Works matching IS 00135194 AND DT 2017 AND VI 53 AND IP 18
2
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1232, doi. 10.1049/el.2017.3104
- Article
3
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1260, doi. 10.1049/el.2017.2032
- Kim, P.;
- Chaudhary, G.;
- Jeong, Y.
- Article
4
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1233, doi. 10.1049/el.2017.3103
- Article
5
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1268, doi. 10.1049/el.2017.2596
- Ciofi, C.;
- Scandurra, G.;
- Giusi, G.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1262, doi. 10.1049/el.2017.2557
- Abduljabar, A. A.;
- Choi, H.;
- Porch, A.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1266, doi. 10.1049/el.2017.2510
- Yuze Liu;
- Hui Li;
- Yunyun Wang;
- Zhiwei Duan;
- Yuefeng Ji
- Article
9
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1246, doi. 10.1049/el.2017.2621
- Article
10
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1252, doi. 10.1049/el.2017.2364
- Tong, J.;
- Xi, J.;
- Guo, Q.;
- Yu, Y.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1236, doi. 10.1049/el.2017.2415
- Jizhong Shen;
- Liang Geng;
- Fan Zhang
- Article
12
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1274, doi. 10.1049/el.2017.2390
- Xiaozong Huang;
- Zhiwei Liu;
- Fan Liu;
- Jizhi Liu;
- Wenqiang Song
- Article
13
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1238, doi. 10.1049/el.2017.2186
- Hongshuai Zhang;
- Hong Zhang;
- Ruizhi Zhang
- Article
14
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1258, doi. 10.1049/el.2017.2060
- Article
15
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1272, doi. 10.1049/el.2017.2391
- Miluski, P.;
- Kochanowicz, M.;
- Zmojda, J.;
- Dorosz, D.
- Article
16
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1250, doi. 10.1049/el.2017.2210
- Santana, T. A. A.;
- de Andrade, H. D.;
- Queiroz Júnior, I. S.;
- Tavares da Silva, I. B.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1244, doi. 10.1049/el.2017.1881
- Article
18
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1254, doi. 10.1049/el.2017.2343
- Article
19
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1242, doi. 10.1049/el.2017.2336
- Prokopidis, K. P.;
- Zografopoulos, D. C.
- Article
20
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1277, doi. 10.1049/el.2017.2292
- Dong Zhang;
- Yongshun Zhang;
- Guimei Zheng;
- Cunqian Feng;
- Jun Tang
- Article
21
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1240, doi. 10.1049/el.2017.2238
- Article
22
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1264, doi. 10.1049/el.2017.1886
- Kraftmakher, G.;
- Butylkin, V.;
- Kazantsev, Y.;
- Mal'tsev, V.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1248, doi. 10.1049/el.2017.1699
- Article
24
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1235, doi. 10.1049/el.2017.1489
- Noh, E.;
- Kang, J.;
- Kim, B.;
- Choi, S.;
- Kim, K.
- Article
25
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1281, doi. 10.1049/el.2017.1344
- Benaissa, S.;
- Plets, D.;
- Tanghe, E.;
- Trogh, J.;
- Martens, L.;
- Vandaele, L.;
- Verloock, L.;
- Tuyttens, F. A. M.;
- Sonck, B.;
- Joseph, W.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1270, doi. 10.1049/el.2017.1413
- John, J. D.;
- Saito, I.;
- Toyama, R.;
- Ochiai, J.;
- Yamada, T.;
- Masuzawa, T.;
- Chua, D. H. C.;
- Okano, K.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1276, doi. 10.1049/el.2017.1303
- Andrade, A. M. S. S.;
- Hey, H. L.;
- Martins, M. L. da S.
- Article
28
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1279, doi. 10.1049/el.2017.0773
- Son, S.-W.;
- Shin, S. H.;
- Park, J. H.;
- Baek, J.-M.;
- Kim, D.-K.;
- Lee, J.-H.;
- Kim, T.-W.;
- Kim, D.-H.
- Article
29
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1256, doi. 10.1049/el.2017.0323
- Yinghui Ye;
- Guangyue Lu;
- Yongzhao Li;
- Ming Jin
- Article