article
24
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 9, doi. 10.1049/el.2017.1704
- Wenchan Dong;
- Jie Hou;
- Xinliang Zhang
- Article
25
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 7, doi. 10.1049/el.2017.1532
- Article
26
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 5, doi. 10.1049/el.2017.0955
- Kim, W.-H.;
- Nam, S.-H.;
- Lee, H.-K.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 3, doi. 10.1049/el.2017.0925
- Elleuch, I.;
- Abdelkefi, F.;
- Siala, M.;
- Hamila, R.;
- Al-Dahir, N.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1, doi. 10.1049/el.2015.3839
- Dixian Zhao;
- Reynaert, Patrick
- Article
29
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1387, doi. 10.1049/el.2017.2623
- Akhendra Kumar, P.;
- Bheema Rao, N.
- Article
30
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1385, doi. 10.1049/el.2016.3913
- Zheng, Xiaoyang;
- Su, Hong;
- Wei, Zhengyuan;
- Hu, Shunren
- Article
31
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1383, doi. 10.1049/el.2017.2494
- Martin‐Vega, F.J.;
- Gomez, G.;
- Lopez‐Martinez, F.J.;
- Aguayo‐Torres, M.C.
- Article
32
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1381, doi. 10.1049/el.2017.2414
- Zhou, Yulong;
- Cao, Xiang‐yu;
- Gao, Jun;
- Li, Sijia;
- Liu, Xiao
- Article
33
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1379, doi. 10.1049/el.2017.2800
- Article
34
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1377, doi. 10.1049/el.2017.2176
- Yao, Yuan;
- Kang, Longyun;
- Zhang, Zhi;
- Feng, Yuanbin
- Article
35
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1375, doi. 10.1049/el.2017.2500
- Article
36
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1373, doi. 10.1049/el.2017.2714
- Chen, S.‐H.;
- Michael, A.;
- Kwok, C. Y.
- Article
37
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1372, doi. 10.1049/el.2017.2665
- Moorefield, M.R.;
- Ohta, A.T.;
- Shiroma, W.A.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1370, doi. 10.1049/el.2017.2507
- Cano, J.L.;
- Mediavilla, A.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1368, doi. 10.1049/el.2017.1838
- Zhang, Daxu;
- Zhou, Jianyi;
- Yu, Zhiqiang
- Article
40
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1366, doi. 10.1049/el.2017.2904
- Yu, Chao;
- Yang, Na;
- Sun, Honglei;
- Wu, Xing‐Wang;
- Zhai, Jianfeng;
- Zhu, Xiao‐Wei
- Article
41
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1364, doi. 10.1049/el.2017.2710
- Sun, Cheng‐Guang;
- Li, Jia‐Lin
- Article
42
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1362, doi. 10.1049/el.2017.2189
- Li, Xiang;
- Li, Jin;
- Li, Bingbing
- Article
43
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1360, doi. 10.1049/el.2017.2112
- Ghasemi, M.;
- Aghaei, J.;
- Hadipour, M.
- Article
44
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1358, doi. 10.1049/el.2017.2129
- Article
45
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1356, doi. 10.1049/el.2017.2108
- Article
46
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1354, doi. 10.1049/el.2017.1353
- Lin, Xinyu;
- Zhu, Ce;
- Zhang, Qian;
- Liu, Yipeng
- Article
47
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1352, doi. 10.1049/el.2017.0733
- Cai, S.;
- Zhu, Y.;
- Kiran, S.;
- Hoyos, S.;
- Palermo, S.
- Article
48
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1350, doi. 10.1049/el.2017.1542
- Anzai, D.;
- Kato, T.;
- Wang, J.
- Article
49
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1349, doi. 10.1049/el.2017.0492
- Hernandez‐Ortega, J.;
- Morales, A.;
- Fierrez, J.;
- Acien, A.
- Article
50
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 19, p. 1347, doi. 10.1049/el.2017.2219
- Lin, Zhitao;
- Shen, Juncheng;
- Ma, De;
- Meng, Jianyi
- Article